GB1414572A - Rabodzei n v x-ray diffraction topography of monocrystals - Google Patents

Rabodzei n v x-ray diffraction topography of monocrystals

Info

Publication number
GB1414572A
GB1414572A GB442073A GB442073A GB1414572A GB 1414572 A GB1414572 A GB 1414572A GB 442073 A GB442073 A GB 442073A GB 442073 A GB442073 A GB 442073A GB 1414572 A GB1414572 A GB 1414572A
Authority
GB
United Kingdom
Prior art keywords
collimator
crystal
ray
replaced
crt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB442073A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EFANOV V P KOMYAK N I LJUTTSAU
Original Assignee
EFANOV V P KOMYAK N I LJUTTSAU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SU1743310A external-priority patent/SU445364A1/en
Application filed by EFANOV V P KOMYAK N I LJUTTSAU filed Critical EFANOV V P KOMYAK N I LJUTTSAU
Publication of GB1414572A publication Critical patent/GB1414572A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

1414572 Local viewing; X-ray diffraction apparatus V P EFANOV N I KOMYAK V G LJUTTSAU and N V RABODZEI 29 Jan 1973 [28 Jan 1972 (2)] 4420/73 Headings H4F and H5R The X-ray topogram of a monocrystal 3, e.g. of silicon, is obtained by directing thereon a beam of X-rays 19 and selectively transmitting the Bragg diffracted beam 20 via a multichannel collimator 4, e.g. a matrix of capillary tubes 7, to a detecting and recording arrangement 5, 6. As shown, a cathode-ray tube (CRT)1 with a target anode 9 coated on a beryllium window 10 co-operates with an optional multi-channel collimator 2 to provide a scanning collimated beam 19 incident on crystal 3 at the Bragg angle #, and the beam 20 is detected on a CRT 5 controlling a display CRT 6. If collimator 2 is omitted, crystal 3 acts as its own collimator, but the contrast of the display is reduced. The electron beam of tube 1 and the channels of collimator 7 are each 20 Á in diameter. The tubes 5 and 6 may be replaced by a photographic film, and tube 1 may be replaced by a broad beam X-ray source. Initially the apparatus is set up with collimator 2 absent, by rotating crystal 3 or collimator 7 until an image appears at 6, whereupon collimator 2 may be added for increased contrast. The aligned collimator assembly 2, 7 may then be retained for examining a series of crystals 3 of the same type, and be replaced by a different assembly when the type of crystal 3 is altered. It is said that the arrangement allows changes in the crystal structure, e.g. flow growth, manufacture of P-N junctions, to be followed with the crystal in situ and subjected for example to external mechanical and thermal constraints. The distance between the X-ray source and detector may be 2-10 mm.
GB442073A 1972-01-28 1973-01-29 Rabodzei n v x-ray diffraction topography of monocrystals Expired GB1414572A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SU1747007 1972-01-28
SU1743310A SU445364A1 (en) 1972-01-28 1972-01-28 A device for obtaining topograms of crystals

Publications (1)

Publication Number Publication Date
GB1414572A true GB1414572A (en) 1975-11-19

Family

ID=26665455

Family Applications (1)

Application Number Title Priority Date Filing Date
GB442073A Expired GB1414572A (en) 1972-01-28 1973-01-29 Rabodzei n v x-ray diffraction topography of monocrystals

Country Status (8)

Country Link
US (1) US3833810A (en)
AT (1) AT346629B (en)
CS (1) CS176429B1 (en)
DD (1) DD103727A1 (en)
FR (1) FR2169617A5 (en)
GB (1) GB1414572A (en)
HU (1) HU166083B (en)
NL (1) NL7301024A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2166630A (en) * 1984-10-27 1986-05-08 Mtu Muenchen Gmbh Method and apparatus for inspecting a crystalline object
GB2288961A (en) * 1994-04-22 1995-11-01 Rolls Royce Plc An apparatus for inspecting a crystal by x-ray diffraction

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4179100A (en) * 1977-08-01 1979-12-18 University Of Pittsburgh Radiography apparatus
US4229651A (en) * 1979-02-01 1980-10-21 Michael Danos Radiation scanning method and apparatus
US4495636A (en) * 1981-01-02 1985-01-22 Research Corporation Multichannel radiography employing scattered radiation
JPS6193936A (en) * 1984-10-13 1986-05-12 Furukawa Electric Co Ltd:The Method for analyzing composition of material to be measured by radiation
US4718075A (en) * 1986-03-28 1988-01-05 Grumman Aerospace Corporation Raster scan anode X-ray tube
GB8814343D0 (en) * 1988-06-16 1988-07-20 Gersan Ets Determining misorientation in crystal
FR2668262B1 (en) * 1990-10-23 1994-04-01 Centre Nal Recherc Scientifique X-RAY ANALYSIS PROCESS FOR MONOCRYSTALLINE PARTS.
JP3191554B2 (en) * 1994-03-18 2001-07-23 株式会社日立製作所 X-ray imaging device
US5589690A (en) * 1995-03-21 1996-12-31 National Institute Of Standards And Technology Apparatus and method for monitoring casting process
SE9603499L (en) * 1996-09-25 1997-10-27 Ragnar Kullenberg Method and apparatus for detecting and analyzing X-rays
US6269144B1 (en) * 1998-03-04 2001-07-31 William P. Dube Method and apparatus for diffraction measurement using a scanning x-ray source
GB0312499D0 (en) * 2003-05-31 2003-07-09 Council Cent Lab Res Councils Tomographic energy dispersive diffraction imaging system
CN1864062B (en) * 2003-08-04 2011-11-02 X射线光学系统公司 In-situ x-ray diffraction system using sources and detectors at fixed angular positions
RU2242748C1 (en) * 2003-08-19 2004-12-20 Общество с ограниченной ответственностью "Институт рентгеновской оптики" Detecting assembly for x-ray diffraction measurements
US7881437B2 (en) * 2006-07-11 2011-02-01 Morpho Detection, Inc. Systems and methods for developing a primary collimator
US20080159479A1 (en) * 2006-08-10 2008-07-03 X-Ray Optical Systems, Inc. Wide parallel beam diffraction imaging method and system
KR20130087843A (en) * 2012-01-30 2013-08-07 한국전자통신연구원 X-ray control unit using monocrystalline material
DE102017223228B3 (en) 2017-12-19 2018-12-27 Bruker Axs Gmbh Setup for spatially resolved measurement with a wavelength-dispersive X-ray spectrometer

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL72976C (en) * 1948-03-27
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness
SE327573B (en) * 1967-03-13 1970-08-24 Incentive Res & Dev Ab
GB1272333A (en) * 1968-06-22 1972-04-26 Philips Electronic Associated Apparatus for determining the crystallographic directions of a single crystal by means of a beam of x-rays

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2166630A (en) * 1984-10-27 1986-05-08 Mtu Muenchen Gmbh Method and apparatus for inspecting a crystalline object
GB2288961A (en) * 1994-04-22 1995-11-01 Rolls Royce Plc An apparatus for inspecting a crystal by x-ray diffraction
GB2288961B (en) * 1994-04-22 1998-10-14 Rolls Royce Plc An apparatus and a method for inspecting a crystal

Also Published As

Publication number Publication date
CS176429B1 (en) 1977-06-30
DD103727A1 (en) 1974-02-05
FR2169617A5 (en) 1973-09-07
AT346629B (en) 1978-11-27
ATA38073A (en) 1978-03-15
DE2304119B2 (en) 1976-08-12
US3833810A (en) 1974-09-03
HU166083B (en) 1975-01-28
DE2304119A1 (en) 1973-08-02
NL7301024A (en) 1973-07-31

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee