NL8201558A - Inrichting voor het continu meten van de capaciteit van folie voor elektrolytkondensatoren. - Google Patents

Inrichting voor het continu meten van de capaciteit van folie voor elektrolytkondensatoren. Download PDF

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Publication number
NL8201558A
NL8201558A NL8201558A NL8201558A NL8201558A NL 8201558 A NL8201558 A NL 8201558A NL 8201558 A NL8201558 A NL 8201558A NL 8201558 A NL8201558 A NL 8201558A NL 8201558 A NL8201558 A NL 8201558A
Authority
NL
Netherlands
Prior art keywords
foil
capacity
current
voltage
electrode
Prior art date
Application number
NL8201558A
Other languages
English (en)
Dutch (nl)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Priority to NL8201558A priority Critical patent/NL8201558A/nl
Priority to US06/479,595 priority patent/US4497699A/en
Priority to EP83200519A priority patent/EP0091722B1/en
Priority to DE8383200519T priority patent/DE3368341D1/de
Priority to JP58063113A priority patent/JPS58197713A/ja
Publication of NL8201558A publication Critical patent/NL8201558A/nl

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004—Details
    • H01G9/04—Electrodes or formation of dielectric layers thereon
    • H01G9/048—Electrodes or formation of dielectric layers thereon characterised by their structure
    • H01G9/055—Etched foil electrodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Electrochemical Coating By Surface Reaction (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
NL8201558A 1982-04-14 1982-04-14 Inrichting voor het continu meten van de capaciteit van folie voor elektrolytkondensatoren. NL8201558A (nl)

Priority Applications (5)

Application Number Priority Date Filing Date Title
NL8201558A NL8201558A (nl) 1982-04-14 1982-04-14 Inrichting voor het continu meten van de capaciteit van folie voor elektrolytkondensatoren.
US06/479,595 US4497699A (en) 1982-04-14 1983-03-28 Method of treating foil for electrolytic capacitors
EP83200519A EP0091722B1 (en) 1982-04-14 1983-04-12 Method of treating foil for electrolytic capacitors
DE8383200519T DE3368341D1 (en) 1982-04-14 1983-04-12 Method of treating foil for electrolytic capacitors
JP58063113A JPS58197713A (ja) 1982-04-14 1983-04-12 電解コンデンサ用箔の処理方法および箔のキヤパシタンスの連続測定装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8201558 1982-04-14
NL8201558A NL8201558A (nl) 1982-04-14 1982-04-14 Inrichting voor het continu meten van de capaciteit van folie voor elektrolytkondensatoren.

Publications (1)

Publication Number Publication Date
NL8201558A true NL8201558A (nl) 1983-11-01

Family

ID=19839575

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8201558A NL8201558A (nl) 1982-04-14 1982-04-14 Inrichting voor het continu meten van de capaciteit van folie voor elektrolytkondensatoren.

Country Status (5)

Country Link
US (1) US4497699A (ru)
EP (1) EP0091722B1 (ru)
JP (1) JPS58197713A (ru)
DE (1) DE3368341D1 (ru)
NL (1) NL8201558A (ru)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4886552A (en) * 1988-09-09 1989-12-12 United Technologies Corporation Method for monitoring the removal of a metallic contaminant from the surface of a metallic article
US5582746A (en) * 1992-12-04 1996-12-10 International Business Machines Corporation Real time measurement of etch rate during a chemical etching process
US5788801A (en) * 1992-12-04 1998-08-04 International Business Machines Corporation Real time measurement of etch rate during a chemical etching process
US5338390A (en) * 1992-12-04 1994-08-16 International Business Machines Corporation Contactless real-time in-situ monitoring of a chemical etching process
US5573624A (en) * 1992-12-04 1996-11-12 International Business Machines Corporation Chemical etch monitor for measuring film etching uniformity during a chemical etching process
US5451289A (en) * 1994-06-30 1995-09-19 International Business Machines Corporation Fixture for in-situ noncontact monitoring of wet chemical etching with passive wafer restraint
US5516399A (en) * 1994-06-30 1996-05-14 International Business Machines Corporation Contactless real-time in-situ monitoring of a chemical etching
US5501766A (en) * 1994-06-30 1996-03-26 International Business Machines Corporation Minimizing overetch during a chemical etching process
US5480511A (en) * 1994-06-30 1996-01-02 International Business Machines Corporation Method for contactless real-time in-situ monitoring of a chemical etching process
US5445705A (en) * 1994-06-30 1995-08-29 International Business Machines Corporation Method and apparatus for contactless real-time in-situ monitoring of a chemical etching process
US5489361A (en) * 1994-06-30 1996-02-06 International Business Machines Corporation Measuring film etching uniformity during a chemical etching process
US5715133A (en) * 1995-06-21 1998-02-03 Philips Electronics North America Corporation Method of producing aluminum foil for electrolytic capacitors and product thereof
US6726825B2 (en) 2000-04-07 2004-04-27 Matsushita Electric Industrial Co., Ltd. Method and apparatus for manufacturing positive electrode foil of aluminum electrolytic capacitor
DE102005040296B4 (de) * 2005-08-21 2007-06-14 Hahn-Meitner-Institut Berlin Gmbh Messverfahren zur in-situ-Kontrolle des chemischen Ätzvorgangs von latenten Ionenspuren
JP1595451S (ru) * 2017-06-20 2018-01-22

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2832734A (en) * 1952-02-14 1958-04-29 Leeds & Northrup Co Coulometric systems
US2928774A (en) * 1953-08-31 1960-03-15 Standard Oil Co Automatic titration system
DE2246421C3 (de) * 1972-09-21 1978-05-11 Siemens Ag, 1000 Berlin Und 8000 Muenchen Verfahren zum kontinuierlichen Bestimmen der Güte einer Aluminiumfolie und Vorrichtung zur Durchführung des Verfahrens
DE2434154B2 (de) * 1974-07-16 1977-07-07 Siemens AG, 1000 Berlin und 8000 München Verfahren zur kontinuierlichen bestimmung der qualitaet von einer in wanderbaedern formierten aluminiumfolie fuer elektrolytkondensatoren
DE2458501A1 (de) * 1974-12-11 1976-06-16 Philips Patentverwaltung Verfahren und anordnung zur messung der kapazitaetsausbeute
US4095176A (en) * 1976-10-06 1978-06-13 S.A Texaco Belgium N.V. Method and apparatus for evaluating corrosion protection
CH617508A5 (ru) * 1976-12-24 1980-05-30 Eric Robert
JPS57126126A (en) * 1981-01-29 1982-08-05 Yoshiyuki Okamoto Method of etching aluminum foil for electrolytic condenser
US4343686A (en) * 1981-02-27 1982-08-10 Sprague Electric Company Method for controlling etching of electrolytic capacitor foil

Also Published As

Publication number Publication date
US4497699A (en) 1985-02-05
JPS58197713A (ja) 1983-11-17
DE3368341D1 (en) 1987-01-22
EP0091722A1 (en) 1983-10-19
JPH0257695B2 (ru) 1990-12-05
EP0091722B1 (en) 1986-12-10

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Legal Events

Date Code Title Description
A1B A search report has been drawn up
A85 Still pending on 85-01-01
BV The patent application has lapsed