NL7217759A - - Google Patents

Info

Publication number
NL7217759A
NL7217759A NL7217759A NL7217759A NL7217759A NL 7217759 A NL7217759 A NL 7217759A NL 7217759 A NL7217759 A NL 7217759A NL 7217759 A NL7217759 A NL 7217759A NL 7217759 A NL7217759 A NL 7217759A
Authority
NL
Netherlands
Application number
NL7217759A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL7217759A publication Critical patent/NL7217759A/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
    • H01J3/02Electron guns
    • H01J3/021Electron guns using a field emission, photo emission, or secondary emission electron source
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/20Selection of substances for gas fillings; Means for obtaining or maintaining the desired pressure within the tube, e.g. by gettering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
  • Lasers (AREA)
  • Luminescent Compositions (AREA)
NL7217759A 1971-12-29 1972-12-28 NL7217759A (en:Method)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7147290A FR2166539A5 (en:Method) 1971-12-29 1971-12-29

Publications (1)

Publication Number Publication Date
NL7217759A true NL7217759A (en:Method) 1973-07-03

Family

ID=9088303

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7217759A NL7217759A (en:Method) 1971-12-29 1972-12-28

Country Status (23)

Country Link
US (1) US3857038A (en:Method)
JP (1) JPS4881585A (en:Method)
AR (1) AR193002A1 (en:Method)
AT (1) AT346434B (en:Method)
AU (1) AU467584B2 (en:Method)
BE (1) BE793443A (en:Method)
BR (1) BR7209161D0 (en:Method)
CA (1) CA994480A (en:Method)
CH (1) CH569362A5 (en:Method)
CS (1) CS174866B2 (en:Method)
DD (1) DD102860A5 (en:Method)
DE (1) DE2264191A1 (en:Method)
ES (1) ES410109A1 (en:Method)
FR (1) FR2166539A5 (en:Method)
GB (1) GB1409309A (en:Method)
HK (1) HK14077A (en:Method)
IL (1) IL41186A (en:Method)
IT (1) IT972979B (en:Method)
LU (1) LU66756A1 (en:Method)
NL (1) NL7217759A (en:Method)
NO (1) NO139394C (en:Method)
OA (1) OA04232A (en:Method)
ZA (1) ZA729131B (en:Method)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CS268377B1 (en) * 1988-04-08 1990-03-14 Emil Ing Vratnicek Electron gun for electron microscope

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2521656A (en) * 1945-12-13 1950-09-05 Emilio G Segre Ionization chamber
US3118064A (en) * 1961-08-30 1964-01-14 Frank H Attix New type of free air ionization chamber
FR1369414A (fr) * 1963-06-11 1964-08-14 Commissariat Energie Atomique Procédé et dispositif de déclenchement d'un détecteur à gaz permettant la localisation de particules nucléaires
US3601612A (en) * 1969-08-22 1971-08-24 Atomic Energy Commission Wire spark chamber with magnetostrictive readout
US3681600A (en) * 1969-10-24 1972-08-01 Perkin Elmer Corp Retarding field electron spectrometer

Also Published As

Publication number Publication date
NO139394C (no) 1979-02-28
JPS4881585A (en:Method) 1973-10-31
ES410109A1 (es) 1975-12-16
IT972979B (it) 1974-05-31
ZA729131B (en) 1973-11-28
BR7209161D0 (pt) 1973-09-25
DE2264191A1 (de) 1973-07-05
GB1409309A (en) 1975-10-08
AT346434B (de) 1978-11-10
CA994480A (fr) 1976-08-03
US3857038A (en) 1974-12-24
NO139394B (no) 1978-11-20
FR2166539A5 (en:Method) 1973-08-17
OA04232A (fr) 1979-12-31
CS174866B2 (en:Method) 1977-04-29
AU467584B2 (en) 1974-07-04
DD102860A5 (en:Method) 1973-12-20
CH569362A5 (en:Method) 1975-11-14
IL41186A (en) 1976-04-30
HK14077A (en) 1977-04-01
AU5055772A (en) 1974-07-04
BE793443A (fr) 1973-04-16
AR193002A1 (es) 1973-03-21
LU66756A1 (en:Method) 1973-02-27
ATA1116072A (de) 1978-03-15
IL41186A0 (en) 1973-02-28

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Legal Events

Date Code Title Description
BV The patent application has lapsed