NL6615788A - - Google Patents

Info

Publication number
NL6615788A
NL6615788A NL6615788A NL6615788A NL6615788A NL 6615788 A NL6615788 A NL 6615788A NL 6615788 A NL6615788 A NL 6615788A NL 6615788 A NL6615788 A NL 6615788A NL 6615788 A NL6615788 A NL 6615788A
Authority
NL
Netherlands
Application number
NL6615788A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to DE19661598625 priority Critical patent/DE1598625A1/de
Priority to FR81515A priority patent/FR1500538A/fr
Priority to BE689298D priority patent/BE689298A/xx
Application filed filed Critical
Priority to NL6615788A priority patent/NL6615788A/xx
Priority to GB1916267A priority patent/GB1193874A/en
Publication of NL6615788A publication Critical patent/NL6615788A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL6615788A 1966-05-10 1966-11-09 NL6615788A (enrdf_load_stackoverflow)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE19661598625 DE1598625A1 (de) 1966-05-10 1966-05-10 Anordnung zur automatischen Roentgenfluoreszenzanalyse
FR81515A FR1500538A (fr) 1966-05-10 1966-10-25 Dispositif pour l'analyse automatique par fluorescence aux rayons x
BE689298D BE689298A (enrdf_load_stackoverflow) 1966-05-10 1966-11-04
NL6615788A NL6615788A (enrdf_load_stackoverflow) 1966-05-10 1966-11-09
GB1916267A GB1193874A (en) 1966-05-10 1967-05-26 X-Ray Fluorescence Analyzers

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DEJ0030790 1966-05-10
BE689298 1966-11-04
NL6615788A NL6615788A (enrdf_load_stackoverflow) 1966-05-10 1966-11-09
GB1916267A GB1193874A (en) 1966-05-10 1967-05-26 X-Ray Fluorescence Analyzers

Publications (1)

Publication Number Publication Date
NL6615788A true NL6615788A (enrdf_load_stackoverflow) 1968-05-10

Family

ID=27424866

Family Applications (1)

Application Number Title Priority Date Filing Date
NL6615788A NL6615788A (enrdf_load_stackoverflow) 1966-05-10 1966-11-09

Country Status (4)

Country Link
BE (1) BE689298A (enrdf_load_stackoverflow)
DE (1) DE1598625A1 (enrdf_load_stackoverflow)
GB (1) GB1193874A (enrdf_load_stackoverflow)
NL (1) NL6615788A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4226179A1 (de) * 1992-08-07 1994-02-10 Amtec Analysenmestechnik Gmbh Verfahren zur Korrektur lang- und kurzzeitiger Veränderungen der Betriebsparameter bei der Schichtanalyse mittels RFA
DE102012021484B3 (de) * 2012-11-05 2013-10-17 Franz Brenk Gmbh & Co. Kg Verwendung eines Kalibrierstandards in einem Röntgenfluoreszenz-Analysegerät

Also Published As

Publication number Publication date
GB1193874A (en) 1970-06-03
BE689298A (enrdf_load_stackoverflow) 1967-05-05
DE1598625A1 (de) 1972-01-05

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