NL193737B - Dispersieve röntgenstraleninrichting. - Google Patents
Dispersieve röntgenstraleninrichting.Info
- Publication number
- NL193737B NL193737B NL8601781A NL8601781A NL193737B NL 193737 B NL193737 B NL 193737B NL 8601781 A NL8601781 A NL 8601781A NL 8601781 A NL8601781 A NL 8601781A NL 193737 B NL193737 B NL 193737B
- Authority
- NL
- Netherlands
- Prior art keywords
- dispersive
- ray device
- ray
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
- G21K1/062—Devices having a multilayer structure
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/061—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements characterised by a multilayer structure
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Optical Elements Other Than Lenses (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/752,929 US4675889A (en) | 1985-07-08 | 1985-07-08 | Multiple wavelength X-ray dispersive devices and method of making the devices |
US75292985 | 1985-07-08 |
Publications (3)
Publication Number | Publication Date |
---|---|
NL8601781A NL8601781A (nl) | 1987-02-02 |
NL193737B true NL193737B (nl) | 2000-04-03 |
NL193737C NL193737C (nl) | 2000-08-04 |
Family
ID=25028469
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL8601781A NL193737C (nl) | 1985-07-08 | 1986-07-08 | Dispersieve röntgenstraleninrichting. |
Country Status (6)
Country | Link |
---|---|
US (1) | US4675889A (nl) |
JP (1) | JPS6214043A (nl) |
CA (1) | CA1243135A (nl) |
DE (1) | DE3622432A1 (nl) |
GB (1) | GB2177580A (nl) |
NL (1) | NL193737C (nl) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4969175A (en) * | 1986-08-15 | 1990-11-06 | Nelson Robert S | Apparatus for narrow bandwidth and multiple energy x-ray imaging |
US4958363A (en) * | 1986-08-15 | 1990-09-18 | Nelson Robert S | Apparatus for narrow bandwidth and multiple energy x-ray imaging |
US4786128A (en) * | 1986-12-02 | 1988-11-22 | Quantum Diagnostics, Ltd. | Device for modulating and reflecting electromagnetic radiation employing electro-optic layer having a variable index of refraction |
DE3702804C2 (de) * | 1987-01-28 | 1994-03-10 | Bradaczek Hans Prof Dr | Vorrichtung zur Divergenzänderung von Röntgen- oder Neutronenstrahlenbündeln |
US4915463A (en) * | 1988-10-18 | 1990-04-10 | The United States Of America As Represented By The Department Of Energy | Multilayer diffraction grating |
JPH02210299A (ja) * | 1989-02-10 | 1990-08-21 | Olympus Optical Co Ltd | X線用光学系及びそれに用いる多層膜反射鏡 |
JP2634661B2 (ja) * | 1989-02-10 | 1997-07-30 | オリンパス光学工業株式会社 | X線用多層膜反射鏡 |
DE4015275C2 (de) * | 1990-05-12 | 1994-07-21 | Geesthacht Gkss Forschung | Anordnung mit beschichtetem Spiegel zur Untersuchung von Proben nach der Methode der Röntgenfluoreszenzanalyse |
US5082621A (en) * | 1990-07-31 | 1992-01-21 | Ovonic Synthetic Materials Company, Inc. | Neutron reflecting supermirror structure |
US5086443A (en) * | 1990-08-03 | 1992-02-04 | The United States Of America As Represented By The United States Department Of Energy | Background-reducing x-ray multilayer mirror |
US5164975A (en) * | 1991-06-13 | 1992-11-17 | The United States Of America As Represented By The United States Department Of Energy | Multiple wavelength X-ray monochromators |
FR2679064A1 (fr) * | 1991-07-10 | 1993-01-15 | Philips Electronique Lab | Dispositif a neutrons incluant un miroir multicouches. |
FR2681720A1 (fr) * | 1991-09-25 | 1993-03-26 | Philips Electronique Lab | Dispositif incluant un miroir fonctionnant dans le domaine des rayons x ou des neutrons. |
AU3124193A (en) * | 1991-11-04 | 1993-06-07 | Multilayer Optics And X-Ray Technology, Inc. | Device and method for reflection and dispersion of x-rays |
US5458084A (en) * | 1992-04-16 | 1995-10-17 | Moxtek, Inc. | X-ray wave diffraction optics constructed by atomic layer epitaxy |
JP2906118B2 (ja) * | 1995-01-19 | 1999-06-14 | 理化学研究所 | 軟x線光学素子用多層膜構造 |
US5757882A (en) * | 1995-12-18 | 1998-05-26 | Osmic, Inc. | Steerable x-ray optical system |
DE19844300C2 (de) * | 1998-09-17 | 2002-07-18 | Hahn Meitner Inst Berlin Gmbh | Neutronenoptisches Bauelement |
US6389100B1 (en) | 1999-04-09 | 2002-05-14 | Osmic, Inc. | X-ray lens system |
US6421417B1 (en) | 1999-08-02 | 2002-07-16 | Osmic, Inc. | Multilayer optics with adjustable working wavelength |
US6787773B1 (en) | 2000-06-07 | 2004-09-07 | Kla-Tencor Corporation | Film thickness measurement using electron-beam induced x-ray microanalysis |
US6870896B2 (en) | 2000-12-28 | 2005-03-22 | Osmic, Inc. | Dark-field phase contrast imaging |
US6804324B2 (en) * | 2001-03-01 | 2004-10-12 | Osmo, Inc. | X-ray phase contrast imaging using a fabry-perot interferometer concept |
NL1018139C2 (nl) * | 2001-05-23 | 2002-11-26 | Stichting Fund Ond Material | Meerlagenspiegel voor straling in het XUV-golflengtegebied en werkwijze voor de vervaardiging daarvan. |
US6510200B1 (en) | 2001-06-29 | 2003-01-21 | Osmic, Inc. | Multi-layer structure with variable bandpass for monochromatization and spectroscopy |
DE10134266C2 (de) * | 2001-07-18 | 2003-09-18 | Geesthacht Gkss Forschung | Einrichtung und Verfahren zur Analyse atomarer und/oder molekularer Elemente mittels wellenlängendispersiver, röntgenspektrometrischer Einrichtungen |
US6801596B2 (en) | 2001-10-01 | 2004-10-05 | Kla-Tencor Technologies Corporation | Methods and apparatus for void characterization |
US6664541B2 (en) | 2001-10-01 | 2003-12-16 | Kla Tencor Technologies Corporation | Methods and apparatus for defect localization |
US6643353B2 (en) | 2002-01-10 | 2003-11-04 | Osmic, Inc. | Protective layer for multilayers exposed to x-rays |
US6810105B2 (en) * | 2002-01-25 | 2004-10-26 | Kla-Tencor Technologies Corporation | Methods and apparatus for dishing and erosion characterization |
JP2003255089A (ja) * | 2002-03-05 | 2003-09-10 | Rigaku Industrial Co | X線分光素子およびそれを用いた蛍光x線分析装置 |
US7597852B2 (en) * | 2004-09-03 | 2009-10-06 | Symyx Solutions, Inc. | Substrate for sample analyses |
JP5315251B2 (ja) * | 2006-11-16 | 2013-10-16 | エックス−レイ オプティカル システムズ インコーポレーテッド | それぞれの結晶方位を持つ多層を有するx線集束光学系及びこの光学系を形成する方法 |
US7848483B2 (en) * | 2008-03-07 | 2010-12-07 | Rigaku Innovative Technologies | Magnesium silicide-based multilayer x-ray fluorescence analyzers |
CN102525492A (zh) * | 2010-12-31 | 2012-07-04 | 上海西门子医疗器械有限公司 | 一种x射线能谱选择装置 |
KR101332502B1 (ko) * | 2011-06-14 | 2013-11-26 | 전남대학교산학협력단 | 국부적 방사선 치료용 x―선 바늘 모듈 |
FR2984584A1 (fr) * | 2011-12-20 | 2013-06-21 | Commissariat Energie Atomique | Dispositif de filtrage des rayons x |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3397312A (en) * | 1964-08-15 | 1968-08-13 | Hitachi Ltd | Laminated X-ray analyzing crystal wherein the respective laminations have different lattice spacings |
US4261771A (en) * | 1979-10-31 | 1981-04-14 | Bell Telephone Laboratories, Incorporated | Method of fabricating periodic monolayer semiconductor structures by molecular beam epitaxy |
JPS5734050U (nl) * | 1980-07-30 | 1982-02-23 | ||
US4429411A (en) * | 1981-04-20 | 1984-01-31 | The United States Of America As Represented By The United States Department Of Energy | Instrument and method for focusing X-rays, gamma rays and neutrons |
CA1238988A (en) * | 1983-06-06 | 1988-07-05 | Stanford R. Ovshinsky | X-ray dispersive and reflective structures and method of making the structures |
US4693933A (en) * | 1983-06-06 | 1987-09-15 | Ovonic Synthetic Materials Company, Inc. | X-ray dispersive and reflective structures and method of making the structures |
JPS6076368A (ja) * | 1983-10-04 | 1985-04-30 | Fuji Xerox Co Ltd | 転写型感熱記録装置 |
-
1985
- 1985-07-08 US US06/752,929 patent/US4675889A/en not_active Expired - Lifetime
-
1986
- 1986-06-20 CA CA000512141A patent/CA1243135A/en not_active Expired
- 1986-06-23 GB GB08615250A patent/GB2177580A/en not_active Withdrawn
- 1986-07-03 DE DE19863622432 patent/DE3622432A1/de not_active Ceased
- 1986-07-08 NL NL8601781A patent/NL193737C/nl not_active IP Right Cessation
- 1986-07-08 JP JP61160685A patent/JPS6214043A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPS6214043A (ja) | 1987-01-22 |
GB2177580A (en) | 1987-01-21 |
CA1243135A (en) | 1988-10-11 |
GB8615250D0 (en) | 1986-07-30 |
NL8601781A (nl) | 1987-02-02 |
US4675889A (en) | 1987-06-23 |
DE3622432A1 (de) | 1987-01-08 |
NL193737C (nl) | 2000-08-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
CNR | Transfer of rights (patent application after its laying open for public inspection) |
Free format text: OVONIC SYNTHETIC MATERIALS COMPANY, INC. |
|
BA | A request for search or an international-type search has been filed | ||
BB | A search report has been drawn up | ||
BC | A request for examination has been filed | ||
V4 | Discontinued because of reaching the maximum lifetime of a patent |
Effective date: 20060708 |