HU166083B - - Google Patents
Info
- Publication number
- HU166083B HU166083B HUEA120A HUEA000120A HU166083B HU 166083 B HU166083 B HU 166083B HU EA120 A HUEA120 A HU EA120A HU EA000120 A HUEA000120 A HU EA000120A HU 166083 B HU166083 B HU 166083B
- Authority
- HU
- Hungary
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- High Energy & Nuclear Physics (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU1747007 | 1972-01-28 | ||
| SU1743310A SU445364A1 (ru) | 1972-01-28 | 1972-01-28 | Устройство дл получени топограмм кристаллов |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| HU166083B true HU166083B (hu) | 1975-01-28 |
Family
ID=26665455
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| HUEA120A HU166083B (hu) | 1972-01-28 | 1973-01-19 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3833810A (hu) |
| AT (1) | AT346629B (hu) |
| CS (1) | CS176429B1 (hu) |
| DD (1) | DD103727A1 (hu) |
| FR (1) | FR2169617A5 (hu) |
| GB (1) | GB1414572A (hu) |
| HU (1) | HU166083B (hu) |
| NL (1) | NL7301024A (hu) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4179100A (en) * | 1977-08-01 | 1979-12-18 | University Of Pittsburgh | Radiography apparatus |
| US4229651A (en) * | 1979-02-01 | 1980-10-21 | Michael Danos | Radiation scanning method and apparatus |
| US4495636A (en) * | 1981-01-02 | 1985-01-22 | Research Corporation | Multichannel radiography employing scattered radiation |
| JPS6193936A (ja) * | 1984-10-13 | 1986-05-12 | Furukawa Electric Co Ltd:The | 放射線による被測定物の組成分析方法 |
| DE3439471A1 (de) * | 1984-10-27 | 1986-04-30 | MTU Motoren- und Turbinen-Union München GmbH, 8000 München | Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende |
| US4718075A (en) * | 1986-03-28 | 1988-01-05 | Grumman Aerospace Corporation | Raster scan anode X-ray tube |
| GB8814343D0 (en) * | 1988-06-16 | 1988-07-20 | Gersan Ets | Determining misorientation in crystal |
| FR2668262B1 (fr) * | 1990-10-23 | 1994-04-01 | Centre Nal Recherc Scientifique | Procede d'analyse aux rayons x de pieces monocristallines. |
| JP3191554B2 (ja) * | 1994-03-18 | 2001-07-23 | 株式会社日立製作所 | Ｘ線撮像装置 |
| GB2288961B (en) * | 1994-04-22 | 1998-10-14 | Rolls Royce Plc | An apparatus and a method for inspecting a crystal |
| US5589690A (en) * | 1995-03-21 | 1996-12-31 | National Institute Of Standards And Technology | Apparatus and method for monitoring casting process |
| SE505925C2 (sv) * | 1996-09-25 | 1997-10-27 | Ragnar Kullenberg | Metod och anordning för att detektera och analysera röntgenstrålning |
| US6269144B1 (en) * | 1998-03-04 | 2001-07-31 | William P. Dube | Method and apparatus for diffraction measurement using a scanning x-ray source |
| GB0312499D0 (en) * | 2003-05-31 | 2003-07-09 | Council Cent Lab Res Councils | Tomographic energy dispersive diffraction imaging system |
| WO2005031329A1 (en) * | 2003-08-04 | 2005-04-07 | X-Ray Optical Systems, Inc. | In-situ x-ray diffraction system using sources and detectors at fixed angular positions |
| RU2242748C1 (ru) * | 2003-08-19 | 2004-12-20 | Общество с ограниченной ответственностью "Институт рентгеновской оптики" | Детектирующий узел для рентгеновских дифракционных измерений |
| US7881437B2 (en) * | 2006-07-11 | 2011-02-01 | Morpho Detection, Inc. | Systems and methods for developing a primary collimator |
| US20080159479A1 (en) * | 2006-08-10 | 2008-07-03 | X-Ray Optical Systems, Inc. | Wide parallel beam diffraction imaging method and system |
| KR20130087843A (ko) * | 2012-01-30 | 2013-08-07 | 한국전자통신연구원 | 단결정 물질을 이용한 엑스선 제어 장치 |
| DE102017223228B3 (de) | 2017-12-19 | 2018-12-27 | Bruker Axs Gmbh | Aufbau zur ortsaufgelösten Messung mit einem wellenlängendispersiven Röntgenspektrometer |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL72976C (hu) * | 1948-03-27 | |||
| US2578722A (en) * | 1950-05-18 | 1951-12-18 | United States Steel Corp | Apparatus for determining coating thickness |
| SE327573B (hu) * | 1967-03-13 | 1970-08-24 | Incentive Res & Dev Ab | |
| GB1272333A (en) * | 1968-06-22 | 1972-04-26 | Philips Electronic Associated | Apparatus for determining the crystallographic directions of a single crystal by means of a beam of x-rays |
-
1973
- 1973-01-18 AT AT38073A patent/AT346629B/de not_active IP Right Cessation
- 1973-01-19 HU HUEA120A patent/HU166083B/hu unknown
- 1973-01-23 FR FR7302206A patent/FR2169617A5/fr not_active Expired
- 1973-01-24 NL NL7301024A patent/NL7301024A/xx not_active Application Discontinuation
- 1973-01-24 US US00326335A patent/US3833810A/en not_active Expired - Lifetime
- 1973-01-25 DD DD168447A patent/DD103727A1/xx unknown
- 1973-01-25 CS CS573A patent/CS176429B1/cs unknown
- 1973-01-29 GB GB442073A patent/GB1414572A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB1414572A (en) | 1975-11-19 |
| ATA38073A (de) | 1978-03-15 |
| DE2304119A1 (de) | 1973-08-02 |
| AT346629B (de) | 1978-11-27 |
| US3833810A (en) | 1974-09-03 |
| FR2169617A5 (hu) | 1973-09-07 |
| DD103727A1 (hu) | 1974-02-05 |
| CS176429B1 (hu) | 1977-06-30 |
| NL7301024A (hu) | 1973-07-31 |
| DE2304119B2 (de) | 1976-08-12 |