NL7009428A - - Google Patents
Info
- Publication number
- NL7009428A NL7009428A NL7009428A NL7009428A NL7009428A NL 7009428 A NL7009428 A NL 7009428A NL 7009428 A NL7009428 A NL 7009428A NL 7009428 A NL7009428 A NL 7009428A NL 7009428 A NL7009428 A NL 7009428A
- Authority
- NL
- Netherlands
- Prior art keywords
- intersections
- columns
- matrix
- subjected
- column
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/83—Masking faults in memories by using spares or by reconfiguring using programmable devices with reduced power consumption
- G11C29/832—Masking faults in memories by using spares or by reconfiguring using programmable devices with reduced power consumption with disconnection of faulty elements
Landscapes
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
- Read Only Memory (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR6921528A FR2045239A5 (xx) | 1969-06-26 | 1969-06-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL7009428A true NL7009428A (xx) | 1970-12-29 |
Family
ID=9036439
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7009428A NL7009428A (xx) | 1969-06-26 | 1970-06-26 |
Country Status (6)
Country | Link |
---|---|
US (1) | US3707767A (xx) |
BE (1) | BE752638A (xx) |
DE (1) | DE2031769A1 (xx) |
FR (1) | FR2045239A5 (xx) |
GB (1) | GB1302959A (xx) |
NL (1) | NL7009428A (xx) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3981070A (en) * | 1973-04-05 | 1976-09-21 | Amdahl Corporation | LSI chip construction and method |
US4368523A (en) * | 1979-12-20 | 1983-01-11 | Tokyo Shibaura Denki Kabushiki Kaisha | Liquid crystal display device having redundant pairs of address buses |
FR2554622B1 (fr) * | 1983-11-03 | 1988-01-15 | Commissariat Energie Atomique | Procede de fabrication d'une matrice de composants electroniques |
US4703436A (en) * | 1984-02-01 | 1987-10-27 | Inova Microelectronics Corporation | Wafer level integration technique |
US4666252A (en) * | 1984-06-29 | 1987-05-19 | Energy Conversion Devices, Inc. | High yield liquid crystal display and method of making same |
US4820222A (en) * | 1986-12-31 | 1989-04-11 | Alphasil, Inc. | Method of manufacturing flat panel backplanes including improved testing and yields thereof and displays made thereby |
US5206583A (en) * | 1991-08-20 | 1993-04-27 | International Business Machines Corporation | Latch assisted fuse testing for customized integrated circuits |
US6323534B1 (en) | 1999-04-16 | 2001-11-27 | Micron Technology, Inc. | Fuse for use in a semiconductor device |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2994121A (en) * | 1958-11-21 | 1961-08-01 | Shockley William | Method of making a semiconductive switching array |
US2982002A (en) * | 1959-03-06 | 1961-05-02 | Shockley William | Fabrication of semiconductor elements |
-
1969
- 1969-06-26 FR FR6921528A patent/FR2045239A5/fr not_active Expired
-
1970
- 1970-06-26 NL NL7009428A patent/NL7009428A/xx unknown
- 1970-06-26 DE DE19702031769 patent/DE2031769A1/de active Pending
- 1970-06-26 GB GB3123370A patent/GB1302959A/en not_active Expired
- 1970-06-26 US US00050285A patent/US3707767A/en not_active Expired - Lifetime
- 1970-06-29 BE BE752638D patent/BE752638A/xx unknown
Also Published As
Publication number | Publication date |
---|---|
US3707767A (en) | 1973-01-02 |
FR2045239A5 (xx) | 1971-02-26 |
GB1302959A (xx) | 1973-01-10 |
BE752638A (fr) | 1970-12-29 |
DE2031769A1 (de) | 1971-01-07 |
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