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JPS5221460B1
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1977-06-10 |
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1973-03-27 |
1978-09-07 |
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SE400581B
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1974-12-13 |
1978-04-03 |
Nordnero Ab |
Bad for kemisk polering av koppar och dess legeringar
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1980-10-29 |
1982-06-29 |
Sprague Electric Company |
Nodular copper removal from aluminum foil surfaces
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1981-04-06 |
1982-10-09 |
Metsuku Kk |
Exfoliating solution for tin or tin alloy
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1985-10-28 |
1990-07-31 |
International Business Machines Corporation |
Chem-mech polishing method for producing coplanar metal/insulator films on a substrate
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1985-10-28 |
1987-06-09 |
International Business Machines Corporation |
Method for removing protuberances at the surface of a semiconductor wafer using a chem-mech polishing technique
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1986-11-20 |
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Rem Chemicals, Inc. |
Composition and method for metal surface refinement
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1988-06-03 |
1993-07-13 |
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Method for preventing agglomeration of colloidal silica and silicon wafer polishing composition using the same
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1988-10-28 |
1990-03-20 |
International Business Machines Corporation |
Wafer flood polishing
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1989-03-07 |
1992-01-28 |
International Business Machines Corporation |
Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor
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1989-03-07 |
1990-09-04 |
International Business Machines Corporation |
Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor
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1989-06-09 |
1993-07-27 |
Nalco Chemical Company |
Low sodium, low metals silica polishing slurries
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1991-04-11 |
1992-10-13 |
Dow Corning Corporation |
Polish containing amine functional siloxane
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1991-11-07 |
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Dow Corning Corporation |
Polish containing derivatized amine functional organosilicon compounds
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1991-12-20 |
1993-06-24 |
Wacker Chemie Gmbh |
Pflegemittel fuer harte oberflaechen
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1992-05-11 |
1993-11-02 |
Dow Corning Corporation |
Polish containing silylated derivatives of organic amines and epoxides
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1992-06-04 |
1993-07-06 |
Micron Technology, Inc. |
Method of chemical mechanical polishing predominantly copper containing metal layers in semiconductor processing
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1992-12-11 |
1996-07-30 |
Micron Technology Inc. |
IC mechanical planarization process incorporating two slurry compositions for faster material removal times
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1993-04-05 |
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1993-04-28 |
1996-11-19 |
Fujimi Incorporated |
Polishing composition
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1993-05-26 |
1995-02-21 |
Rodel, Inc. |
Compositions and methods for polishing
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1993-06-30 |
1995-04-18 |
Intel Corporation |
Chemical mechanical polishing slurry delivery and mixing system
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1993-07-16 |
1996-01-23 |
The United States Of America As Represented By The United States Department Of Energy |
Removal of field and embedded metal by spin spray etching
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1996-11-19 |
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Copper-based metal polishing solution and method for manufacturing semiconductor device
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1994-07-12 |
2003-04-14 |
株式会社東芝 |
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1994-07-27 |
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1994-10-06 |
1996-06-18 |
Cabot Corporation |
Chemical mechanical polishing slurry for metal layers
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1994-12-12 |
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1995-03-30 |
1997-06-10 |
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Systems for performing chemical mechanical planarization and process for conducting same
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1995-04-28 |
2000-12-14 |
Minnesota Mining And Mfg. Co., Saint Paul |
Schleifgegenstand mit einem bindungssystem umfassend ein polysiloxan
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1995-05-17 |
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Method of using additives with silica-based slurries to enhance selectivity in metal CMP
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1995-09-22 |
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1995-11-07 |
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Method of chemically mechanically polishing an electronic component using a non-selective ammonium persulfate slurry
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1995-11-10 |
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Tokuyama Corp., Tokuya |
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1995-11-20 |
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1996-05-10 |
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Cabot Corporation |
Chemical mechanical polishing slurry for metal layers and films
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1996-09-24 |
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Multi-oxidizer precursor for chemical mechanical polishing
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Cabot Corporation |
Multi-oxidizer slurry for chemical mechanical polishing
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Composition and slurry useful for metal CMP
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Chemical mechanical polishing slurry useful for copper substrates
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Chemical mechanical polishing slurry useful for copper substrates
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Method for providing a clear surface finish on glass
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Slurry comprising a ligand or chelating agent for polishing a surface
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1998-06-26 |
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Chemical mechanical polishing slurry useful for copper/tantalum substrate
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Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies
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The United States Of America As Represented By The Secretary Of The Navy |
Polishing of copper
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1999-07-07 |
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CMP composition containing silane modified abrasive particles
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1999-09-06 |
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半導体装置の製造に用いる化学機械研磨用水系分散体
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Lam Research Corp. |
Method and system for detecting an exposure of a material on a semiconductor wafer during chemical-mechanical polishing
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2000-06-29 |
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Lsi Logic Corporation |
Apparatus and method for planarizing the surface of a semiconductor wafer
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Micron Technology, Inc. |
Slurry for use in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods
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