KR20210008352A - 촬상된 품목의 결함을 검출하기 위한 시스템 및 방법 - Google Patents

촬상된 품목의 결함을 검출하기 위한 시스템 및 방법 Download PDF

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KR20210008352A
KR20210008352A KR1020207033217A KR20207033217A KR20210008352A KR 20210008352 A KR20210008352 A KR 20210008352A KR 1020207033217 A KR1020207033217 A KR 1020207033217A KR 20207033217 A KR20207033217 A KR 20207033217A KR 20210008352 A KR20210008352 A KR 20210008352A
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item
image
images
defect
processor
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란 긴스버그
요나탄 하얏트
길 조하브
다간 에샤
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인스펙토 에이.엠.브이 리미티드
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
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    • G06F18/243—Classification techniques relating to the number of classes
    • G06F18/2433—Single-class perspective, e.g. one-against-all classification; Novelty detection; Outlier detection
    • G—PHYSICS
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    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
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    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/044—Recurrent networks, e.g. Hopfield networks
    • G06N3/0442—Recurrent networks, e.g. Hopfield networks characterised by memory or gating, e.g. long short-term memory [LSTM] or gated recurrent units [GRU]
    • G06N3/0445—
    • G06N3/0454—
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/0464—Convolutional networks [CNN, ConvNet]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/09—Supervised learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/096—Transfer learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/006—Crack, flaws, fracture or rupture
    • G01N2203/0062—Crack or flaws
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/044—Recurrent networks, e.g. Hopfield networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
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    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/045—Combinations of networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/64—Three-dimensional [3D] objects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

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  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
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  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
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  • Artificial Intelligence (AREA)
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  • Data Mining & Analysis (AREA)
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  • General Engineering & Computer Science (AREA)
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  • Computational Linguistics (AREA)
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  • Biomedical Technology (AREA)
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  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Medical Informatics (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Databases & Information Systems (AREA)
  • Evolutionary Biology (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1020207033217A 2018-05-10 2019-05-10 촬상된 품목의 결함을 검출하기 위한 시스템 및 방법 Ceased KR20210008352A (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201862669403P 2018-05-10 2018-05-10
IL259285A IL259285B2 (en) 2018-05-10 2018-05-10 A system and method for detecting defects on objects in an image
US62/669,403 2018-05-10
IL259285 2018-05-10
PCT/IL2019/050532 WO2019215746A1 (en) 2018-05-10 2019-05-10 System and method for detecting defects on imaged items

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KR20210008352A true KR20210008352A (ko) 2021-01-21

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US (1) US11982628B2 (https=)
EP (1) EP3791336B1 (https=)
JP (1) JP2021523348A (https=)
KR (1) KR20210008352A (https=)
CN (1) CN112088387B (https=)
BR (1) BR112020022645A2 (https=)
CA (1) CA3097316A1 (https=)
IL (1) IL259285B2 (https=)
MX (1) MX2020011927A (https=)
WO (1) WO2019215746A1 (https=)

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Publication number Publication date
JP2021523348A (ja) 2021-09-02
BR112020022645A2 (pt) 2021-02-02
IL259285B1 (en) 2023-03-01
CN112088387A (zh) 2020-12-15
MX2020011927A (es) 2021-01-29
CA3097316A1 (en) 2019-11-14
IL259285A (en) 2018-06-28
EP3791336A4 (en) 2022-01-26
CN112088387B (zh) 2024-04-16
US11982628B2 (en) 2024-05-14
EP3791336B1 (en) 2025-10-29
EP3791336C0 (en) 2025-10-29
US20210233229A1 (en) 2021-07-29
IL259285B2 (en) 2023-07-01
EP3791336A1 (en) 2021-03-17
WO2019215746A1 (en) 2019-11-14

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