ATA38073A - METHOD FOR X-RAY DIFFraction Topography Of Monocrystals And Device For Passing The Same - Google Patents

METHOD FOR X-RAY DIFFraction Topography Of Monocrystals And Device For Passing The Same

Info

Publication number
ATA38073A
ATA38073A AT38073A AT38073A ATA38073A AT A38073 A ATA38073 A AT A38073A AT 38073 A AT38073 A AT 38073A AT 38073 A AT38073 A AT 38073A AT A38073 A ATA38073 A AT A38073A
Authority
AT
Austria
Prior art keywords
monocrystals
passing
same
ray diffraction
diffraction topography
Prior art date
Application number
AT38073A
Other languages
German (de)
Other versions
AT346629B (en
Original Assignee
Efanov Valery P
Komyak Nikolai Ivanovich
Ljuttsau Vsevolod Grigorievich
Rabodzei Nikolai Vasilievich
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SU1743310A external-priority patent/SU445364A1/en
Application filed by Efanov Valery P, Komyak Nikolai Ivanovich, Ljuttsau Vsevolod Grigorievich, Rabodzei Nikolai Vasilievich filed Critical Efanov Valery P
Publication of ATA38073A publication Critical patent/ATA38073A/en
Application granted granted Critical
Publication of AT346629B publication Critical patent/AT346629B/en

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT38073A 1972-01-28 1973-01-18 PROCESS FOR ROENTGEN DIFFraction TOPOGRAPHING OF SINGLE CRYSTALS AND DEVICE FOR IMPLEMENTING THESE AT346629B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SU1747007 1972-01-28
SU1743310A SU445364A1 (en) 1972-01-28 1972-01-28 A device for obtaining topograms of crystals

Publications (2)

Publication Number Publication Date
ATA38073A true ATA38073A (en) 1978-03-15
AT346629B AT346629B (en) 1978-11-27

Family

ID=26665455

Family Applications (1)

Application Number Title Priority Date Filing Date
AT38073A AT346629B (en) 1972-01-28 1973-01-18 PROCESS FOR ROENTGEN DIFFraction TOPOGRAPHING OF SINGLE CRYSTALS AND DEVICE FOR IMPLEMENTING THESE

Country Status (8)

Country Link
US (1) US3833810A (en)
AT (1) AT346629B (en)
CS (1) CS176429B1 (en)
DD (1) DD103727A1 (en)
FR (1) FR2169617A5 (en)
GB (1) GB1414572A (en)
HU (1) HU166083B (en)
NL (1) NL7301024A (en)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4179100A (en) * 1977-08-01 1979-12-18 University Of Pittsburgh Radiography apparatus
US4229651A (en) * 1979-02-01 1980-10-21 Michael Danos Radiation scanning method and apparatus
US4495636A (en) * 1981-01-02 1985-01-22 Research Corporation Multichannel radiography employing scattered radiation
JPS6193936A (en) * 1984-10-13 1986-05-12 Furukawa Electric Co Ltd:The Method for analyzing composition of material to be measured by radiation
DE3439471A1 (en) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München METHOD AND DEVICE FOR TESTING SINGLE-CRYSTAL OBJECTS
US4718075A (en) * 1986-03-28 1988-01-05 Grumman Aerospace Corporation Raster scan anode X-ray tube
GB8814343D0 (en) * 1988-06-16 1988-07-20 Gersan Ets Determining misorientation in crystal
FR2668262B1 (en) * 1990-10-23 1994-04-01 Centre Nal Recherc Scientifique X-RAY ANALYSIS PROCESS FOR MONOCRYSTALLINE PARTS.
JP3191554B2 (en) * 1994-03-18 2001-07-23 株式会社日立製作所 X-ray imaging device
GB2288961B (en) * 1994-04-22 1998-10-14 Rolls Royce Plc An apparatus and a method for inspecting a crystal
US5589690A (en) * 1995-03-21 1996-12-31 National Institute Of Standards And Technology Apparatus and method for monitoring casting process
SE505925C2 (en) * 1996-09-25 1997-10-27 Ragnar Kullenberg Method and apparatus for detecting and analyzing X-rays
US6269144B1 (en) * 1998-03-04 2001-07-31 William P. Dube Method and apparatus for diffraction measurement using a scanning x-ray source
GB0312499D0 (en) * 2003-05-31 2003-07-09 Council Cent Lab Res Councils Tomographic energy dispersive diffraction imaging system
CN1864062B (en) * 2003-08-04 2011-11-02 X射线光学系统公司 In-situ x-ray diffraction system using sources and detectors at fixed angular positions
RU2242748C1 (en) * 2003-08-19 2004-12-20 Общество с ограниченной ответственностью "Институт рентгеновской оптики" Detecting assembly for x-ray diffraction measurements
US7881437B2 (en) * 2006-07-11 2011-02-01 Morpho Detection, Inc. Systems and methods for developing a primary collimator
WO2008097345A2 (en) * 2006-08-10 2008-08-14 X-Ray Optical Systems, Inc. Wide parallel beam diffraction imaging method and system
KR20130087843A (en) * 2012-01-30 2013-08-07 한국전자통신연구원 X-ray control unit using monocrystalline material
DE102017223228B3 (en) 2017-12-19 2018-12-27 Bruker Axs Gmbh Setup for spatially resolved measurement with a wavelength-dispersive X-ray spectrometer

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE488126A (en) * 1948-03-27
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness
SE327573B (en) * 1967-03-13 1970-08-24 Incentive Res & Dev Ab
GB1272333A (en) * 1968-06-22 1972-04-26 Philips Electronic Associated Apparatus for determining the crystallographic directions of a single crystal by means of a beam of x-rays

Also Published As

Publication number Publication date
CS176429B1 (en) 1977-06-30
HU166083B (en) 1975-01-28
DD103727A1 (en) 1974-02-05
NL7301024A (en) 1973-07-31
AT346629B (en) 1978-11-27
DE2304119B2 (en) 1976-08-12
GB1414572A (en) 1975-11-19
US3833810A (en) 1974-09-03
DE2304119A1 (en) 1973-08-02
FR2169617A5 (en) 1973-09-07

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Legal Events

Date Code Title Description
ELJ Ceased due to non-payment of the annual fee
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee