JP2021523348A - 画像化されたアイテムの欠陥を検出するためのシステムおよび方法 - Google Patents

画像化されたアイテムの欠陥を検出するためのシステムおよび方法 Download PDF

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JP2021523348A
JP2021523348A JP2020559516A JP2020559516A JP2021523348A JP 2021523348 A JP2021523348 A JP 2021523348A JP 2020559516 A JP2020559516 A JP 2020559516A JP 2020559516 A JP2020559516 A JP 2020559516A JP 2021523348 A JP2021523348 A JP 2021523348A
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defect
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JPWO2019215746A5 (https=
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ギンズバーグ，ラン
ハイアット，ヨナタン
ゾハブ，ジル
エスハー，ダガン
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インスペクト エー．エム．ブイ リミテッド
インスペクト エー．エム．ブイ リミテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/243—Classification techniques relating to the number of classes
    • G06F18/2433—Single-class perspective, e.g. one-against-all classification; Novelty detection; Outlier detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/044—Recurrent networks, e.g. Hopfield networks
    • G06N3/0442—Recurrent networks, e.g. Hopfield networks characterised by memory or gating, e.g. long short-term memory [LSTM] or gated recurrent units [GRU]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/0464—Convolutional networks [CNN, ConvNet]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/09—Supervised learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/096—Transfer learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/006—Crack, flaws, fracture or rupture
    • G01N2203/0062—Crack or flaws
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/044—Recurrent networks, e.g. Hopfield networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/045—Combinations of networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/64—Three-dimensional [3D] objects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Artificial Intelligence (AREA)
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  • Evolutionary Computation (AREA)
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  • Biomedical Technology (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Medical Informatics (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Databases & Information Systems (AREA)
  • Evolutionary Biology (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2020559516A 2018-05-10 2019-05-10 画像化されたアイテムの欠陥を検出するためのシステムおよび方法 Pending JP2021523348A (ja)

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US201862669403P 2018-05-10 2018-05-10
IL259285A IL259285B2 (en) 2018-05-10 2018-05-10 A system and method for detecting defects on objects in an image
US62/669,403 2018-05-10
IL259285 2018-05-10
PCT/IL2019/050532 WO2019215746A1 (en) 2018-05-10 2019-05-10 System and method for detecting defects on imaged items

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JP2021523348A true JP2021523348A (ja) 2021-09-02
JP2021523348A5 JP2021523348A5 (https=) 2022-05-16
JPWO2019215746A5 JPWO2019215746A5 (https=) 2022-05-16

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US (1) US11982628B2 (https=)
EP (1) EP3791336B1 (https=)
JP (1) JP2021523348A (https=)
KR (1) KR20210008352A (https=)
CN (1) CN112088387B (https=)
BR (1) BR112020022645A2 (https=)
CA (1) CA3097316A1 (https=)
IL (1) IL259285B2 (https=)
MX (1) MX2020011927A (https=)
WO (1) WO2019215746A1 (https=)

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CN115496714B (zh) * 2022-08-29 2026-04-14 北京百度网讯科技有限公司 Pcb检测方法、装置、模型训练方法、电子设备及存储介质
CN119894650A (zh) 2022-09-13 2025-04-25 麦克氏国际公司 用于设定轴向位置和间隙尺寸的刻划装置及方法
CN116058195B (zh) * 2023-04-06 2023-07-04 中国农业大学 一种叶菜生长环境光照调控方法、系统及装置
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JP2023525950A (ja) * 2020-05-07 2023-06-20 メタ プラットフォームズ テクノロジーズ， リミテッド ライアビリティ カンパニー スマートセンサ

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BR112020022645A2 (pt) 2021-02-02
IL259285B1 (en) 2023-03-01
CN112088387A (zh) 2020-12-15
MX2020011927A (es) 2021-01-29
CA3097316A1 (en) 2019-11-14
IL259285A (en) 2018-06-28
EP3791336A4 (en) 2022-01-26
CN112088387B (zh) 2024-04-16
US11982628B2 (en) 2024-05-14
KR20210008352A (ko) 2021-01-21
EP3791336B1 (en) 2025-10-29
EP3791336C0 (en) 2025-10-29
US20210233229A1 (en) 2021-07-29
IL259285B2 (en) 2023-07-01
EP3791336A1 (en) 2021-03-17
WO2019215746A1 (en) 2019-11-14

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