CN112088387B - 检测成像物品缺陷的系统和方法 - Google Patents

检测成像物品缺陷的系统和方法 Download PDF

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CN112088387B
CN112088387B CN201980030747.2A CN201980030747A CN112088387B CN 112088387 B CN112088387 B CN 112088387B CN 201980030747 A CN201980030747 A CN 201980030747A CN 112088387 B CN112088387 B CN 112088387B
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CN112088387A (zh
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约纳坦·亚特
吉尔·佐哈夫
拉恩·金斯堡
达根·埃沙尔
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Siemens Corp
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Insecto Amway Co ltd
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00Pattern recognition
    • G06F18/20Analysing
    • G06F18/24Classification techniques
    • G06F18/243Classification techniques relating to the number of classes
    • G06F18/2433Single-class perspective, e.g. one-against-all classification; Novelty detection; Outlier detection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00Machine learning
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/04Architecture, e.g. interconnection topology
    • G06N3/044Recurrent networks, e.g. Hopfield networks
    • G06N3/0442Recurrent networks, e.g. Hopfield networks characterised by memory or gating, e.g. long short-term memory [LSTM] or gated recurrent units [GRU]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/04Architecture, e.g. interconnection topology
    • G06N3/0464Convolutional networks [CNN, ConvNet]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
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    • G06N3/02Neural networks
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    • G06N3/096Transfer learning
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00Scenes; Scene-specific elements
    • G06V20/60Type of objects
    • G06V20/64Three-dimensional [3D] objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058Kind of property studied
    • G01N2203/006Crack, flaws, fracture or rupture
    • G01N2203/0062Crack or flaws
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
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    • G06N3/04Architecture, e.g. interconnection topology
    • G06N3/044Recurrent networks, e.g. Hopfield networks
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/04Architecture, e.g. interconnection topology
    • G06N3/045Combinations of networks
    • GPHYSICS
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    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/08Learning methods
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20081Training; Learning
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20084Artificial neural networks [ANN]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06Recognition of objects for industrial automation

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  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
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  • Bioinformatics & Computational Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201980030747.2A 2018-05-10 2019-05-10 检测成像物品缺陷的系统和方法 Active CN112088387B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201862669403P 2018-05-10 2018-05-10
IL259285A IL259285B2 (en) 2018-05-10 2018-05-10 A system and method for detecting defects on objects in an image
US62/669,403 2018-05-10
IL259285 2018-05-10
PCT/IL2019/050532 WO2019215746A1 (en) 2018-05-10 2019-05-10 System and method for detecting defects on imaged items

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CN112088387B true CN112088387B (zh) 2024-04-16

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EP (1) EP3791336B1 (https=)
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KR (1) KR20210008352A (https=)
CN (1) CN112088387B (https=)
BR (1) BR112020022645A2 (https=)
CA (1) CA3097316A1 (https=)
IL (1) IL259285B2 (https=)
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Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10726627B2 (en) 2017-07-25 2020-07-28 Facebook Technologies, Llc Sensor system based on stacked sensor layers
IL261733B (en) * 2018-09-13 2022-09-01 Inspekto A M V Ltd Streamlining an automatic visual inspection process
IL263097B2 (en) * 2018-11-18 2024-01-01 Inspekto A M V Ltd Optimizing a set-up stage in an automatic visual inspection process
JP7281041B2 (ja) * 2018-11-29 2023-05-25 京セラドキュメントソリューションズ株式会社 種類判別システム
CN113012088A (zh) * 2019-12-03 2021-06-22 浙江大搜车软件技术有限公司 一种电路板故障检测及孪生网络的训练方法、装置和设备
US11315238B2 (en) * 2019-12-12 2022-04-26 Innolux Corporation Method for manufacturing a product
EP4147445A1 (en) * 2020-05-07 2023-03-15 Meta Platforms Technologies, Llc Smart sensor
US11937019B2 (en) 2021-06-07 2024-03-19 Elementary Robotics, Inc. Intelligent quality assurance and inspection device having multiple camera modules
US12272046B2 (en) * 2020-09-21 2025-04-08 International Business Machines Corporation Feature detection based on neural networks
CN114648480B (zh) * 2020-12-17 2025-09-05 杭州海康威视数字技术股份有限公司 表面缺陷检测方法、装置及系统
US12330329B2 (en) 2021-03-30 2025-06-17 Maxcess Americas, Inc. Rotary die cutting device and method for setting a gap dimension of a gap between a die cutting cylinder and a counter pressure cylinder of the rotary die cutting device
US12051186B2 (en) * 2021-11-03 2024-07-30 Elementary Robotics, Inc. Automatic object detection and changeover for quality assurance inspection
US11605159B1 (en) 2021-11-03 2023-03-14 Elementary Robotics, Inc. Computationally efficient quality assurance inspection processes using machine learning
US12050454B2 (en) 2021-11-10 2024-07-30 Elementary Robotics, Inc. Cloud-based multi-camera quality assurance lifecycle architecture
US11675345B2 (en) 2021-11-10 2023-06-13 Elementary Robotics, Inc. Cloud-based multi-camera quality assurance architecture
WO2023092170A1 (en) * 2021-11-29 2023-06-01 Daifuku Oceania Limited Conveyance object controlling apparatus and method
US11605216B1 (en) 2022-02-10 2023-03-14 Elementary Robotics, Inc. Intelligent automated image clustering for quality assurance
CN115187525A (zh) * 2022-06-23 2022-10-14 四川启睿克科技有限公司 基于知识蒸馏的无监督图像缺陷检测方法、装置及介质
US12078692B2 (en) 2022-07-20 2024-09-03 General Electric Company Apparatus and method for visualizing defects using a magneto-optical effect
CN115496714B (zh) * 2022-08-29 2026-04-14 北京百度网讯科技有限公司 Pcb检测方法、装置、模型训练方法、电子设备及存储介质
CN119894650A (zh) 2022-09-13 2025-04-25 麦克氏国际公司 用于设定轴向位置和间隙尺寸的刻划装置及方法
CN116058195B (zh) * 2023-04-06 2023-07-04 中国农业大学 一种叶菜生长环境光照调控方法、系统及装置
US12573180B2 (en) 2023-06-21 2026-03-10 Insight Direct Usa, Inc. Collection of image data for use in training a machine-learning model

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103913468A (zh) * 2014-03-31 2014-07-09 湖南大学 生产线上大尺寸lcd玻璃基板的多视觉缺陷检测设备及方法
CN106980875A (zh) * 2017-03-13 2017-07-25 南京邮电大学 基于属性低秩表示的零样本图像识别方法
CN107004265A (zh) * 2014-12-12 2017-08-01 佳能株式会社 信息处理装置、处理信息的方法、鉴别器生成装置、生成鉴别器的方法、以及程序
CN107430693A (zh) * 2015-03-13 2017-12-01 北京市商汤科技开发有限公司 用于车辆分类和验证的设备和系统
CN107820620A (zh) * 2015-05-08 2018-03-20 科磊股份有限公司 用于缺陷分类的方法和系统

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6947587B1 (en) 1998-04-21 2005-09-20 Hitachi, Ltd. Defect inspection method and apparatus
US6324298B1 (en) 1998-07-15 2001-11-27 August Technology Corp. Automated wafer defect inspection system and a process of performing such inspection
US7096207B2 (en) 2002-03-22 2006-08-22 Donglok Kim Accelerated learning in machine vision using artificially implanted defects
JP4176364B2 (ja) * 2002-03-22 2008-11-05 富士通株式会社 画像対応付け装置及び画像対応付け方法並びに画像対応付けプログラム
DE602004019537D1 (de) 2003-07-24 2009-04-02 Cognitens Ltd System und verfahren zur überwachung und visualisierung der ausgabe eines produktionsprozesses
JP4608224B2 (ja) * 2004-03-22 2011-01-12 オリンパス株式会社 欠陥画像検査装置及びその方法
EP1932116A2 (en) * 2005-08-26 2008-06-18 Camtek Ltd. Method and system for automatic defect detection of articles in visual inspection machines
JP4616864B2 (ja) 2007-06-20 2011-01-19 株式会社日立ハイテクノロジーズ 外観検査方法及びその装置および画像処理評価システム
US8646689B2 (en) 2007-12-28 2014-02-11 Cognex Corporation Deformable light pattern for machine vision system
JP2010008159A (ja) * 2008-06-25 2010-01-14 Panasonic Electric Works Co Ltd 外観検査処理方法
US8774504B1 (en) 2011-10-26 2014-07-08 Hrl Laboratories, Llc System for three-dimensional object recognition and foreground extraction
US8987010B1 (en) 2013-08-29 2015-03-24 International Business Machines Corporation Microprocessor image correction and method for the detection of potential defects
JP6217329B2 (ja) * 2013-11-11 2017-10-25 株式会社リコー 検査装置、画像形成装置、検査方法およびプログラム
US10514685B2 (en) 2014-06-13 2019-12-24 KLA—Tencor Corp. Automatic recipe stability monitoring and reporting
US20170069075A1 (en) * 2015-09-04 2017-03-09 Canon Kabushiki Kaisha Classifier generation apparatus, defective/non-defective determination method, and program
KR101688458B1 (ko) 2016-04-27 2016-12-23 디아이티 주식회사 깊은 신경망 학습 방법을 이용한 제조품용 영상 검사 장치 및 이를 이용한 제조품용 영상 검사 방법
IL257256A (en) * 2018-01-30 2018-03-29 HYATT Yonatan System and method for establishing production line tests
IL263097B2 (en) * 2018-11-18 2024-01-01 Inspekto A M V Ltd Optimizing a set-up stage in an automatic visual inspection process
CN114419035B (zh) * 2022-03-25 2022-06-17 北京百度网讯科技有限公司 产品识别方法、模型训练方法、装置和电子设备

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103913468A (zh) * 2014-03-31 2014-07-09 湖南大学 生产线上大尺寸lcd玻璃基板的多视觉缺陷检测设备及方法
CN107004265A (zh) * 2014-12-12 2017-08-01 佳能株式会社 信息处理装置、处理信息的方法、鉴别器生成装置、生成鉴别器的方法、以及程序
CN107430693A (zh) * 2015-03-13 2017-12-01 北京市商汤科技开发有限公司 用于车辆分类和验证的设备和系统
CN107820620A (zh) * 2015-05-08 2018-03-20 科磊股份有限公司 用于缺陷分类的方法和系统
CN106980875A (zh) * 2017-03-13 2017-07-25 南京邮电大学 基于属性低秩表示的零样本图像识别方法

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
An Unsupervised-learning-based Approach for Automated Defect Inspection on Textured Surfaces;Shuang Mei etc;IEEE Transactions on Instrumentation and Measurement;第67卷(第6期);第1266-1277页 *
Machine Learning-Based Imaging System for Surface Defect Inspection;Je-Kang Park etc;INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY;第3卷(第3期);第303-310 *

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Publication number Publication date
JP2021523348A (ja) 2021-09-02
BR112020022645A2 (pt) 2021-02-02
IL259285B1 (en) 2023-03-01
CN112088387A (zh) 2020-12-15
MX2020011927A (es) 2021-01-29
CA3097316A1 (en) 2019-11-14
IL259285A (en) 2018-06-28
EP3791336A4 (en) 2022-01-26
US11982628B2 (en) 2024-05-14
KR20210008352A (ko) 2021-01-21
EP3791336B1 (en) 2025-10-29
EP3791336C0 (en) 2025-10-29
US20210233229A1 (en) 2021-07-29
IL259285B2 (en) 2023-07-01
EP3791336A1 (en) 2021-03-17
WO2019215746A1 (en) 2019-11-14

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