MY184556A - Device for testing electronic components - Google Patents
Device for testing electronic componentsInfo
- Publication number
- MY184556A MY184556A MYPI2014000567A MYPI2014000567A MY184556A MY 184556 A MY184556 A MY 184556A MY PI2014000567 A MYPI2014000567 A MY PI2014000567A MY PI2014000567 A MYPI2014000567 A MY PI2014000567A MY 184556 A MY184556 A MY 184556A
- Authority
- MY
- Malaysia
- Prior art keywords
- test
- electronic components
- test base
- testing electronic
- contact
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
Abstract
The invention proceeds from a device for testing electronic components, comprising at least one test base (13) for contacting the electronic components (17) and comprising a test head, which is coupled electrically to the test base (13). In accordance with the invention, in order to forward signals between the? test base (13) and test head, an adapter board (1) is provided, which, on its side facing the test base (13), has contact areas (2) which are adapted to the position of contacts of the test base (13), and, on its side facing away from the test base (13), is provided with contact sockets (4) which are adapted to the position of contact pins (10) of the test head or an intermediate board (6), the contact areas (2) each being electrically conductively connected to corresponding contact sockets (4). ( Figure 2 )
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102013203536.5A DE102013203536B4 (en) | 2013-03-01 | 2013-03-01 | Device for testing electronic components |
Publications (1)
Publication Number | Publication Date |
---|---|
MY184556A true MY184556A (en) | 2021-04-02 |
Family
ID=51188864
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MYPI2014000567A MY184556A (en) | 2013-03-01 | 2014-02-27 | Device for testing electronic components |
Country Status (4)
Country | Link |
---|---|
CN (1) | CN103941115B (en) |
DE (1) | DE102013203536B4 (en) |
MY (1) | MY184556A (en) |
SG (1) | SG10201400225TA (en) |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1069955A (en) * | 1996-08-28 | 1998-03-10 | Fujitsu Ltd | Ic socket, and testing method using it, and mounting mechanism of the socket |
ATE260470T1 (en) * | 1997-11-05 | 2004-03-15 | Feinmetall Gmbh | TEST HEAD FOR MICROSTRUCTURES WITH INTERFACE |
JPH11233216A (en) * | 1998-02-16 | 1999-08-27 | Nippon Denki Factory Engineering Kk | Ic socket for test |
CN2522868Y (en) * | 2001-12-19 | 2002-11-27 | 及成企业股份有限公司 | Electronic element detection apparatus |
US20050159050A1 (en) * | 2003-06-05 | 2005-07-21 | Hiroyuki Hama | Device interface apparatus |
DE112004000029T5 (en) * | 2003-06-05 | 2005-07-28 | Advantest Corp. | Component connection device |
TWI235836B (en) * | 2004-03-05 | 2005-07-11 | Asustek Comp Inc | Testing apparatus and testing method for testing whether electronic device connecting correctly with circuit board |
DE102008004800A1 (en) * | 2007-02-08 | 2008-08-14 | Feinmetall Gmbh | Electrical testing device for testing electrical specimens |
DE102008034918B4 (en) * | 2008-07-26 | 2012-09-27 | Feinmetall Gmbh | Electrical test equipment for testing an electrical device under test and electrical test method |
-
2013
- 2013-03-01 DE DE102013203536.5A patent/DE102013203536B4/en active Active
-
2014
- 2014-02-26 SG SG10201400225TA patent/SG10201400225TA/en unknown
- 2014-02-27 MY MYPI2014000567A patent/MY184556A/en unknown
- 2014-03-03 CN CN201410075123.1A patent/CN103941115B/en active Active
Also Published As
Publication number | Publication date |
---|---|
DE102013203536B4 (en) | 2016-03-31 |
SG10201400225TA (en) | 2014-10-30 |
DE102013203536A1 (en) | 2014-09-18 |
CN103941115A (en) | 2014-07-23 |
CN103941115B (en) | 2017-06-13 |
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