NL8501100A - Werkwijze en stelsel voor het meten van het ruwheidsprofiel van een oppervlak. - Google Patents

Werkwijze en stelsel voor het meten van het ruwheidsprofiel van een oppervlak. Download PDF

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Publication number
NL8501100A
NL8501100A NL8501100A NL8501100A NL8501100A NL 8501100 A NL8501100 A NL 8501100A NL 8501100 A NL8501100 A NL 8501100A NL 8501100 A NL8501100 A NL 8501100A NL 8501100 A NL8501100 A NL 8501100A
Authority
NL
Netherlands
Prior art keywords
roughness profile
measured
optical system
focal length
measuring
Prior art date
Application number
NL8501100A
Other languages
English (en)
Dutch (nl)
Original Assignee
Optische Ind De Oude Delft Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optische Ind De Oude Delft Nv filed Critical Optische Ind De Oude Delft Nv
Priority to NL8501100A priority Critical patent/NL8501100A/nl
Priority to EP86200623A priority patent/EP0198557A1/fr
Priority to KR1019860002858A priority patent/KR900003203B1/ko
Priority to JP61085232A priority patent/JPS61239106A/ja
Publication of NL8501100A publication Critical patent/NL8501100A/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
NL8501100A 1985-04-15 1985-04-15 Werkwijze en stelsel voor het meten van het ruwheidsprofiel van een oppervlak. NL8501100A (nl)

Priority Applications (4)

Application Number Priority Date Filing Date Title
NL8501100A NL8501100A (nl) 1985-04-15 1985-04-15 Werkwijze en stelsel voor het meten van het ruwheidsprofiel van een oppervlak.
EP86200623A EP0198557A1 (fr) 1985-04-15 1986-04-14 Procédé et dispositif de mesure du profil de la rugosité d'une surface
KR1019860002858A KR900003203B1 (ko) 1985-04-15 1986-04-15 표면의 거칠은 형상을 측정하기 위한 방법 및 시스템
JP61085232A JPS61239106A (ja) 1985-04-15 1986-04-15 表面のあらさ輪郭を測定する方法及びシステム

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8501100 1985-04-15
NL8501100A NL8501100A (nl) 1985-04-15 1985-04-15 Werkwijze en stelsel voor het meten van het ruwheidsprofiel van een oppervlak.

Publications (1)

Publication Number Publication Date
NL8501100A true NL8501100A (nl) 1986-11-03

Family

ID=19845838

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8501100A NL8501100A (nl) 1985-04-15 1985-04-15 Werkwijze en stelsel voor het meten van het ruwheidsprofiel van een oppervlak.

Country Status (4)

Country Link
EP (1) EP0198557A1 (fr)
JP (1) JPS61239106A (fr)
KR (1) KR900003203B1 (fr)
NL (1) NL8501100A (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8625054D0 (en) * 1986-10-20 1986-11-26 Renishaw Plc Optical measuring probe
DE3838954A1 (de) * 1988-11-17 1990-05-23 Siemens Ag Optikanordnung zur dreidimensionalen formerfassung
DE4041343A1 (de) * 1990-12-21 1992-06-25 Bmw Rolls Royce Gmbh Verfahren zur spitzenspielmessung an turbinenschaufeln
US5267381A (en) * 1991-02-19 1993-12-07 Westinghouse Electric Corp. Automatic tube processing system
CA2066124A1 (fr) * 1991-04-17 1992-10-18 Peter James Sergeant Appareil et methode de detection de l'usure d'un cylindre concasseur
AU2003234256A1 (en) * 2002-04-26 2003-11-10 Massachussetts Institute Of Technology Adjustable focusing composite for use in an optical profilometer system and method
KR101137567B1 (ko) * 2005-02-21 2012-04-19 주식회사 팬택 문자 자동 완성 기능을 제공하는 무선 휴대 단말기 및 그방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3025747A (en) * 1956-02-01 1962-03-20 Philip Morris Inc Method and apparatus for determining cutting ability of an edged metal tool
US3263087A (en) * 1963-03-27 1966-07-26 Gen Electric Electro-optical distance gage
US3612890A (en) * 1969-10-13 1971-10-12 Trw Inc Radiation sensitive optical gaging system
JPS5415419B2 (fr) * 1974-05-20 1979-06-14
DE3322712C2 (de) * 1983-06-24 1986-10-30 Daimler-Benz Ag, 7000 Stuttgart Optisches Abstandsmeßverfahren
DE3322709A1 (de) * 1983-06-24 1985-01-10 Daimler-Benz Ag, 7000 Stuttgart Optische abstandsmessvorrichtung
IT1198660B (it) * 1983-08-02 1988-12-21 Ottica Ist Naz Profilometro ottico multifocale per dispersione

Also Published As

Publication number Publication date
KR900003203B1 (ko) 1990-05-10
JPS61239106A (ja) 1986-10-24
KR860008449A (ko) 1986-11-15
EP0198557A1 (fr) 1986-10-22

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Legal Events

Date Code Title Description
A1B A search report has been drawn up
BV The patent application has lapsed