NL8103649A - Halfgeleiderinrichting en werkwijze voor het vervaardigen van de halfgeleiderinrichting. - Google Patents
Halfgeleiderinrichting en werkwijze voor het vervaardigen van de halfgeleiderinrichting. Download PDFInfo
- Publication number
- NL8103649A NL8103649A NL8103649A NL8103649A NL8103649A NL 8103649 A NL8103649 A NL 8103649A NL 8103649 A NL8103649 A NL 8103649A NL 8103649 A NL8103649 A NL 8103649A NL 8103649 A NL8103649 A NL 8103649A
- Authority
- NL
- Netherlands
- Prior art keywords
- polycrystalline silicon
- semiconductor device
- carbon
- silicon
- layer
- Prior art date
Links
Classifications
-
- H10D64/01306—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/40—Crystalline structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
- H10D62/834—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge further characterised by the dopants
-
- H10D64/01314—
-
- H10P14/3408—
-
- H10P14/3411—
-
- H10P14/3442—
-
- H10P14/3444—
-
- H10P14/416—
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/914—Doping
- Y10S438/918—Special or nonstandard dopant
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL8103649A NL8103649A (nl) | 1981-08-03 | 1981-08-03 | Halfgeleiderinrichting en werkwijze voor het vervaardigen van de halfgeleiderinrichting. |
| EP82200965A EP0073075B1 (en) | 1981-08-03 | 1982-07-28 | Semiconductor device comprising polycrystalline silicon and method of producing the same |
| DE8282200965T DE3277483D1 (en) | 1981-08-03 | 1982-07-28 | Semiconductor device comprising polycrystalline silicon and method of producing the same |
| CA000408391A CA1217116A (en) | 1981-08-03 | 1982-07-29 | Semiconductor device and method of manufacturing the semiconductor device |
| AU86601/82A AU552505B2 (en) | 1981-08-03 | 1982-07-30 | Semiconductor device |
| JP57135063A JPS5832471A (ja) | 1981-08-03 | 1982-08-02 | 半導体装置の製造方法 |
| US06/851,904 US4891332A (en) | 1981-08-03 | 1986-04-11 | Method of manufacturing a semiconductor device comprising a circuit element formed of carbon doped polycrystalline silicon |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL8103649A NL8103649A (nl) | 1981-08-03 | 1981-08-03 | Halfgeleiderinrichting en werkwijze voor het vervaardigen van de halfgeleiderinrichting. |
| NL8103649 | 1981-08-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL8103649A true NL8103649A (nl) | 1983-03-01 |
Family
ID=19837888
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL8103649A NL8103649A (nl) | 1981-08-03 | 1981-08-03 | Halfgeleiderinrichting en werkwijze voor het vervaardigen van de halfgeleiderinrichting. |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4891332A (cg-RX-API-DMAC10.html) |
| EP (1) | EP0073075B1 (cg-RX-API-DMAC10.html) |
| JP (1) | JPS5832471A (cg-RX-API-DMAC10.html) |
| AU (1) | AU552505B2 (cg-RX-API-DMAC10.html) |
| CA (1) | CA1217116A (cg-RX-API-DMAC10.html) |
| DE (1) | DE3277483D1 (cg-RX-API-DMAC10.html) |
| NL (1) | NL8103649A (cg-RX-API-DMAC10.html) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0222215B1 (en) * | 1985-10-23 | 1991-10-16 | Hitachi, Ltd. | Polysilicon mos transistor and method of manufacturing the same |
| US5037766A (en) * | 1988-12-06 | 1991-08-06 | Industrial Technology Research Institute | Method of fabricating a thin film polysilicon thin film transistor or resistor |
| GB8908509D0 (en) * | 1989-04-14 | 1989-06-01 | Secr Defence | Substitutional carbon in silicon |
| US5360986A (en) * | 1993-10-05 | 1994-11-01 | Motorola, Inc. | Carbon doped silicon semiconductor device having a narrowed bandgap characteristic and method |
| DE19652417A1 (de) * | 1996-12-09 | 1998-06-10 | Inst Halbleiterphysik Gmbh | MOSFET und Verfahren zur Herstellung der Schichten für einen derartigen Transistor |
| US5885861A (en) * | 1997-05-30 | 1999-03-23 | Advanced Micro Devices, Inc. | Reduction of dopant diffusion by the co-implantation of impurities into the transistor gate conductor |
| US6258067B1 (en) * | 1998-12-08 | 2001-07-10 | Smith & Nephew, Inc. | Middle ear fluid aspirator |
| US6576535B2 (en) | 2001-04-11 | 2003-06-10 | Texas Instruments Incorporated | Carbon doped epitaxial layer for high speed CB-CMOS |
| US6774019B2 (en) * | 2002-05-17 | 2004-08-10 | International Business Machines Corporation | Incorporation of an impurity into a thin film |
| CA2419216C (en) | 2003-02-19 | 2005-03-01 | Jan Nyquist | Method and apparatus for joining plastic pipe |
| US7736968B2 (en) * | 2008-10-27 | 2010-06-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Reducing poly-depletion through co-implanting carbon and nitrogen |
| US20120043600A1 (en) * | 2010-08-18 | 2012-02-23 | Van Der Vegt Henderikus Albert | Floating-Gate Device and Method Therefor |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE666629A (cg-RX-API-DMAC10.html) * | 1964-08-04 | |||
| US3497773A (en) * | 1967-02-20 | 1970-02-24 | Westinghouse Electric Corp | Passive circuit elements |
| CH474863A (de) * | 1968-06-20 | 1969-06-30 | Centre Electron Horloger | Verfahren zur Herstellung eines Zwischenproduktes für integrierte Schaltungen |
| US3750268A (en) * | 1971-09-10 | 1973-08-07 | Motorola Inc | Poly-silicon electrodes for c-igfets |
| FR2257998B1 (cg-RX-API-DMAC10.html) * | 1974-01-10 | 1976-11-26 | Commissariat Energie Atomique | |
| DE2508802A1 (de) * | 1975-02-28 | 1976-09-09 | Siemens Ag | Verfahren zum abscheiden von elementarem silicium |
| US4189826A (en) * | 1977-03-07 | 1980-02-26 | Eastman Kodak Company | Silicon charge-handling device employing SiC electrodes |
| DE2836911C2 (de) * | 1978-08-23 | 1986-11-06 | Siemens AG, 1000 Berlin und 8000 München | Passivierungsschicht für Halbleiterbauelemente |
| US4329699A (en) * | 1979-03-26 | 1982-05-11 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and method of manufacturing the same |
| JPS5693375A (en) * | 1979-12-26 | 1981-07-28 | Shunpei Yamazaki | Photoelectric conversion device |
| JPS5691458A (en) * | 1979-12-26 | 1981-07-24 | Fujitsu Ltd | Manufacturing of high-resistance element |
| FR2485810A1 (fr) * | 1980-06-24 | 1981-12-31 | Thomson Csf | Procede de realisation d'une couche contenant du silicium et dispositif de conversion photo-electrique mettant en oeuvre ce procede |
| US4439463A (en) * | 1982-02-18 | 1984-03-27 | Atlantic Richfield Company | Plasma assisted deposition system |
| JPS58171832A (ja) * | 1982-03-31 | 1983-10-08 | Toshiba Corp | 半導体装置の製造方法 |
-
1981
- 1981-08-03 NL NL8103649A patent/NL8103649A/nl not_active Application Discontinuation
-
1982
- 1982-07-28 EP EP82200965A patent/EP0073075B1/en not_active Expired
- 1982-07-28 DE DE8282200965T patent/DE3277483D1/de not_active Expired
- 1982-07-29 CA CA000408391A patent/CA1217116A/en not_active Expired
- 1982-07-30 AU AU86601/82A patent/AU552505B2/en not_active Ceased
- 1982-08-02 JP JP57135063A patent/JPS5832471A/ja active Granted
-
1986
- 1986-04-11 US US06/851,904 patent/US4891332A/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| DE3277483D1 (en) | 1987-11-19 |
| EP0073075A3 (en) | 1984-08-22 |
| EP0073075B1 (en) | 1987-10-14 |
| JPS5832471A (ja) | 1983-02-25 |
| AU552505B2 (en) | 1986-06-05 |
| JPH0139227B2 (cg-RX-API-DMAC10.html) | 1989-08-18 |
| AU8660182A (en) | 1983-02-10 |
| US4891332A (en) | 1990-01-02 |
| EP0073075A2 (en) | 1983-03-02 |
| CA1217116A (en) | 1987-01-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A1B | A search report has been drawn up | ||
| A85 | Still pending on 85-01-01 | ||
| BV | The patent application has lapsed |