NL7301024A - - Google Patents

Info

Publication number
NL7301024A
NL7301024A NL7301024A NL7301024A NL7301024A NL 7301024 A NL7301024 A NL 7301024A NL 7301024 A NL7301024 A NL 7301024A NL 7301024 A NL7301024 A NL 7301024A NL 7301024 A NL7301024 A NL 7301024A
Authority
NL
Netherlands
Application number
NL7301024A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SU1743310A external-priority patent/SU445364A1/ru
Application filed filed Critical
Publication of NL7301024A publication Critical patent/NL7301024A/xx

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL7301024A 1972-01-28 1973-01-24 NL7301024A (hr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SU1747007 1972-01-28
SU1743310A SU445364A1 (ru) 1972-01-28 1972-01-28 Устройство дл получени топограмм кристаллов

Publications (1)

Publication Number Publication Date
NL7301024A true NL7301024A (hr) 1973-07-31

Family

ID=26665455

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7301024A NL7301024A (hr) 1972-01-28 1973-01-24

Country Status (8)

Country Link
US (1) US3833810A (hr)
AT (1) AT346629B (hr)
CS (1) CS176429B1 (hr)
DD (1) DD103727A1 (hr)
FR (1) FR2169617A5 (hr)
GB (1) GB1414572A (hr)
HU (1) HU166083B (hr)
NL (1) NL7301024A (hr)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4179100A (en) * 1977-08-01 1979-12-18 University Of Pittsburgh Radiography apparatus
US4229651A (en) * 1979-02-01 1980-10-21 Michael Danos Radiation scanning method and apparatus
US4495636A (en) * 1981-01-02 1985-01-22 Research Corporation Multichannel radiography employing scattered radiation
JPS6193936A (ja) * 1984-10-13 1986-05-12 Furukawa Electric Co Ltd:The 放射線による被測定物の組成分析方法
DE3439471A1 (de) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende
US4718075A (en) * 1986-03-28 1988-01-05 Grumman Aerospace Corporation Raster scan anode X-ray tube
GB8814343D0 (en) * 1988-06-16 1988-07-20 Gersan Ets Determining misorientation in crystal
FR2668262B1 (fr) * 1990-10-23 1994-04-01 Centre Nal Recherc Scientifique Procede d'analyse aux rayons x de pieces monocristallines.
JP3191554B2 (ja) * 1994-03-18 2001-07-23 株式会社日立製作所 Ｘ線撮像装置
GB2288961B (en) * 1994-04-22 1998-10-14 Rolls Royce Plc An apparatus and a method for inspecting a crystal
US5589690A (en) * 1995-03-21 1996-12-31 National Institute Of Standards And Technology Apparatus and method for monitoring casting process
SE9603499L (sv) * 1996-09-25 1997-10-27 Ragnar Kullenberg Metod och anordning för att detektera och analysera röntgenstrålning
US6269144B1 (en) * 1998-03-04 2001-07-31 William P. Dube Method and apparatus for diffraction measurement using a scanning x-ray source
GB0312499D0 (en) * 2003-05-31 2003-07-09 Council Cent Lab Res Councils Tomographic energy dispersive diffraction imaging system
WO2005031329A1 (en) * 2003-08-04 2005-04-07 X-Ray Optical Systems, Inc. In-situ x-ray diffraction system using sources and detectors at fixed angular positions
RU2242748C1 (ru) * 2003-08-19 2004-12-20 Общество с ограниченной ответственностью "Институт рентгеновской оптики" Детектирующий узел для рентгеновских дифракционных измерений
US7881437B2 (en) * 2006-07-11 2011-02-01 Morpho Detection, Inc. Systems and methods for developing a primary collimator
WO2008097345A2 (en) * 2006-08-10 2008-08-14 X-Ray Optical Systems, Inc. Wide parallel beam diffraction imaging method and system
KR20130087843A (ko) * 2012-01-30 2013-08-07 한국전자통신연구원 단결정 물질을 이용한 엑스선 제어 장치
DE102017223228B3 (de) 2017-12-19 2018-12-27 Bruker Axs Gmbh Aufbau zur ortsaufgelösten Messung mit einem wellenlängendispersiven Röntgenspektrometer

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL72976C (hr) * 1948-03-27
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness
SE327573B (hr) * 1967-03-13 1970-08-24 Incentive Res & Dev Ab
GB1272333A (en) * 1968-06-22 1972-04-26 Philips Electronic Associated Apparatus for determining the crystallographic directions of a single crystal by means of a beam of x-rays

Also Published As

Publication number Publication date
AT346629B (de) 1978-11-27
FR2169617A5 (hr) 1973-09-07
GB1414572A (en) 1975-11-19
US3833810A (en) 1974-09-03
CS176429B1 (hr) 1977-06-30
DD103727A1 (hr) 1974-02-05
DE2304119A1 (de) 1973-08-02
DE2304119B2 (de) 1976-08-12
HU166083B (hr) 1975-01-28
ATA38073A (de) 1978-03-15

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Legal Events

Date Code Title Description
BV The patent application has lapsed