NL279098A - - Google Patents

Info

Publication number
NL279098A
NL279098A NL279098DA NL279098A NL 279098 A NL279098 A NL 279098A NL 279098D A NL279098D A NL 279098DA NL 279098 A NL279098 A NL 279098A
Authority
NL
Netherlands
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL279098A publication Critical patent/NL279098A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Geophysics And Detection Of Objects (AREA)
NL279098D 1961-05-31 NL279098A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DEL39107A DE1154656B (de) 1961-05-31 1961-05-31 Photoelektrische Oberflaechenabtastvorrichtung laufender Bahnen

Publications (1)

Publication Number Publication Date
NL279098A true NL279098A (fr)

Family

ID=7268531

Family Applications (1)

Application Number Title Priority Date Filing Date
NL279098D NL279098A (fr) 1961-05-31

Country Status (4)

Country Link
US (1) US3198951A (fr)
DE (1) DE1154656B (fr)
GB (1) GB1003014A (fr)
NL (1) NL279098A (fr)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3317738A (en) * 1963-12-12 1967-05-02 Licentia Gmbh Photoelectric scanning arrangement using light conducting rod with fluorescent portion
US3345835A (en) * 1964-12-11 1967-10-10 Appalachian Electronic Instr Retro-reflective stop motion system
US3385971A (en) * 1965-08-06 1968-05-28 Appalachian Electric Instr Inc Radiation sensitive fabric flaw detecting systems
DE1547447B1 (de) * 1967-01-05 1970-09-24 Sick Erwin Spiegelrad-Abtastanordnung
US3517202A (en) * 1967-11-14 1970-06-23 Us Navy Rotating-mirror optical scanning system with optical path length compensation
US3510664A (en) * 1968-01-08 1970-05-05 Gaf Corp Automatic laser beam scanning film flaw detector
US3521074A (en) * 1968-04-19 1970-07-21 Mandrel Industries Defect detector with rotating scanner
US3584963A (en) * 1968-12-27 1971-06-15 Rca Corp Optical flaw detector
US3646353A (en) * 1970-10-19 1972-02-29 Eastman Kodak Co Flying spot scanner blanking
GB1389444A (en) * 1971-03-09 1975-04-03 Sira Institute Apparatus for automatic inspection of materials
JPS482793U (fr) * 1971-05-20 1973-01-13
GB1366369A (en) * 1971-11-30 1974-09-11 Ferranti Ltd Detection of faults on surfaces
DE2245058A1 (de) * 1972-09-14 1974-03-21 Sick Optik Elektronik Erwin Photoelektrische oberflaechenabtastvorrichtung
DE2256736C3 (de) * 1972-11-18 1979-01-25 Ibm Deutschland Gmbh, 7000 Stuttgart Meßanordnung zur automatischen Prüfung der Oberflächenbeschaffenheit und Ebenheit einer Werkstückoberfläche
JPS5074987U (fr) * 1973-11-07 1975-06-30
DE2433682C3 (de) * 1974-07-12 1979-02-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur Überwachung einer Materialbahn oder einer sonstigen Abtastebene
JPS5127183U (fr) * 1974-08-20 1976-02-27
JPS51126191A (en) * 1975-04-25 1976-11-04 Central Glass Co Ltd Optical method to inspect a surface condition of a glass plate
DE2524152A1 (de) * 1975-05-30 1976-12-16 Philips Patentverwaltung Lichtstrahlablenkspiegelsystem zum abtasten von grossformatigen unterlagen
US4021031A (en) * 1975-12-08 1977-05-03 Butler Automatic, Inc. Web alignment system
DE2611539C3 (de) * 1976-03-18 1982-09-09 Agfa-Gevaert Ag, 5090 Leverkusen Verfahren zum Erkennen und Orten von sich in Längsrichtung einer laufenden Materialbahn erstreckenden Fehlern
US4203672A (en) * 1976-11-18 1980-05-20 E. I. Du Pont De Nemours And Company Scanning beam displacement compensation control system
GB1585919A (en) * 1977-08-11 1981-03-11 Ti Fords Ltd Bottle inspection apparatus
JPS5483854A (en) * 1977-12-16 1979-07-04 Canon Inc Measuring device
DE2800351B2 (de) * 1978-01-04 1979-11-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn
DE2827705C3 (de) * 1978-06-23 1981-07-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Gerät zur Feststellung von Fehlern an Bahnmaterial
DE2827704C3 (de) * 1978-06-23 1981-03-19 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung der Lichtaustrittswinkel
US4323311A (en) * 1979-05-11 1982-04-06 Sira Institute Limited Apparatus and method for detecting holes in sheet material
JPS6055809B2 (ja) * 1979-11-26 1985-12-06 大日本スクリ−ン製造株式会社 光走査方法
DE3013549C2 (de) * 1980-04-09 1984-06-14 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Anordnung zur Signalauswertung bei einem Lochsuchgerät
JPS58200214A (ja) * 1982-05-19 1983-11-21 Hitachi Ltd 走査光学系
DE3404407C1 (de) * 1984-02-08 1985-08-22 Mergenthaler Linotype Gmbh, 6236 Eschborn Optisch-mechanischer Ablenker
DE3408106A1 (de) * 1984-03-05 1985-09-12 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optischer rauheits-scanner
DE3447869C1 (de) * 1984-12-31 1986-04-10 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Fadenrissueberwachungsvorrichtung
US4723659A (en) * 1985-06-28 1988-02-09 Supernova Systems, Inc. Apparatus for detecting impurities in translucent bodies
DE3539536C1 (de) * 1985-11-07 1987-06-19 Sick Optik Elektronik Erwin Optische Fadenrissueberwachungsvorrichtung fuer Tuftingmaschinen
DE3636192C1 (de) * 1986-10-24 1988-02-18 Erhardt & Leimer Gmbh Vorrichtung zur Erfassung des Abbildes von Oberflaechenbereichen laufender Warenbahnen
DE3644124A1 (de) * 1986-12-23 1988-07-07 Linotype Gmbh Optisch-mechanischer ablenker
DE3706347A1 (de) * 1987-02-27 1988-09-08 Fraunhofer Ges Forschung Laserinterferometer zur interferometrischen laengenmessung
DE3800543A1 (de) * 1988-01-12 1989-07-20 Feldmuehle Ag Vorrichtung zum pruefen von sich mit hoher geschwindigkeit bewegenden bahnfoermigen flaechengebilden
CN104568949B (zh) * 2014-12-23 2018-02-23 宁波亚洲浆纸业有限公司 一种纸板爆墨程度的定量检测方法及其装置
EP3309508B1 (fr) * 2016-05-23 2019-08-28 Nippon Steel Corporation Dispositif de mesure de forme et procédé de mesure de forme

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2393631A (en) * 1940-11-27 1946-01-29 Ilford Ltd Testing of photographic films, plates, and papers
US2719235A (en) * 1954-04-08 1955-09-27 Eastman Kodak Co Continuous inspection by optical scanning
US2812447A (en) * 1956-05-18 1957-11-05 Ca Nat Research Council Flaw detector for continuous sheet material
US2961547A (en) * 1957-04-16 1960-11-22 Benjamin L Snavely Scanning trace converter
DE1771763U (de) * 1958-06-21 1958-08-07 Max Grundig Geraet zur linienweisen abtastung mit einer halbzylinderlinse.
US3026415A (en) * 1958-10-20 1962-03-20 Eastman Kodak Co Flaw detector for continuous web
NL130064C (fr) * 1959-12-22

Also Published As

Publication number Publication date
DE1154656B (de) 1963-09-19
GB1003014A (en) 1965-09-02
US3198951A (en) 1965-08-03

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