FR2029496A1 - - Google Patents

Info

Publication number
FR2029496A1
FR2029496A1 FR7002844A FR7002844A FR2029496A1 FR 2029496 A1 FR2029496 A1 FR 2029496A1 FR 7002844 A FR7002844 A FR 7002844A FR 7002844 A FR7002844 A FR 7002844A FR 2029496 A1 FR2029496 A1 FR 2029496A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7002844A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHIRANA MODRANY NP
Original Assignee
CHIRANA MODRANY NP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHIRANA MODRANY NP filed Critical CHIRANA MODRANY NP
Publication of FR2029496A1 publication Critical patent/FR2029496A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7002844A 1969-01-27 1970-01-27 Withdrawn FR2029496A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS51169 1969-01-27

Publications (1)

Publication Number Publication Date
FR2029496A1 true FR2029496A1 (de) 1970-10-23

Family

ID=5337305

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7002844A Withdrawn FR2029496A1 (de) 1969-01-27 1970-01-27

Country Status (5)

Country Link
US (1) US3701899A (de)
DE (1) DE2002939C3 (de)
FR (1) FR2029496A1 (de)
GB (1) GB1249795A (de)
NL (1) NL7001078A (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE428974B (sv) * 1979-02-07 1983-08-01 Nils Johannes Baecklund Sett att medelst rontgenstralning meta halten av ett forutbestemt emne i ett prov
US4815116A (en) * 1981-09-17 1989-03-21 Process Automation Business, Inc. Method and apparatus for x-ray analysis of rapidly moving multicomponent materials
US5778041A (en) * 1983-10-13 1998-07-07 Honeywell-Measurex Corporation System and process for measuring ash in paper
US4980901A (en) * 1988-09-09 1990-12-25 The Titan Corporation Apparatus for and methods of detecting common explosive materials
JPH05240808A (ja) * 1992-02-29 1993-09-21 Horiba Ltd 蛍光ｘ線定量方法
JPH0917364A (ja) * 1995-06-27 1997-01-17 Shimadzu Corp Ｘ線回折装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2745019A (en) * 1952-10-08 1956-05-08 Philips Corp X-ray intensity measuring system
US3114832A (en) * 1960-07-28 1963-12-17 Radiation Counter Lab Inc X-ray spectroscopic system comprising plural sources, filters, fluorescent radiators, and comparative detectors
US3146347A (en) * 1961-08-25 1964-08-25 Lab For Electronics Inc Apparatus for analyzing material by excited x-rays

Also Published As

Publication number Publication date
US3701899A (en) 1972-10-31
DE2002939B2 (de) 1974-11-21
DE2002939C3 (de) 1975-07-03
DE2002939A1 (de) 1970-08-06
GB1249795A (en) 1971-10-13
NL7001078A (de) 1970-07-29

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Legal Events

Date Code Title Description
ST Notification of lapse