GB1469777A - Electron microscope - Google Patents
Electron microscopeInfo
- Publication number
- GB1469777A GB1469777A GB1116974A GB1116974A GB1469777A GB 1469777 A GB1469777 A GB 1469777A GB 1116974 A GB1116974 A GB 1116974A GB 1116974 A GB1116974 A GB 1116974A GB 1469777 A GB1469777 A GB 1469777A
- Authority
- GB
- United Kingdom
- Prior art keywords
- specimen
- lens
- sequence
- image
- angles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details
- H01J37/265—Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1469777 Electron microscopes PHILIPS ELECTRONIC & ASSOCIATED INDUSTRIES Ltd 13 March 1974 [28 March 1973] 11169/74 Heading H1D An electron microscope includes a first condenser lens 21, second condenser lens 3 for imaging electron source 1 on the specimen at point 5 and annular diaphragm 10 between source 1 and lens 3 so that the specimen is illuminated by a hollow conical beam of electrons, the conical angle of which is variable by use of a control means which by appropriate energizations of lenses 2 and 3 automatically maintains the image in focus. Angular scanning may be employed, the specimen be illuminated at a plurality of discrete energization levels of the lenses, and each image stored for later comparison. Fig. 1 also includes specimen holder 4, objective lens 6, objective diaphragm 7, and display screen 8. For each lens 2 setting, lens 3 is automatically energized to effect imaging. In the specimen, some electrons are scattered in cone 16. Fig. 2 (not shown) includes supply (20) with timer (21) providing illumination periods (22), with a sequence of illumination angles corresponding to block sequences (23, 24). Correlation between sequence of illumination times and a sequence of angles with reference to a known scattering pattern of a given structure, e.g. a type of atom, enables the particular structures to be selectively displayed. The preferred correlation is that the output signal is equal at all angles for the selected structure only. Image signal from TV camera tube (25) may be recorded in computer store (26) for display on monitor (27). Store (26) may incorporate 10<SP>4</SP> storage elements each with a (16) bit store. A colour monitor utilizes chromatizing device (28), image elements of the same diffraction pattern.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL7304298A NL7304298A (en) | 1973-03-28 | 1973-03-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1469777A true GB1469777A (en) | 1977-04-06 |
Family
ID=19818520
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1116974A Expired GB1469777A (en) | 1973-03-28 | 1974-03-13 | Electron microscope |
Country Status (11)
Country | Link |
---|---|
US (1) | US3889114A (en) |
JP (1) | JPS49130668A (en) |
BE (1) | BE812849A (en) |
CA (1) | CA1002209A (en) |
DE (1) | DE2412675A1 (en) |
ES (1) | ES424663A1 (en) |
FR (1) | FR2223831B1 (en) |
GB (1) | GB1469777A (en) |
IT (1) | IT1003873B (en) |
NL (1) | NL7304298A (en) |
SE (1) | SE392365B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2208035A (en) * | 1987-05-28 | 1989-02-15 | Jeol Ltd | Analytical electron microscope |
GB2221567A (en) * | 1988-07-25 | 1990-02-07 | Hitachi Ltd | Scanning electron microscope |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2541915A1 (en) * | 1975-09-19 | 1977-03-31 | Max Planck Gesellschaft | BODY RAY MICROSCOPE WITH RING ZONE SEGMENT IMAGE |
JPS5248964A (en) * | 1975-10-17 | 1977-04-19 | Hitachi Ltd | Transmission-type scanning electronic microscope |
AT353519B (en) * | 1978-03-07 | 1979-11-26 | Oesterr Studien Atomenergie | DEVICE FOR CONCENTRATING THE PRIMAERION BEAM |
JPH0594798A (en) * | 1991-05-21 | 1993-04-16 | Jeol Ltd | Electronic optical observation device for focal depth changeable electron microscope, etc. |
DE4412137A1 (en) * | 1993-12-28 | 1995-10-26 | Alexander Dr Zarubin | Microscope that works with charged particles |
US8642959B2 (en) * | 2007-10-29 | 2014-02-04 | Micron Technology, Inc. | Method and system of performing three-dimensional imaging using an electron microscope |
DE102009016861A1 (en) * | 2009-04-08 | 2010-10-21 | Carl Zeiss Nts Gmbh | particle beam |
CN103388406A (en) * | 2013-07-29 | 2013-11-13 | 苏州市世好建材新技术工程有限公司 | Spliced mortar spreader |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2464419A (en) * | 1947-12-26 | 1949-03-15 | Rca Corp | Method of and apparatus for selectively achieving electronic darkfield and bright field illumation |
DE2213208C3 (en) * | 1972-03-16 | 1975-11-13 | Max Planck Gesellschaft | Rotationally symmetrical, spherically corrected corpuscular beam optical imaging system |
-
1973
- 1973-03-28 NL NL7304298A patent/NL7304298A/xx unknown
-
1974
- 1974-03-11 US US449844A patent/US3889114A/en not_active Expired - Lifetime
- 1974-03-13 GB GB1116974A patent/GB1469777A/en not_active Expired
- 1974-03-16 DE DE2412675A patent/DE2412675A1/en active Pending
- 1974-03-25 IT IT49615/74A patent/IT1003873B/en active
- 1974-03-25 SE SE7403979A patent/SE392365B/en unknown
- 1974-03-25 FR FR7410194A patent/FR2223831B1/fr not_active Expired
- 1974-03-25 JP JP49033391A patent/JPS49130668A/ja active Pending
- 1974-03-25 CA CA195,890A patent/CA1002209A/en not_active Expired
- 1974-03-26 ES ES424663A patent/ES424663A1/en not_active Expired
- 1974-03-26 BE BE142466A patent/BE812849A/en unknown
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2208035A (en) * | 1987-05-28 | 1989-02-15 | Jeol Ltd | Analytical electron microscope |
GB2208035B (en) * | 1987-05-28 | 1992-03-18 | Jeol Ltd | Analytical electron microscope |
GB2221567A (en) * | 1988-07-25 | 1990-02-07 | Hitachi Ltd | Scanning electron microscope |
US4983832A (en) * | 1988-07-25 | 1991-01-08 | Hitachi, Ltd. | Scanning electron microscope |
GB2221567B (en) * | 1988-07-25 | 1992-11-11 | Hitachi Ltd | Scanning electron microscope |
Also Published As
Publication number | Publication date |
---|---|
BE812849A (en) | 1974-09-26 |
DE2412675A1 (en) | 1974-10-10 |
IT1003873B (en) | 1976-06-10 |
CA1002209A (en) | 1976-12-21 |
SE392365B (en) | 1977-03-21 |
FR2223831B1 (en) | 1977-09-30 |
US3889114A (en) | 1975-06-10 |
ES424663A1 (en) | 1976-06-01 |
NL7304298A (en) | 1974-10-01 |
FR2223831A1 (en) | 1974-10-25 |
JPS49130668A (en) | 1974-12-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |