NL7304298A - - Google Patents
Info
- Publication number
- NL7304298A NL7304298A NL7304298A NL7304298A NL7304298A NL 7304298 A NL7304298 A NL 7304298A NL 7304298 A NL7304298 A NL 7304298A NL 7304298 A NL7304298 A NL 7304298A NL 7304298 A NL7304298 A NL 7304298A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details
- H01J37/265—Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (11)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL7304298A NL7304298A (enrdf_load_stackoverflow) | 1973-03-28 | 1973-03-28 | |
| US449844A US3889114A (en) | 1973-03-28 | 1974-03-11 | Electron microscope for dark-field illumination |
| GB1116974A GB1469777A (en) | 1973-03-28 | 1974-03-13 | Electron microscope |
| DE2412675A DE2412675A1 (de) | 1973-03-28 | 1974-03-16 | Elektronenmikroskop fuer dunkelfeldbeleuchtung |
| FR7410194A FR2223831B1 (enrdf_load_stackoverflow) | 1973-03-28 | 1974-03-25 | |
| SE7403979A SE392365B (sv) | 1973-03-28 | 1974-03-25 | Elektronmikroskop med en ringformig blendare |
| JP49033391A JPS49130668A (enrdf_load_stackoverflow) | 1973-03-28 | 1974-03-25 | |
| IT49615/74A IT1003873B (it) | 1973-03-28 | 1974-03-25 | Perfezionamento nei microscopi elettronici |
| CA195,890A CA1002209A (en) | 1973-03-28 | 1974-03-25 | Electron microscope for dark-field illumination |
| ES424663A ES424663A1 (es) | 1973-03-28 | 1974-03-26 | Microscopio electronico perfeccionado. |
| BE142466A BE812849A (fr) | 1973-03-28 | 1974-03-26 | Microscope electronique operant par champ d'obscurite |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL7304298A NL7304298A (enrdf_load_stackoverflow) | 1973-03-28 | 1973-03-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL7304298A true NL7304298A (enrdf_load_stackoverflow) | 1974-10-01 |
Family
ID=19818520
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL7304298A NL7304298A (enrdf_load_stackoverflow) | 1973-03-28 | 1973-03-28 |
Country Status (11)
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2541915A1 (de) * | 1975-09-19 | 1977-03-31 | Max Planck Gesellschaft | Korpuskularstrahlenmikroskop mit ringzonensegmentabbildung |
| JPS5248964A (en) * | 1975-10-17 | 1977-04-19 | Hitachi Ltd | Transmission-type scanning electronic microscope |
| AT353519B (de) * | 1978-03-07 | 1979-11-26 | Oesterr Studien Atomenergie | Einrichtung zur buendelung des primaerionen- strahls |
| JPS63298949A (ja) * | 1987-05-28 | 1988-12-06 | Jeol Ltd | 広狭領域が同時観察可能な分析電子顕微鏡 |
| JPH0233843A (ja) * | 1988-07-25 | 1990-02-05 | Hitachi Ltd | 走査電子顕微鏡 |
| JPH0594798A (ja) * | 1991-05-21 | 1993-04-16 | Jeol Ltd | 焦点深度切り換え可能な電子顕微鏡等の電子光学観察装置 |
| DE4412137A1 (de) * | 1993-12-28 | 1995-10-26 | Alexander Dr Zarubin | Mikroskop, welches mit geladenen Teilchen arbeitet |
| US8642959B2 (en) * | 2007-10-29 | 2014-02-04 | Micron Technology, Inc. | Method and system of performing three-dimensional imaging using an electron microscope |
| DE102009016861A1 (de) * | 2009-04-08 | 2010-10-21 | Carl Zeiss Nts Gmbh | Teilchenstrahlmikroskop |
| CN103388406A (zh) * | 2013-07-29 | 2013-11-13 | 苏州市世好建材新技术工程有限公司 | 插合式铺浆器 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2464419A (en) * | 1947-12-26 | 1949-03-15 | Rca Corp | Method of and apparatus for selectively achieving electronic darkfield and bright field illumation |
| DE2213208C3 (de) * | 1972-03-16 | 1975-11-13 | Max Planck Gesellschaft | Rotationssymetrisches, sphärisch korrigiertes korpuskularstrahloptisches Abbildungssystem |
-
1973
- 1973-03-28 NL NL7304298A patent/NL7304298A/xx unknown
-
1974
- 1974-03-11 US US449844A patent/US3889114A/en not_active Expired - Lifetime
- 1974-03-13 GB GB1116974A patent/GB1469777A/en not_active Expired
- 1974-03-16 DE DE2412675A patent/DE2412675A1/de active Pending
- 1974-03-25 CA CA195,890A patent/CA1002209A/en not_active Expired
- 1974-03-25 JP JP49033391A patent/JPS49130668A/ja active Pending
- 1974-03-25 SE SE7403979A patent/SE392365B/xx unknown
- 1974-03-25 IT IT49615/74A patent/IT1003873B/it active
- 1974-03-25 FR FR7410194A patent/FR2223831B1/fr not_active Expired
- 1974-03-26 ES ES424663A patent/ES424663A1/es not_active Expired
- 1974-03-26 BE BE142466A patent/BE812849A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| FR2223831A1 (enrdf_load_stackoverflow) | 1974-10-25 |
| IT1003873B (it) | 1976-06-10 |
| BE812849A (fr) | 1974-09-26 |
| ES424663A1 (es) | 1976-06-01 |
| SE392365B (sv) | 1977-03-21 |
| GB1469777A (en) | 1977-04-06 |
| FR2223831B1 (enrdf_load_stackoverflow) | 1977-09-30 |
| DE2412675A1 (de) | 1974-10-10 |
| US3889114A (en) | 1975-06-10 |
| CA1002209A (en) | 1976-12-21 |
| JPS49130668A (enrdf_load_stackoverflow) | 1974-12-14 |