GB1248201A - Electron microscopes - Google Patents
Electron microscopesInfo
- Publication number
- GB1248201A GB1248201A GB3055167A GB3055167A GB1248201A GB 1248201 A GB1248201 A GB 1248201A GB 3055167 A GB3055167 A GB 3055167A GB 3055167 A GB3055167 A GB 3055167A GB 1248201 A GB1248201 A GB 1248201A
- Authority
- GB
- United Kingdom
- Prior art keywords
- electron
- specimen
- collector
- electrons
- amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
- H01J37/1478—Beam tilting means, i.e. for stereoscopy or for beam channelling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/295—Electron or ion diffraction tubes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1,248,201. Electron microscopes. NATIONAL RESEARCH DEVELOPMENT CORP. 2 Oct., 1968 [3 July, 1967], No. 30551/67. Heading H1D. An electron microscope includes means for varying the angle between the electron beam and the normal to the specimen surface at a fixed point and means for collecting absorbed or back scattered electrons (e.g. reflected primary electrons or secondary electrons) such as collector 9 including collector electrode 11, scintillator 13 and photomultiplier 15 connected to amplifier 16 and/or a connection from stage 3 to amplifier 20 connected to grid 17 of C.R.T. 19 via double-throw switch 18. Deflector plates 25, 27 are connected to tilting means 21, 23 and the C.R.T. displays a graphical indication of the collector outputs at a plurality of different angles between the beam and specimen all at the same time and as a function of the angle. Angular variation may be by tilting the specimen and/or varying the beam direction by deflection coils. Electrode 11 is at a low voltage for reflected electron collection, and high voltage for secondary electron collection. The display may be photographed or a high persistence phosphor utilized.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB3055167A GB1248201A (en) | 1967-07-03 | 1967-07-03 | Electron microscopes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB3055167A GB1248201A (en) | 1967-07-03 | 1967-07-03 | Electron microscopes |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1248201A true GB1248201A (en) | 1971-09-29 |
Family
ID=10309413
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB3055167A Expired GB1248201A (en) | 1967-07-03 | 1967-07-03 | Electron microscopes |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1248201A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2179978A1 (en) * | 1972-04-12 | 1973-11-23 | Philips Nv | |
FR2423861A1 (en) * | 1978-04-17 | 1979-11-16 | Philips Nv | ELECTRONIC MICROSCOPE |
US5256877A (en) * | 1989-09-08 | 1993-10-26 | Isis Innovation Limited | Method and apparatus for imaging dislocations in materials using a scanning electron microscope |
-
1967
- 1967-07-03 GB GB3055167A patent/GB1248201A/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2179978A1 (en) * | 1972-04-12 | 1973-11-23 | Philips Nv | |
FR2423861A1 (en) * | 1978-04-17 | 1979-11-16 | Philips Nv | ELECTRONIC MICROSCOPE |
US5256877A (en) * | 1989-09-08 | 1993-10-26 | Isis Innovation Limited | Method and apparatus for imaging dislocations in materials using a scanning electron microscope |
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