NL7001078A - - Google Patents
Info
- Publication number
- NL7001078A NL7001078A NL7001078A NL7001078A NL7001078A NL 7001078 A NL7001078 A NL 7001078A NL 7001078 A NL7001078 A NL 7001078A NL 7001078 A NL7001078 A NL 7001078A NL 7001078 A NL7001078 A NL 7001078A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CS51169 | 1969-01-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL7001078A true NL7001078A (de) | 1970-07-29 |
Family
ID=5337305
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL7001078A NL7001078A (de) | 1969-01-27 | 1970-01-26 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3701899A (de) |
| DE (1) | DE2002939C3 (de) |
| FR (1) | FR2029496A1 (de) |
| GB (1) | GB1249795A (de) |
| NL (1) | NL7001078A (de) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE428974B (sv) * | 1979-02-07 | 1983-08-01 | Nils Johannes Baecklund | Sett att medelst rontgenstralning meta halten av ett forutbestemt emne i ett prov |
| US4815116A (en) * | 1981-09-17 | 1989-03-21 | Process Automation Business, Inc. | Method and apparatus for x-ray analysis of rapidly moving multicomponent materials |
| US5778041A (en) * | 1983-10-13 | 1998-07-07 | Honeywell-Measurex Corporation | System and process for measuring ash in paper |
| US4980901A (en) * | 1988-09-09 | 1990-12-25 | The Titan Corporation | Apparatus for and methods of detecting common explosive materials |
| JPH05240808A (ja) * | 1992-02-29 | 1993-09-21 | Horiba Ltd | 蛍光ｘ線定量方法 |
| JPH0917364A (ja) * | 1995-06-27 | 1997-01-17 | Shimadzu Corp | Ｘ線回折装置 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2745019A (en) * | 1952-10-08 | 1956-05-08 | Philips Corp | X-ray intensity measuring system |
| US3114832A (en) * | 1960-07-28 | 1963-12-17 | Radiation Counter Lab Inc | X-ray spectroscopic system comprising plural sources, filters, fluorescent radiators, and comparative detectors |
| US3146347A (en) * | 1961-08-25 | 1964-08-25 | Lab For Electronics Inc | Apparatus for analyzing material by excited x-rays |
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1970
- 1970-01-22 GB GB3250/70A patent/GB1249795A/en not_active Expired
- 1970-01-22 US US4978A patent/US3701899A/en not_active Expired - Lifetime
- 1970-01-23 DE DE2002939A patent/DE2002939C3/de not_active Expired
- 1970-01-26 NL NL7001078A patent/NL7001078A/xx unknown
- 1970-01-27 FR FR7002844A patent/FR2029496A1/fr not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| US3701899A (en) | 1972-10-31 |
| DE2002939B2 (de) | 1974-11-21 |
| DE2002939C3 (de) | 1975-07-03 |
| DE2002939A1 (de) | 1970-08-06 |
| FR2029496A1 (de) | 1970-10-23 |
| GB1249795A (en) | 1971-10-13 |