NL8702475A - Roentgen analyse apparaat. - Google Patents

Roentgen analyse apparaat. Download PDF

Info

Publication number
NL8702475A
NL8702475A NL8702475A NL8702475A NL8702475A NL 8702475 A NL8702475 A NL 8702475A NL 8702475 A NL8702475 A NL 8702475A NL 8702475 A NL8702475 A NL 8702475A NL 8702475 A NL8702475 A NL 8702475A
Authority
NL
Netherlands
Prior art keywords
arm
crystal holder
detection device
wheel
wheels
Prior art date
Application number
NL8702475A
Other languages
English (en)
Dutch (nl)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Priority to NL8702475A priority Critical patent/NL8702475A/nl
Priority to US07/250,023 priority patent/US4885760A/en
Priority to EP88202185A priority patent/EP0312155B1/en
Priority to DE8888202185T priority patent/DE3869311D1/de
Priority to JP63256043A priority patent/JPH01132943A/ja
Publication of NL8702475A publication Critical patent/NL8702475A/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL8702475A 1987-10-16 1987-10-16 Roentgen analyse apparaat. NL8702475A (nl)

Priority Applications (5)

Application Number Priority Date Filing Date Title
NL8702475A NL8702475A (nl) 1987-10-16 1987-10-16 Roentgen analyse apparaat.
US07/250,023 US4885760A (en) 1987-10-16 1988-09-27 X-ray analysis apparatus
EP88202185A EP0312155B1 (en) 1987-10-16 1988-10-03 X-ray analysis apparatus
DE8888202185T DE3869311D1 (de) 1987-10-16 1988-10-03 Roentgenanalysegeraet.
JP63256043A JPH01132943A (ja) 1987-10-16 1988-10-13 Ｘ線分析装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8702475 1987-10-16
NL8702475A NL8702475A (nl) 1987-10-16 1987-10-16 Roentgen analyse apparaat.

Publications (1)

Publication Number Publication Date
NL8702475A true NL8702475A (nl) 1989-05-16

Family

ID=19850782

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8702475A NL8702475A (nl) 1987-10-16 1987-10-16 Roentgen analyse apparaat.

Country Status (5)

Country Link
US (1) US4885760A (ja)
EP (1) EP0312155B1 (ja)
JP (1) JPH01132943A (ja)
DE (1) DE3869311D1 (ja)
NL (1) NL8702475A (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4102850A1 (de) * 1991-01-31 1992-08-06 Philips Patentverwaltung Roentgenographisches spannungsmessgeraet
US5268954A (en) * 1992-10-14 1993-12-07 Wisconsin Alumni Research Foundation Mounting apparatus for double crystal monochromators and the like
CN105632578B (zh) * 2015-03-10 2018-02-23 深圳市禾苗分析仪器有限公司 直线驱动式x射线单色器及其应用

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3445653A (en) * 1964-10-10 1969-05-20 Hitachi Ltd X-ray monochromator of linear type
GB1183702A (en) * 1966-03-30 1970-03-11 Ass Elect Ind Improvements relating to X-Ray Analysing Apparatus.
FR1572651A (ja) * 1967-06-19 1969-06-27
NL7803026A (nl) * 1978-03-21 1979-09-25 Philips Nv Instelmechanisme.
US4446568A (en) * 1981-06-05 1984-05-01 California Institute Of Technology Versatile focusing radiation analyzer
NL184386C (nl) * 1983-03-15 1989-07-03 Eindhoven Tech Hogeschool Kinematisch roentgenanalyse-apparaat.
US4807268A (en) * 1983-11-04 1989-02-21 University Of Southern California Scanning monochrometer crystal and method of formation

Also Published As

Publication number Publication date
EP0312155A1 (en) 1989-04-19
JPH01132943A (ja) 1989-05-25
EP0312155B1 (en) 1992-03-18
US4885760A (en) 1989-12-05
DE3869311D1 (de) 1992-04-23

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Legal Events

Date Code Title Description
A1B A search report has been drawn up
BV The patent application has lapsed