MX357090B - Determinacion absoluta, no destructiva del espesor o de la profundidad en materiales dielectricos. - Google Patents

Determinacion absoluta, no destructiva del espesor o de la profundidad en materiales dielectricos.

Info

Publication number
MX357090B
MX357090B MX2016003448A MX2016003448A MX357090B MX 357090 B MX357090 B MX 357090B MX 2016003448 A MX2016003448 A MX 2016003448A MX 2016003448 A MX2016003448 A MX 2016003448A MX 357090 B MX357090 B MX 357090B
Authority
MX
Mexico
Prior art keywords
thickness
depth
sinusoidal
dielectric materials
nondestructive
Prior art date
Application number
MX2016003448A
Other languages
English (en)
Other versions
MX2016003448A (es
Inventor
R Jr Little Jack
Original Assignee
Evisive Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Evisive Inc filed Critical Evisive Inc
Publication of MX2016003448A publication Critical patent/MX2016003448A/es
Publication of MX357090B publication Critical patent/MX357090B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

Se describe la medición mejorada del espesor en materiales dieléctricos a granel; la radiación de microondas se refleja parcialmente en interfaces en donde cambia la constante dieléctrica (por ejemplo, la pared de fondo de una parte); las microondas reflejadas se combinan con una porción del haz de salida en cada uno de por lo menos los dos detectores separados; resulta un par de ondas sinusoidales o cuasi-sinusoidales; la medición del espesor o profundidad se mejora al explotar las relaciones de fase y amplitud entre las múltiples ondas estacionarias sinusoidales o cuasi-sinusoidales en los detectores que comparten una fuente de microondas común; estas relaciones se utilizan para determinar una relación no ambigua entre la señal y el espesor o profundidad.
MX2016003448A 2013-09-25 2014-09-22 Determinacion absoluta, no destructiva del espesor o de la profundidad en materiales dielectricos. MX357090B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361882288P 2013-09-25 2013-09-25
PCT/US2014/056730 WO2015047931A1 (en) 2013-09-25 2014-09-22 Nondestructive, absolute determination of thickness of or depth in dielectric materials

Publications (2)

Publication Number Publication Date
MX2016003448A MX2016003448A (es) 2016-10-28
MX357090B true MX357090B (es) 2018-06-25

Family

ID=52744373

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016003448A MX357090B (es) 2013-09-25 2014-09-22 Determinacion absoluta, no destructiva del espesor o de la profundidad en materiales dielectricos.

Country Status (10)

Country Link
US (1) US9989359B2 (es)
EP (1) EP3049796B1 (es)
JP (1) JP6392331B2 (es)
AU (2) AU2014327105B2 (es)
CA (1) CA2962411C (es)
MX (1) MX357090B (es)
MY (1) MY185399A (es)
SG (1) SG11201602177PA (es)
TW (1) TWI653428B (es)
WO (1) WO2015047931A1 (es)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10203202B2 (en) * 2014-04-07 2019-02-12 John Weber Schultz Non-contact determination of coating thickness
US9797703B2 (en) 2016-03-07 2017-10-24 Duke University Non-invasive thickness measurement using resonant frequency shift
TWI571947B (zh) * 2016-04-19 2017-02-21 Calculation method of wafer thickness measurement
WO2018156121A1 (en) * 2017-02-22 2018-08-30 Halliburton Energy Services, Inc. Incremental time lapse detection of corrosion in well casings
EP3598113B1 (en) * 2017-03-17 2022-06-22 National Institute of Advanced Industrial Science and Technology Non-destructive detection method, non-destructive detection devices, and non-destructive detection program
US11060841B2 (en) 2017-06-05 2021-07-13 Duke University Non-invasive thickness measurement using fixed frequency
US10794841B2 (en) * 2018-05-07 2020-10-06 Infineon Technologies Ag Composite material structure monitoring system
CN111239166A (zh) * 2020-03-25 2020-06-05 嘉兴市特种设备检验检测院 碳纤维缠绕复合材料气瓶缺陷的微波检测方法
RU201679U1 (ru) * 2020-08-12 2020-12-28 федеральное государственное бюджетное образовательное учреждение высшего образования "Ульяновский государственный технический университет" Устройство для диагностики и контроля радиоволновым методом полимерных композиционных материалов
US20230012228A1 (en) * 2021-04-23 2023-01-12 Southwest Research Institute Detection of Corrosion Under Paint and Other Coatings Using Microwave Reflectometry

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2299982A (en) 1942-02-13 1942-10-27 Bernard M Harrison Adjustable sleeve
BE564022A (es) 1957-01-16
BE563869A (es) 1957-01-25
US3025463A (en) 1957-11-22 1962-03-13 Eino J Luoma Apparatus for measurement of complex reflection coefficient
US3271668A (en) 1962-08-23 1966-09-06 Giannini Controls Corp Microwave measurement of surface attrition of a dielectric body
US3278841A (en) 1963-06-27 1966-10-11 United Aircraft Corp Microwave flaw detection system
JPS5263387A (en) 1975-11-20 1977-05-25 Agency Of Ind Science & Technol Measurement of optical anisotropy of dielectric materials using microw aves
US4123703A (en) 1977-09-02 1978-10-31 Sri International Microwave method of and apparatus for flaw detection
SE8000410L (sv) * 1979-01-20 1980-07-21 Lambda Ind Science Ltd Sprickdetektor
US4274288A (en) 1979-07-23 1981-06-23 Rockwell International Corporation Method for measuring the depth of surface flaws
DE3135263C2 (de) 1981-09-05 1986-11-06 ELEKTRO-PHYSIK Hans Nix & Dr.-Ing. E. Steingroever GmbH & Co KG, 5000 Köln Verfahren und Vorrichtung zum zerstörungsfreien Messen von Werkstoffanhäufungen oder Schichtdicken an folienartigen dielektrischen Werkstoffen, insbesondere Kunststoff
US4470123A (en) 1982-01-05 1984-09-04 Miami R & D Limited Partnership Microwave ice accretion meter
DE3220815C2 (de) 1982-06-03 1985-02-28 Ransburg-Gema AG, St.Gallen Druckregelvorrichtung für gasförmige und flüssige Strömungsmittel
US4514680A (en) 1983-01-28 1985-04-30 A.Ahlstrom Osakeyhtio Flaw detection system using microwaves
US4707652A (en) 1983-11-30 1987-11-17 Philip Morris Incorporated Impurity detector measuring parallel polarized scattered electromagnetic radiation
US4581574A (en) 1984-02-21 1986-04-08 The Boeing Company Method of testing dielectric materials
JPS61274209A (ja) 1985-05-30 1986-12-04 Furuno Electric Co Ltd コンクリ−ト欠損等の検出装置
IT1201375B (it) 1985-11-08 1989-01-27 Consiglio Nazionale Ricerche Metodo ed apparato per la determinazione della costante dielettrica di materiali e sua applicazione per la determinazione del tasso di carbone incombusto presente nelle ceneri di un combustore
SU1350570A1 (ru) 1986-02-07 1987-11-07 Калининградский государственный университет Датчик дл контрол толщины полимерной пленки
US5216372A (en) 1991-07-29 1993-06-01 Colorado State University Research Foundation Microwave steel belt location sensor for tires
US5384543A (en) 1992-11-09 1995-01-24 Martin Marietta Energy Systems, Inc. Portable microwave instrument for non-destructive evaluation of structural characteristics
US5393557A (en) 1992-12-17 1995-02-28 Northrop Grumman Corporation Method for measuring electromagnetic properties
US5539322A (en) 1994-09-20 1996-07-23 Wave Metric, Inc. Calibrated microwave dielectric coating thickness gauge
AU6888996A (en) 1995-09-11 1997-04-01 Yissum Research Development Company Of The Hebrew University Of Jerusalem Near-field resistivity microscope
US6359446B1 (en) 1997-09-25 2002-03-19 Jack R. Little, Jr. Apparatus and method for nondestructive testing of dielectric materials
US6172510B1 (en) 1998-12-30 2001-01-09 The United Sates Of America As Represented By The Secretary Of The Navy System for detection of flaws by use of microwave radiation
JP2007528585A (ja) * 2003-06-13 2007-10-11 株式会社荏原製作所 測定装置
US7149050B2 (en) * 2003-10-20 2006-12-12 Quantum Corporation Diffractive position sensors and control systems
JP2005157601A (ja) * 2003-11-25 2005-06-16 Canon Inc 電磁波による積層状物体計数装置及び計数方法
EP1779123A4 (en) 2004-08-05 2007-11-21 Jack R Little Jr IMAGING, NON DESTRUCTIVE HIGH RESOLUTION OF DIELECTRIC MATERIALS
US7190177B2 (en) 2004-08-18 2007-03-13 The Curators Of The University Of Missouri Method and apparatus for nondestructive sample inspection
JP5373534B2 (ja) * 2009-10-07 2013-12-18 三井造船株式会社 位相差測定方法及び位相差測定装置
JP5246801B2 (ja) * 2009-12-01 2013-07-24 八光オートメーション株式会社 シート状物の枚数検査装置
US8077827B2 (en) 2010-02-23 2011-12-13 Test Research, Inc. Method for thickness calibration and measuring thickness of material

Also Published As

Publication number Publication date
TWI653428B (zh) 2019-03-11
AU2014327105A1 (en) 2016-05-12
TW201518681A (zh) 2015-05-16
CA2962411C (en) 2022-07-19
NZ718193A (en) 2020-09-25
JP2016532091A (ja) 2016-10-13
AU2016100570A4 (en) 2016-06-09
JP6392331B2 (ja) 2018-09-19
MX2016003448A (es) 2016-10-28
EP3049796A4 (en) 2017-03-01
WO2015047931A1 (en) 2015-04-02
SG11201602177PA (en) 2016-04-28
EP3049796A1 (en) 2016-08-03
US9989359B2 (en) 2018-06-05
US20160298957A1 (en) 2016-10-13
MY185399A (en) 2021-05-17
EP3049796B1 (en) 2019-03-13
CA2962411A1 (en) 2015-04-02
AU2014327105B2 (en) 2018-10-18

Similar Documents

Publication Publication Date Title
MY185399A (en) Nondestructive, absolute determination of thickness or depth in dielectric materials
ATE445851T1 (de) Mehrfrequenz-durch-die-wand-bewegungsdetektion und entfernungsmessung mit einer auf differenzen basierenden schätztechnik
IL278660B (en) Metrology of critical optical dimensions
WO2015069342A3 (en) Explosive material detection
GB2543184A (en) Acoustic calipering and analysis of annulus materials
CA2820568A1 (en) Dual differential doppler motion detection
EP2843437A3 (en) Direction of arrival determination for a radio signal
BR112018004920A2 (pt) sistema e método implementado com um aparelho receptor
江舸 et al. 0.14 THz radar imaging based Radar Cross Section measurement
JP6655829B2 (ja) 水分計
JP2014219208A (ja) 水分計測装置
Ermak et al. The phase detectors based on AD8302 for millimeter wave heterodyne interferometer
RU2011132764A (ru) Устройство для измерения эффективной площади рассеяния крупногабартных объектов
Czaja Application of modeling of electromagnetic field and GPR measurements in investigations of antique tenement
张福丹 Virtual radiation source of a spotlight SAR based on frequency diverse array
RU2573627C1 (ru) Бесконтактное радиоволновое устройство для измерения толщины диэлектрических материалов
Wu et al. High precision laser ranging by combining phase method and multi-cycle pulse method
Sedov et al. Methods for processing experimental data in microwave diagnostics of shock waves and detonation
Woodward et al. Microwave Inspection of Fiber Reinforced Plastic Products for Absolute Thickness and Remaining Wall
Sorokin et al. Determination algorithm of underlying surfaces border position by pulse altimeter signals
Mester et al. Custom modular electromagnetic induction system for shallow electrical conductivity measurements
Galushko et al. a Portable HF Receiving Complex for Freguency-And Sounding of the Ionosphere
RU2008114987A (ru) Устройство радиотехнического контроля источников радиоизлучений
RU2413180C1 (ru) Устройство для измерения толщины диэлектрического покрытия
RU2020130241A (ru) Способ оперативного измерения частоты и пеленга источника СВЧ-излучения с предварительным преобразованием частоты

Legal Events

Date Code Title Description
FG Grant or registration