NL6801094A - - Google Patents
Info
- Publication number
- NL6801094A NL6801094A NL6801094A NL6801094A NL6801094A NL 6801094 A NL6801094 A NL 6801094A NL 6801094 A NL6801094 A NL 6801094A NL 6801094 A NL6801094 A NL 6801094A NL 6801094 A NL6801094 A NL 6801094A
- Authority
- NL
- Netherlands
- Prior art keywords
- processing unit
- test
- bistate
- line
- programme
- Prior art date
Links
- 238000012360 testing method Methods 0.000 abstract 25
- 238000009666 routine test Methods 0.000 abstract 3
- 238000001514 detection method Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 abstract 1
- 238000012423 maintenance Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 238000009877 rendering Methods 0.000 abstract 1
- 230000003252 repetitive effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q3/00—Selecting arrangements
- H04Q3/42—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker
- H04Q3/54—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised
- H04Q3/545—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised using a stored programme
- H04Q3/54575—Software application
- H04Q3/54591—Supervision, e.g. fault localisation, traffic measurements, avoiding errors, failure recovery, monitoring, statistical analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/16—Error detection or correction of the data by redundancy in hardware
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q3/00—Selecting arrangements
- H04Q3/42—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker
- H04Q3/54—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised
- H04Q3/545—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised using a stored programme
- H04Q3/54541—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised using a stored programme using multi-processor systems
- H04Q3/5455—Multi-processor, parallelism, distributed systems
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Exchange Systems With Centralized Control (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Hardware Redundancy (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
BE693071 | 1967-01-24 | ||
BE46456 | 1967-01-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL6801094A true NL6801094A (de) | 1968-07-25 |
Family
ID=25647308
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL6801094A NL6801094A (de) | 1967-01-24 | 1968-01-24 |
Country Status (8)
Country | Link |
---|---|
US (1) | US3562716A (de) |
AT (1) | AT303833B (de) |
BE (1) | BE693071A (de) |
CH (1) | CH539890A (de) |
DE (1) | DE1574598C3 (de) |
FR (1) | FR1568070A (de) |
GB (1) | GB1181184A (de) |
NL (1) | NL6801094A (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3864670A (en) * | 1970-09-30 | 1975-02-04 | Yokogawa Electric Works Ltd | Dual computer system with signal exchange system |
US3810119A (en) * | 1971-05-04 | 1974-05-07 | Us Navy | Processor synchronization scheme |
US3721961A (en) * | 1971-08-11 | 1973-03-20 | Ibm | Data processing subsystems |
FR2176279A5 (de) * | 1972-03-17 | 1973-10-26 | Materiel Telephonique | |
GB1434186A (en) * | 1972-04-26 | 1976-05-05 | Gen Electric Co Ltd | Multiprocessor computer systems |
SE358755B (de) * | 1972-06-09 | 1973-08-06 | Ericsson Telefon Ab L M | |
BE789828A (nl) * | 1972-10-09 | 1973-04-09 | Bell Telephone Mfg | Gegevensverwerkend besturingsstelsel. |
US3795901A (en) * | 1972-12-29 | 1974-03-05 | Ibm | Data processing memory system with bidirectional data bus |
US3806887A (en) * | 1973-01-02 | 1974-04-23 | Fte Automatic Electric Labor I | Access circuit for central processors of digital communication system |
US3835312A (en) * | 1973-03-15 | 1974-09-10 | Gte Automatic Electric Lab Inc | Recovery control circuit for central processor of digital communication system |
US3828321A (en) * | 1973-03-15 | 1974-08-06 | Gte Automatic Electric Lab Inc | System for reconfiguring central processor and instruction storage combinations |
US3898621A (en) * | 1973-04-06 | 1975-08-05 | Gte Automatic Electric Lab Inc | Data processor system diagnostic arrangement |
US3921141A (en) * | 1973-09-14 | 1975-11-18 | Gte Automatic Electric Lab Inc | Malfunction monitor control circuitry for central data processor of digital communication system |
US4199810A (en) * | 1977-01-07 | 1980-04-22 | Rockwell International Corporation | Radiation hardened register file |
US4181940A (en) * | 1978-02-28 | 1980-01-01 | Westinghouse Electric Corp. | Multiprocessor for providing fault isolation test upon itself |
GB2217487B (en) * | 1988-04-13 | 1992-09-23 | Yokogawa Electric Corp | Dual computer system |
US5157781A (en) * | 1990-01-02 | 1992-10-20 | Motorola, Inc. | Data processor test architecture |
CN112699031B (zh) * | 2020-12-29 | 2023-07-21 | 中国航空工业集团公司西安飞机设计研究所 | 一种分区软件架构的测试方法 |
-
1967
- 1967-01-24 BE BE693071D patent/BE693071A/xx not_active IP Right Cessation
-
1968
- 1968-01-11 GB GB0737/68A patent/GB1181184A/en not_active Expired
- 1968-01-17 US US698610A patent/US3562716A/en not_active Expired - Lifetime
- 1968-01-19 AT AT55368A patent/AT303833B/de not_active IP Right Cessation
- 1968-01-20 DE DE1574598A patent/DE1574598C3/de not_active Expired
- 1968-01-24 NL NL6801094A patent/NL6801094A/ not_active Application Discontinuation
- 1968-01-24 CH CH109468A patent/CH539890A/de not_active IP Right Cessation
- 1968-01-24 FR FR1568070D patent/FR1568070A/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
DE1574598C3 (de) | 1980-05-08 |
US3562716A (en) | 1971-02-09 |
DE1574598B2 (de) | 1979-08-30 |
AT303833B (de) | 1972-12-11 |
CH539890A (de) | 1973-09-14 |
DE1574598A1 (de) | 1971-12-30 |
GB1181184A (en) | 1970-02-11 |
BE693071A (de) | 1967-07-24 |
FR1568070A (de) | 1969-04-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
BI | The patent application has been withdrawn |