MY169301A - Adhesive composition for masking tape used in molded underfill process and masking tape using the same - Google Patents

Adhesive composition for masking tape used in molded underfill process and masking tape using the same

Info

Publication number
MY169301A
MY169301A MYPI2013000782A MYPI2013000782A MY169301A MY 169301 A MY169301 A MY 169301A MY PI2013000782 A MYPI2013000782 A MY PI2013000782A MY PI2013000782 A MYPI2013000782 A MY PI2013000782A MY 169301 A MY169301 A MY 169301A
Authority
MY
Malaysia
Prior art keywords
masking tape
adhesive composition
energy
underfill process
molded underfill
Prior art date
Application number
MYPI2013000782A
Inventor
Jeon Kyong-Yeon
Choi Sung-Hwan
Kim Sung-Jin
Kim Yeon-Soo
Original Assignee
Toray Advanced Mat Korea Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020120139062A external-priority patent/KR101392441B1/en
Application filed by Toray Advanced Mat Korea Inc filed Critical Toray Advanced Mat Korea Inc
Publication of MY169301A publication Critical patent/MY169301A/en

Links

Landscapes

  • Adhesive Tapes (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Laminated Bodies (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

Adhesive composition for a masking tape used in a molded underfill process and a masking tape using the adhesive composition, and more particularly, adhesive composition capable of reducing trapped voids due to epoxy molding compound (EMC) flow imbalance in a molded underfill process, and consequently reducing the frequency of occurrence of errors, such as void swelling, which are related to package reliability. The masking tape is ensured with a superior film compression rate by a substrate film that exhibits a high elongation at a molding temperature so that a pressure around a vent region which may have effects on void trapping can be maintained at a high level, thereby reducing void occurrence The adhesive composition includes (a) acrylic copolymer, (b) thermosetting resin, (c) energy-ray curable urethane resin, (d) energy-ray curable silicone resin, (e) energy-ray initiator, and (f) chemical particles.
MYPI2013000782A 2012-09-21 2013-03-07 Adhesive composition for masking tape used in molded underfill process and masking tape using the same MY169301A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20120105331 2012-09-21
KR1020120139062A KR101392441B1 (en) 2012-09-21 2012-12-03 Adhesive composition for masking tape of mold underfill process and masking tape using the same

Publications (1)

Publication Number Publication Date
MY169301A true MY169301A (en) 2019-03-21

Family

ID=50618901

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2013000782A MY169301A (en) 2012-09-21 2013-03-07 Adhesive composition for masking tape used in molded underfill process and masking tape using the same

Country Status (2)

Country Link
JP (1) JP5942321B2 (en)
MY (1) MY169301A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6520055B2 (en) * 2014-11-06 2019-05-29 日立化成株式会社 Semiconductor compression molding release sheet and semiconductor package molded using the same
JP6117858B2 (en) * 2015-06-16 2017-04-19 三菱樹脂株式会社 Laminated film
CN109476960A (en) * 2016-07-28 2019-03-15 日东电工株式会社 Enhancing film with isolation film
JP6819721B2 (en) * 2019-04-26 2021-01-27 昭和電工マテリアルズ株式会社 Release sheet for semiconductor compression molding and semiconductor package molded using this
JP7052891B2 (en) * 2021-01-04 2022-04-12 昭和電工マテリアルズ株式会社 Release sheet for semiconductor compression molding and semiconductor package molded using this
CN114106743B (en) * 2021-11-01 2022-12-20 苏州润邦半导体材料科技有限公司 Low-moisture-permeability liquid crystal frame sealing adhesive and preparation method thereof

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2709035B2 (en) * 1994-12-28 1998-02-04 日東電工株式会社 Semiconductor package manufacturing method
JP3779601B2 (en) * 2001-11-28 2006-05-31 株式会社巴川製紙所 Mask sheet for semiconductor device assembly
JP2004200467A (en) * 2002-12-19 2004-07-15 Hitachi Chem Co Ltd Release sheet for semiconductor mould
JP2005166904A (en) * 2003-12-02 2005-06-23 Hitachi Chem Co Ltd Mold releasing sheet for semiconductor mold
JP2008227475A (en) * 2007-02-14 2008-09-25 Toray Ind Inc Release sheet for semiconductor sealing, and its production process
KR100910672B1 (en) * 2007-08-03 2009-08-04 도레이새한 주식회사 Heat-resistant adhesive sheet
KR101075192B1 (en) * 2009-03-03 2011-10-21 도레이첨단소재 주식회사 Adhesive tape for manufacturing electronic component
JP2011009425A (en) * 2009-06-25 2011-01-13 Sumitomo Bakelite Co Ltd Method for manufacturing semiconductor element and method for manufacturing semiconductor device
JP5471730B2 (en) * 2010-03-31 2014-04-16 大日本印刷株式会社 Decorative sheet
KR101194544B1 (en) * 2011-01-20 2012-10-25 도레이첨단소재 주식회사 Adhesive masking tape for die exposed flip-chip package defcp molded underfill muf

Also Published As

Publication number Publication date
JP2014063971A (en) 2014-04-10
JP5942321B2 (en) 2016-06-29

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