MY130885A - Method for storing carrier for polishing wafer - Google Patents

Method for storing carrier for polishing wafer

Info

Publication number
MY130885A
MY130885A MYPI99005694A MYPI9905694A MY130885A MY 130885 A MY130885 A MY 130885A MY PI99005694 A MYPI99005694 A MY PI99005694A MY PI9905694 A MYPI9905694 A MY PI9905694A MY 130885 A MY130885 A MY 130885A
Authority
MY
Malaysia
Prior art keywords
carrier
polishing wafer
polishing
storing carrier
silicon wafer
Prior art date
Application number
MYPI99005694A
Other languages
English (en)
Inventor
Masaaki Ikeda
Ichiro Yoshimura
Original Assignee
Memc Electronic Materials
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Memc Electronic Materials filed Critical Memc Electronic Materials
Publication of MY130885A publication Critical patent/MY130885A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • B24B37/345Feeding, loading or unloading work specially adapted to lapping
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Prevention Of Fouling (AREA)
MYPI99005694A 1998-12-24 1999-12-23 Method for storing carrier for polishing wafer MY130885A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP36687398A JP2000190208A (ja) 1998-12-24 1998-12-24 研磨用キャリアーの保管方法

Publications (1)

Publication Number Publication Date
MY130885A true MY130885A (en) 2007-07-31

Family

ID=18487905

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI99005694A MY130885A (en) 1998-12-24 1999-12-23 Method for storing carrier for polishing wafer

Country Status (7)

Country Link
EP (1) EP1142003A1 (ja)
JP (1) JP2000190208A (ja)
KR (1) KR20010080964A (ja)
CN (1) CN1331838A (ja)
MY (1) MY130885A (ja)
TW (1) TW439137B (ja)
WO (1) WO2000039841A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10060697B4 (de) 2000-12-07 2005-10-06 Siltronic Ag Doppelseiten-Polierverfahren mit reduzierter Kratzerrate und Vorrichtung zur Durchführung des Verfahrens
CN101797717B (zh) * 2009-02-10 2011-12-07 和舰科技(苏州)有限公司 侦测化学机械研磨机台水槽上/下位置的装置及方法
JP6977657B2 (ja) * 2018-05-08 2021-12-08 信越半導体株式会社 両面研磨装置用キャリアの保管方法及びウェーハの両面研磨方法
JP7349352B2 (ja) * 2019-12-27 2023-09-22 グローバルウェーハズ・ジャパン株式会社 シリコンウェーハの研磨方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06226618A (ja) * 1993-01-27 1994-08-16 Hitachi Cable Ltd 半導体ウエハの研磨方法
US5520205A (en) * 1994-07-01 1996-05-28 Texas Instruments Incorporated Apparatus for wafer cleaning with rotation
JP2832171B2 (ja) * 1995-04-28 1998-12-02 信越半導体株式会社 半導体基板の洗浄装置および洗浄方法
US6045624A (en) * 1996-09-27 2000-04-04 Tokyo Electron Limited Apparatus for and method of cleaning objects to be processed

Also Published As

Publication number Publication date
KR20010080964A (ko) 2001-08-25
EP1142003A1 (en) 2001-10-10
JP2000190208A (ja) 2000-07-11
CN1331838A (zh) 2002-01-16
TW439137B (en) 2001-06-07
WO2000039841A1 (en) 2000-07-06

Similar Documents

Publication Publication Date Title
DE69405342T2 (de) Poliervorrichtung für Halbleiterscheibe
MY130639A (en) Method of rough polishing semiconductor wafers to reduce surface roughness
IL134213A (en) Polishing composition including an inhibitor of tungsten etching
DE69813374D1 (de) Halbleiterscheibe Poliervorrichtung mit Halterring
EP0637065A3 (en) Mechanical-chemical planarization of flat grooves on semiconductor substrates.
TW349244B (en) Method of fabricating a semiconductor device using a CMP process and a polishing apparatus for such a CMP process
MY119075A (en) Colloidal silica slurry for nip plated disk polishing
MY112147A (en) Process and apparatus for etching semiconductor wafers
MY132376A (en) Fluoride additive containing chemical mechanical polishing slurry and method for use of same
MY115263A (en) Use of deuterated materials in semiconductor processing
TW332902B (en) A device for an anti-corrosion remove solution
MY116349A (en) Semiconductor wafer polishing apparatus and method
TW334631B (en) Semiconductor IC apparatus
EP1602444A3 (en) Polishing method
GB9623266D0 (en) Semiconductor fabrication with contact processing for wrap-around flange interface
DE69203795D1 (de) Nichtwässriges, flüssiges, phosphatfreies und Enzyme enthaltendes Maschinengeschirrspülmittel.
DE59803338D1 (de) Pufferlösungen für suspensionen, verwendbar zum chemisch-mechanischen polieren
MY118577A (en) Apparatus for polishing wafers
ID16828A (id) Alat untuk pelayanan basah lapisan-lapisan bawah
MY130885A (en) Method for storing carrier for polishing wafer
MY133452A (en) Polishing method for wafer and holding plate
EP1034082A4 (en) METHOD FOR MINIMIZING THE CRITICAL GROWTH GROWTH FROM STRUCTURES TO SEMICONDUCTOR LETTERS
BG103017A (en) Liquid crystal compositions
EP0641742A4 (en) PURE WATER PRODUCTION METHOD, DEVICE FOR IT AND CLEANING METHOD.
EP0887846A3 (en) Method of reducing the formation of watermarks on semiconductor wafers