MY184556A - Device for testing electronic components - Google Patents

Device for testing electronic components

Info

Publication number
MY184556A
MY184556A MYPI2014000567A MYPI2014000567A MY184556A MY 184556 A MY184556 A MY 184556A MY PI2014000567 A MYPI2014000567 A MY PI2014000567A MY PI2014000567 A MYPI2014000567 A MY PI2014000567A MY 184556 A MY184556 A MY 184556A
Authority
MY
Malaysia
Prior art keywords
test
electronic components
test base
testing electronic
contact
Prior art date
Application number
MYPI2014000567A
Other languages
English (en)
Inventor
Gerald Staniszewski
Manuel Petermann
Gerhard Gschwendtberger
Original Assignee
Multitest Elektronische Systeme Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=51188864&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=MY184556(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Multitest Elektronische Systeme Gmbh filed Critical Multitest Elektronische Systeme Gmbh
Publication of MY184556A publication Critical patent/MY184556A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
MYPI2014000567A 2013-03-01 2014-02-27 Device for testing electronic components MY184556A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102013203536.5A DE102013203536B4 (de) 2013-03-01 2013-03-01 Vorrichtung zum Prüfen von elektronischen Bauteilen

Publications (1)

Publication Number Publication Date
MY184556A true MY184556A (en) 2021-04-02

Family

ID=51188864

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2014000567A MY184556A (en) 2013-03-01 2014-02-27 Device for testing electronic components

Country Status (4)

Country Link
CN (1) CN103941115B (de)
DE (1) DE102013203536B4 (de)
MY (1) MY184556A (de)
SG (1) SG10201400225TA (de)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1069955A (ja) * 1996-08-28 1998-03-10 Fujitsu Ltd Ｉｃソケット及びこれを用いた試験方法及びｉｃソケットの実装機構
EP0915344B1 (de) * 1997-11-05 2004-02-25 Feinmetall GmbH Prüfkopf für Mikrostrukturen mit Schnittstelle
JPH11233216A (ja) * 1998-02-16 1999-08-27 Nippon Denki Factory Engineering Kk テスト用ｉｃソケット
CN2522868Y (zh) * 2001-12-19 2002-11-27 及成企业股份有限公司 电子元件检测装置
JP4002935B2 (ja) * 2003-06-05 2007-11-07 株式会社アドバンテスト デバイスインターフェース装置
US20050159050A1 (en) * 2003-06-05 2005-07-21 Hiroyuki Hama Device interface apparatus
TWI235836B (en) * 2004-03-05 2005-07-11 Asustek Comp Inc Testing apparatus and testing method for testing whether electronic device connecting correctly with circuit board
DE102008004800A1 (de) * 2007-02-08 2008-08-14 Feinmetall Gmbh Elektrische Prüfeinrichtung zur Prüfung von elektrischen Prüflingen
DE102008034918B4 (de) * 2008-07-26 2012-09-27 Feinmetall Gmbh Elektrische Prüfeinrichtung für die Prüfung eines elektrischen Prüflings sowie elektrisches Prüfverfahren

Also Published As

Publication number Publication date
CN103941115A (zh) 2014-07-23
SG10201400225TA (en) 2014-10-30
CN103941115B (zh) 2017-06-13
DE102013203536B4 (de) 2016-03-31
DE102013203536A1 (de) 2014-09-18

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