FR1568070A - - Google Patents

Info

Publication number
FR1568070A
FR1568070A FR1568070DA FR1568070A FR 1568070 A FR1568070 A FR 1568070A FR 1568070D A FR1568070D A FR 1568070DA FR 1568070 A FR1568070 A FR 1568070A
Authority
FR
France
Prior art keywords
processing unit
test
bistate
line
programme
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of FR1568070A publication Critical patent/FR1568070A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q3/00—Selecting arrangements
    • H04Q3/42—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker
    • H04Q3/54—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised
    • H04Q3/545—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised using a stored programme
    • H04Q3/54575—Software application
    • H04Q3/54591—Supervision, e.g. fault localisation, traffic measurements, avoiding errors, failure recovery, monitoring, statistical analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q3/00—Selecting arrangements
    • H04Q3/42—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker
    • H04Q3/54—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised
    • H04Q3/545—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised using a stored programme
    • H04Q3/54541—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised using a stored programme using multi-processor systems
    • H04Q3/5455—Multi-processor, parallelism, distributed systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Exchange Systems With Centralized Control (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Hardware Redundancy (AREA)
FR1568070D 1967-01-24 1968-01-24 Expired FR1568070A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
BE693071 1967-01-24
BE46456 1967-01-24

Publications (1)

Publication Number Publication Date
FR1568070A true FR1568070A (fr) 1969-04-14

Family

ID=25647308

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1568070D Expired FR1568070A (fr) 1967-01-24 1968-01-24

Country Status (8)

Country Link
US (1) US3562716A (fr)
AT (1) AT303833B (fr)
BE (1) BE693071A (fr)
CH (1) CH539890A (fr)
DE (1) DE1574598C3 (fr)
FR (1) FR1568070A (fr)
GB (1) GB1181184A (fr)
NL (1) NL6801094A (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3864670A (en) * 1970-09-30 1975-02-04 Yokogawa Electric Works Ltd Dual computer system with signal exchange system
US3810119A (en) * 1971-05-04 1974-05-07 Us Navy Processor synchronization scheme
US3721961A (en) * 1971-08-11 1973-03-20 Ibm Data processing subsystems
FR2176279A5 (fr) * 1972-03-17 1973-10-26 Materiel Telephonique
GB1434186A (en) * 1972-04-26 1976-05-05 Gen Electric Co Ltd Multiprocessor computer systems
SE358755B (fr) * 1972-06-09 1973-08-06 Ericsson Telefon Ab L M
BE789828A (nl) * 1972-10-09 1973-04-09 Bell Telephone Mfg Gegevensverwerkend besturingsstelsel.
US3795901A (en) * 1972-12-29 1974-03-05 Ibm Data processing memory system with bidirectional data bus
US3806887A (en) * 1973-01-02 1974-04-23 Fte Automatic Electric Labor I Access circuit for central processors of digital communication system
US3828321A (en) * 1973-03-15 1974-08-06 Gte Automatic Electric Lab Inc System for reconfiguring central processor and instruction storage combinations
US3835312A (en) * 1973-03-15 1974-09-10 Gte Automatic Electric Lab Inc Recovery control circuit for central processor of digital communication system
US3898621A (en) * 1973-04-06 1975-08-05 Gte Automatic Electric Lab Inc Data processor system diagnostic arrangement
US3921141A (en) * 1973-09-14 1975-11-18 Gte Automatic Electric Lab Inc Malfunction monitor control circuitry for central data processor of digital communication system
US4199810A (en) * 1977-01-07 1980-04-22 Rockwell International Corporation Radiation hardened register file
US4181940A (en) * 1978-02-28 1980-01-01 Westinghouse Electric Corp. Multiprocessor for providing fault isolation test upon itself
GB2217487B (en) * 1988-04-13 1992-09-23 Yokogawa Electric Corp Dual computer system
US5157781A (en) * 1990-01-02 1992-10-20 Motorola, Inc. Data processor test architecture
CN112699031B (zh) * 2020-12-29 2023-07-21 中国航空工业集团公司西安飞机设计研究所 一种分区软件架构的测试方法

Also Published As

Publication number Publication date
BE693071A (fr) 1967-07-24
DE1574598C3 (de) 1980-05-08
CH539890A (de) 1973-09-14
DE1574598B2 (de) 1979-08-30
GB1181184A (en) 1970-02-11
US3562716A (en) 1971-02-09
NL6801094A (fr) 1968-07-25
DE1574598A1 (de) 1971-12-30
AT303833B (de) 1972-12-11

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Legal Events

Date Code Title Description
ST Notification of lapse