NL7804038A - Elektronenmikroskoop. - Google Patents

Elektronenmikroskoop.

Info

Publication number
NL7804038A
NL7804038A NL7804038A NL7804038A NL7804038A NL 7804038 A NL7804038 A NL 7804038A NL 7804038 A NL7804038 A NL 7804038A NL 7804038 A NL7804038 A NL 7804038A NL 7804038 A NL7804038 A NL 7804038A
Authority
NL
Netherlands
Prior art keywords
microskop
electronic
electronic microskop
Prior art date
Application number
NL7804038A
Other languages
English (en)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Priority to NL7804038A priority Critical patent/NL7804038A/nl
Priority to GB7912909A priority patent/GB2019085B/en
Priority to JP4490379A priority patent/JPS54139458A/ja
Priority to DE19792915203 priority patent/DE2915203A1/de
Priority to FR7909632A priority patent/FR2423861A1/fr
Publication of NL7804038A publication Critical patent/NL7804038A/nl

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/261—Details
    • H01J37/263—Contrast, resolution or power of penetration
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/1478—Beam tilting means, i.e. for stereoscopy or for beam channelling

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL7804038A 1978-04-17 1978-04-17 Elektronenmikroskoop. NL7804038A (nl)

Priority Applications (5)

Application Number Priority Date Filing Date Title
NL7804038A NL7804038A (nl) 1978-04-17 1978-04-17 Elektronenmikroskoop.
GB7912909A GB2019085B (en) 1978-04-17 1979-04-12 Electron microscopes
JP4490379A JPS54139458A (en) 1978-04-17 1979-04-14 Electron microscope
DE19792915203 DE2915203A1 (de) 1978-04-17 1979-04-14 Elektronenmikroskop
FR7909632A FR2423861A1 (fr) 1978-04-17 1979-04-17 Microscope electronique

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7804038A NL7804038A (nl) 1978-04-17 1978-04-17 Elektronenmikroskoop.

Publications (1)

Publication Number Publication Date
NL7804038A true NL7804038A (nl) 1979-10-19

Family

ID=19830665

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7804038A NL7804038A (nl) 1978-04-17 1978-04-17 Elektronenmikroskoop.

Country Status (5)

Country Link
JP (1) JPS54139458A (nl)
DE (1) DE2915203A1 (nl)
FR (1) FR2423861A1 (nl)
GB (1) GB2019085B (nl)
NL (1) NL7804038A (nl)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56165255A (en) * 1980-05-26 1981-12-18 Hitachi Ltd Image indicating method for transmission scan electron microscope
JPH0616403B2 (ja) * 1983-06-10 1994-03-02 株式会社日立製作所 高分解能非干渉像の観察法
JPS6149362A (ja) * 1984-08-17 1986-03-11 Hitachi Ltd テレビジョン電子顕微鏡の焦点合わせ装置および焦点合わせ方法
EP1620895B1 (en) 2003-05-08 2016-03-02 The Science and Technology Facilities Council Accelerated particle and high energy radiation sensor
JP2006302523A (ja) * 2005-04-15 2006-11-02 Jeol Ltd 走査像観察機能を有した透過電子顕微鏡
JP6876418B2 (ja) * 2016-12-05 2021-05-26 日本電子株式会社 画像取得方法および電子顕微鏡

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1248201A (en) * 1967-07-03 1971-09-29 Nat Res Dev Electron microscopes
JPS4922768B1 (nl) * 1970-09-11 1974-06-11
US3917946A (en) * 1972-04-12 1975-11-04 Philips Corp Electron-optical device for the recording of selected diffraction patterns
JPS4917905A (nl) * 1972-06-07 1974-02-16
JPS4922576A (nl) * 1972-06-26 1974-02-28
GB1443562A (en) * 1973-08-14 1976-07-21 Ontario Research Foundation Method and apparatus for displaying images stereoscopically and for deriving signals from a scanning electron microscope for producing steroscopic images
JPS5118307A (ja) * 1974-10-11 1976-02-13 Sanyo Electric Co Oofukudoshikiatsushukuki
NL7510276A (nl) * 1975-09-01 1977-03-03 Philips Nv Elektronenmikroskoop.

Also Published As

Publication number Publication date
FR2423861B1 (nl) 1985-03-01
DE2915203A1 (de) 1979-10-25
JPS54139458A (en) 1979-10-29
FR2423861A1 (fr) 1979-11-16
GB2019085B (en) 1982-08-04
GB2019085A (en) 1979-10-24

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Legal Events

Date Code Title Description
A1B A search report has been drawn up
BV The patent application has lapsed