MX2020011927A - Sistema y metodo para detectar defectos en elementos digitalizados. - Google Patents

Sistema y metodo para detectar defectos en elementos digitalizados.

Info

Publication number
MX2020011927A
MX2020011927A MX2020011927A MX2020011927A MX2020011927A MX 2020011927 A MX2020011927 A MX 2020011927A MX 2020011927 A MX2020011927 A MX 2020011927A MX 2020011927 A MX2020011927 A MX 2020011927A MX 2020011927 A MX2020011927 A MX 2020011927A
Authority
MX
Mexico
Prior art keywords
detect defects
defects
digitized elements
digitized
elements
Prior art date
Application number
MX2020011927A
Other languages
English (en)
Spanish (es)
Inventor
Yonatan Hyatt
Ran Ginsburg
Gil Zohav
Dagan Eshar
Original Assignee
Inspekto A M V Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspekto A M V Ltd filed Critical Inspekto A M V Ltd
Publication of MX2020011927A publication Critical patent/MX2020011927A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/243—Classification techniques relating to the number of classes
    • G06F18/2433—Single-class perspective, e.g. one-against-all classification; Novelty detection; Outlier detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/044—Recurrent networks, e.g. Hopfield networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/044—Recurrent networks, e.g. Hopfield networks
    • G06N3/0442—Recurrent networks, e.g. Hopfield networks characterised by memory or gating, e.g. long short-term memory [LSTM] or gated recurrent units [GRU]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/045—Combinations of networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/0464—Convolutional networks [CNN, ConvNet]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/09—Supervised learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/096—Transfer learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/64—Three-dimensional [3D] objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/006—Crack, flaws, fracture or rupture
    • G01N2203/0062—Crack or flaws
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Software Systems (AREA)
  • Evolutionary Computation (AREA)
  • Data Mining & Analysis (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Molecular Biology (AREA)
  • Computational Linguistics (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Medical Informatics (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Databases & Information Systems (AREA)
  • Evolutionary Biology (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
MX2020011927A 2018-05-10 2019-05-10 Sistema y metodo para detectar defectos en elementos digitalizados. MX2020011927A (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862669403P 2018-05-10 2018-05-10
IL259285A IL259285B2 (en) 2018-05-10 2018-05-10 A system and method for detecting defects on objects in an image
PCT/IL2019/050532 WO2019215746A1 (en) 2018-05-10 2019-05-10 System and method for detecting defects on imaged items

Publications (1)

Publication Number Publication Date
MX2020011927A true MX2020011927A (es) 2021-01-29

Family

ID=66624797

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2020011927A MX2020011927A (es) 2018-05-10 2019-05-10 Sistema y metodo para detectar defectos en elementos digitalizados.

Country Status (10)

Country Link
US (1) US11982628B2 (https=)
EP (1) EP3791336B1 (https=)
JP (1) JP2021523348A (https=)
KR (1) KR20210008352A (https=)
CN (1) CN112088387B (https=)
BR (1) BR112020022645A2 (https=)
CA (1) CA3097316A1 (https=)
IL (1) IL259285B2 (https=)
MX (1) MX2020011927A (https=)
WO (1) WO2019215746A1 (https=)

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CN113012088A (zh) * 2019-12-03 2021-06-22 浙江大搜车软件技术有限公司 一种电路板故障检测及孪生网络的训练方法、装置和设备
US11315238B2 (en) * 2019-12-12 2022-04-26 Innolux Corporation Method for manufacturing a product
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US11937019B2 (en) 2021-06-07 2024-03-19 Elementary Robotics, Inc. Intelligent quality assurance and inspection device having multiple camera modules
US12272046B2 (en) * 2020-09-21 2025-04-08 International Business Machines Corporation Feature detection based on neural networks
CN114648480B (zh) * 2020-12-17 2025-09-05 杭州海康威视数字技术股份有限公司 表面缺陷检测方法、装置及系统
US12330329B2 (en) 2021-03-30 2025-06-17 Maxcess Americas, Inc. Rotary die cutting device and method for setting a gap dimension of a gap between a die cutting cylinder and a counter pressure cylinder of the rotary die cutting device
US12051186B2 (en) * 2021-11-03 2024-07-30 Elementary Robotics, Inc. Automatic object detection and changeover for quality assurance inspection
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US12050454B2 (en) 2021-11-10 2024-07-30 Elementary Robotics, Inc. Cloud-based multi-camera quality assurance lifecycle architecture
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WO2023092170A1 (en) * 2021-11-29 2023-06-01 Daifuku Oceania Limited Conveyance object controlling apparatus and method
US11605216B1 (en) 2022-02-10 2023-03-14 Elementary Robotics, Inc. Intelligent automated image clustering for quality assurance
CN115187525A (zh) * 2022-06-23 2022-10-14 四川启睿克科技有限公司 基于知识蒸馏的无监督图像缺陷检测方法、装置及介质
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CN119894650A (zh) 2022-09-13 2025-04-25 麦克氏国际公司 用于设定轴向位置和间隙尺寸的刻划装置及方法
CN116058195B (zh) * 2023-04-06 2023-07-04 中国农业大学 一种叶菜生长环境光照调控方法、系统及装置
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Also Published As

Publication number Publication date
JP2021523348A (ja) 2021-09-02
BR112020022645A2 (pt) 2021-02-02
IL259285B1 (en) 2023-03-01
CN112088387A (zh) 2020-12-15
CA3097316A1 (en) 2019-11-14
IL259285A (en) 2018-06-28
EP3791336A4 (en) 2022-01-26
CN112088387B (zh) 2024-04-16
US11982628B2 (en) 2024-05-14
KR20210008352A (ko) 2021-01-21
EP3791336B1 (en) 2025-10-29
EP3791336C0 (en) 2025-10-29
US20210233229A1 (en) 2021-07-29
IL259285B2 (en) 2023-07-01
EP3791336A1 (en) 2021-03-17
WO2019215746A1 (en) 2019-11-14

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