SG11201602177PA - Nondestructive, absolute determination of thickness of or depth in dielectric materials - Google Patents
Nondestructive, absolute determination of thickness of or depth in dielectric materialsInfo
- Publication number
- SG11201602177PA SG11201602177PA SG11201602177PA SG11201602177PA SG11201602177PA SG 11201602177P A SG11201602177P A SG 11201602177PA SG 11201602177P A SG11201602177P A SG 11201602177PA SG 11201602177P A SG11201602177P A SG 11201602177PA SG 11201602177P A SG11201602177P A SG 11201602177PA
- Authority
- SG
- Singapore
- Prior art keywords
- nondestructive
- depth
- thickness
- dielectric materials
- absolute determination
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
- G01N22/02—Investigating the presence of flaws
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361882288P | 2013-09-25 | 2013-09-25 | |
| PCT/US2014/056730 WO2015047931A1 (en) | 2013-09-25 | 2014-09-22 | Nondestructive, absolute determination of thickness of or depth in dielectric materials |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG11201602177PA true SG11201602177PA (en) | 2016-04-28 |
Family
ID=52744373
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11201602177PA SG11201602177PA (en) | 2013-09-25 | 2014-09-22 | Nondestructive, absolute determination of thickness of or depth in dielectric materials |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US9989359B2 (en) |
| EP (1) | EP3049796B1 (en) |
| JP (1) | JP6392331B2 (en) |
| AU (2) | AU2014327105B2 (en) |
| CA (1) | CA2962411C (en) |
| MX (1) | MX357090B (en) |
| MY (1) | MY185399A (en) |
| SG (1) | SG11201602177PA (en) |
| TW (1) | TWI653428B (en) |
| WO (1) | WO2015047931A1 (en) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10203202B2 (en) * | 2014-04-07 | 2019-02-12 | John Weber Schultz | Non-contact determination of coating thickness |
| US9797703B2 (en) | 2016-03-07 | 2017-10-24 | Duke University | Non-invasive thickness measurement using resonant frequency shift |
| TWI571947B (en) * | 2016-04-19 | 2017-02-21 | Calculation method of wafer thickness measurement | |
| GB2573430A (en) * | 2017-02-22 | 2019-11-06 | Halliburton Energy Services Inc | Incremental time lapse detection of corrosion in well casings |
| JP6868302B2 (en) * | 2017-03-17 | 2021-05-12 | 国立研究開発法人産業技術総合研究所 | Non-destructive detection method, non-destructive detection device and non-destructive detection program |
| CN111433556A (en) | 2017-06-05 | 2020-07-17 | 杜克大学 | Non-invasive thickness measurement using fixed frequency |
| US10794841B2 (en) * | 2018-05-07 | 2020-10-06 | Infineon Technologies Ag | Composite material structure monitoring system |
| CN111239166A (en) * | 2020-03-25 | 2020-06-05 | 嘉兴市特种设备检验检测院 | Microwave detection method for defects of carbon fiber wound composite gas cylinder |
| RU201679U1 (en) * | 2020-08-12 | 2020-12-28 | федеральное государственное бюджетное образовательное учреждение высшего образования "Ульяновский государственный технический университет" | DEVICE FOR DIAGNOSTICS AND CONTROL BY RADIO WAVE METHOD OF POLYMERIC COMPOSITE MATERIALS |
| US20230012228A1 (en) * | 2021-04-23 | 2023-01-12 | Southwest Research Institute | Detection of Corrosion Under Paint and Other Coatings Using Microwave Reflectometry |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2299982A (en) | 1942-02-13 | 1942-10-27 | Bernard M Harrison | Adjustable sleeve |
| BE564022A (en) | 1957-01-16 | |||
| BE563869A (en) | 1957-01-25 | |||
| US3025463A (en) | 1957-11-22 | 1962-03-13 | Eino J Luoma | Apparatus for measurement of complex reflection coefficient |
| US3271668A (en) | 1962-08-23 | 1966-09-06 | Giannini Controls Corp | Microwave measurement of surface attrition of a dielectric body |
| US3278841A (en) | 1963-06-27 | 1966-10-11 | United Aircraft Corp | Microwave flaw detection system |
| JPS5263387A (en) | 1975-11-20 | 1977-05-25 | Agency Of Ind Science & Technol | Measurement of optical anisotropy of dielectric materials using microw aves |
| US4123703A (en) | 1977-09-02 | 1978-10-31 | Sri International | Microwave method of and apparatus for flaw detection |
| SE8000410L (en) * | 1979-01-20 | 1980-07-21 | Lambda Ind Science Ltd | flaw detector |
| US4274288A (en) | 1979-07-23 | 1981-06-23 | Rockwell International Corporation | Method for measuring the depth of surface flaws |
| DE3135263C2 (en) | 1981-09-05 | 1986-11-06 | ELEKTRO-PHYSIK Hans Nix & Dr.-Ing. E. Steingroever GmbH & Co KG, 5000 Köln | Method and device for the non-destructive measurement of material accumulations or layer thicknesses on film-like dielectric materials, in particular plastic |
| US4470123A (en) | 1982-01-05 | 1984-09-04 | Miami R & D Limited Partnership | Microwave ice accretion meter |
| DE3220815C2 (en) | 1982-06-03 | 1985-02-28 | Ransburg-Gema AG, St.Gallen | Pressure regulating device for gaseous and liquid fluids |
| US4514680A (en) | 1983-01-28 | 1985-04-30 | A.Ahlstrom Osakeyhtio | Flaw detection system using microwaves |
| US4707652A (en) | 1983-11-30 | 1987-11-17 | Philip Morris Incorporated | Impurity detector measuring parallel polarized scattered electromagnetic radiation |
| US4581574A (en) | 1984-02-21 | 1986-04-08 | The Boeing Company | Method of testing dielectric materials |
| JPS61274209A (en) | 1985-05-30 | 1986-12-04 | Furuno Electric Co Ltd | Apparatus for detecting omission of concrete |
| IT1201375B (en) | 1985-11-08 | 1989-01-27 | Consiglio Nazionale Ricerche | METHOD AND APPARATUS FOR THE DETERMINATION OF THE DIELECTRIC CONSTANT OF MATERIALS AND ITS APPLICATION FOR THE DETERMINATION OF THE INCOMBUDED CHARCOAL RATE PRESENT IN THE ASH OF A COMBUSTER |
| SU1350570A1 (en) | 1986-02-07 | 1987-11-07 | Калининградский государственный университет | Transducer for checking thickness of polymeric film |
| US5216372A (en) | 1991-07-29 | 1993-06-01 | Colorado State University Research Foundation | Microwave steel belt location sensor for tires |
| US5384543A (en) | 1992-11-09 | 1995-01-24 | Martin Marietta Energy Systems, Inc. | Portable microwave instrument for non-destructive evaluation of structural characteristics |
| US5393557A (en) | 1992-12-17 | 1995-02-28 | Northrop Grumman Corporation | Method for measuring electromagnetic properties |
| US5539322A (en) | 1994-09-20 | 1996-07-23 | Wave Metric, Inc. | Calibrated microwave dielectric coating thickness gauge |
| WO1997010514A1 (en) | 1995-09-11 | 1997-03-20 | Yissum Research Development Company Of The Hebrew University Of Jerusalem | Near-field resistivity microscope |
| US6359446B1 (en) | 1997-09-25 | 2002-03-19 | Jack R. Little, Jr. | Apparatus and method for nondestructive testing of dielectric materials |
| US6172510B1 (en) | 1998-12-30 | 2001-01-09 | The United Sates Of America As Represented By The Secretary Of The Navy | System for detection of flaws by use of microwave radiation |
| WO2004111572A1 (en) | 2003-06-13 | 2004-12-23 | Ebara Corporation | Measuring apparatus |
| US7149050B2 (en) * | 2003-10-20 | 2006-12-12 | Quantum Corporation | Diffractive position sensors and control systems |
| JP2005157601A (en) * | 2003-11-25 | 2005-06-16 | Canon Inc | Layered object counting device and method using electromagnetic wave |
| CA2615685C (en) | 2004-08-05 | 2015-06-23 | Jack R. Little, Jr. | High-resolution, nondestructive imaging of dielectric materials |
| US7190177B2 (en) | 2004-08-18 | 2007-03-13 | The Curators Of The University Of Missouri | Method and apparatus for nondestructive sample inspection |
| JP5373534B2 (en) * | 2009-10-07 | 2013-12-18 | 三井造船株式会社 | Phase difference measuring method and phase difference measuring apparatus |
| JP5246801B2 (en) * | 2009-12-01 | 2013-07-24 | 八光オートメーション株式会社 | Sheet number inspection device |
| US8077827B2 (en) | 2010-02-23 | 2011-12-13 | Test Research, Inc. | Method for thickness calibration and measuring thickness of material |
-
2014
- 2014-09-22 SG SG11201602177PA patent/SG11201602177PA/en unknown
- 2014-09-22 EP EP14849599.7A patent/EP3049796B1/en active Active
- 2014-09-22 CA CA2962411A patent/CA2962411C/en active Active
- 2014-09-22 WO PCT/US2014/056730 patent/WO2015047931A1/en active Application Filing
- 2014-09-22 JP JP2016518189A patent/JP6392331B2/en active Active
- 2014-09-22 MX MX2016003448A patent/MX357090B/en active IP Right Grant
- 2014-09-22 AU AU2014327105A patent/AU2014327105B2/en active Active
- 2014-09-22 US US15/023,297 patent/US9989359B2/en active Active
- 2014-09-22 MY MYPI2016700974A patent/MY185399A/en unknown
- 2014-09-24 TW TW103132960A patent/TWI653428B/en active
-
2016
- 2016-05-11 AU AU2016100570A patent/AU2016100570A4/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| WO2015047931A1 (en) | 2015-04-02 |
| JP6392331B2 (en) | 2018-09-19 |
| MY185399A (en) | 2021-05-17 |
| TWI653428B (en) | 2019-03-11 |
| EP3049796A1 (en) | 2016-08-03 |
| CA2962411A1 (en) | 2015-04-02 |
| EP3049796B1 (en) | 2019-03-13 |
| EP3049796A4 (en) | 2017-03-01 |
| AU2016100570A4 (en) | 2016-06-09 |
| CA2962411C (en) | 2022-07-19 |
| US20160298957A1 (en) | 2016-10-13 |
| TW201518681A (en) | 2015-05-16 |
| AU2014327105A1 (en) | 2016-05-12 |
| JP2016532091A (en) | 2016-10-13 |
| NZ718193A (en) | 2020-09-25 |
| AU2014327105B2 (en) | 2018-10-18 |
| MX357090B (en) | 2018-06-25 |
| US9989359B2 (en) | 2018-06-05 |
| MX2016003448A (en) | 2016-10-28 |
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