MX2015007174A - Dispositivo integrado y metodo para analizar fluido en una maquina termica. - Google Patents

Dispositivo integrado y metodo para analizar fluido en una maquina termica.

Info

Publication number
MX2015007174A
MX2015007174A MX2015007174A MX2015007174A MX2015007174A MX 2015007174 A MX2015007174 A MX 2015007174A MX 2015007174 A MX2015007174 A MX 2015007174A MX 2015007174 A MX2015007174 A MX 2015007174A MX 2015007174 A MX2015007174 A MX 2015007174A
Authority
MX
Mexico
Prior art keywords
integration
duration
light source
supply current
value
Prior art date
Application number
MX2015007174A
Other languages
English (en)
Other versions
MX342198B (es
Inventor
Johan Fournel
Sylvain Oberti
Original Assignee
Sp3H
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR1261757A external-priority patent/FR2999333A1/fr
Priority claimed from FR1261758A external-priority patent/FR2999334B1/fr
Application filed by Sp3H filed Critical Sp3H
Publication of MX2015007174A publication Critical patent/MX2015007174A/es
Publication of MX342198B publication Critical patent/MX342198B/es

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3577Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing liquids, e.g. polluted water
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3181Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using LEDs
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/062LED's
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/062LED's
    • G01N2201/0624Compensating variation in output of LED source
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/121Correction signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/121Correction signals
    • G01N2201/1211Correction signals for temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/124Sensitivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/124Sensitivity
    • G01N2201/1242Validating, e.g. range invalidation, suspending operation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/124Sensitivity
    • G01N2201/1247Thresholding
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/127Calibration; base line adjustment; drift compensation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/127Calibration; base line adjustment; drift compensation
    • G01N2201/12723Self check capacity; automatic, periodic step of checking

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Optical Measuring Cells (AREA)

Abstract

La presente invención se relaciona con un método para controlar un espectrómetro para analizar un producto, el método comprende las etapas de: adquirir una medición (LFL, TPL) representativa de la operación de una fuente de luz (LS), determinar, dependiendo de la medición, un valor de corriente de suministro (LCx) de la fuente de luz, y/o un valor de tiempo de integración (ITy) de las celdas sensibles a la luz (y) de un sensor (OPS), colocado sobre una ruta de un haz de luz (LB) emitido por la fuente de luz y que ha interactuado con un producto que va a ser analizado, y si el tiempo de integración y/o el valor de corriente de suministro está entre valores umbral, suministrar la fuente de luz con una corriente de suministro que corresponde al valor de corriente de suministro determinado, ajustar el tiempo de integración de una celda sensible a la luz al valor de tiempo de integración determinado y adquirir mediciones de intensidad de luz (MSy) suministrados por el sensor, habilitando que se forme un espectro.
MX2015007174A 2012-12-07 2013-12-04 Dispositivo integrado y metodo para analizar fluido en una maquina termica. MX342198B (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1261757A FR2999333A1 (fr) 2012-12-07 2012-12-07 Procede et dispositif embarque d’analyse de fluide dans un moteur thermique
FR1261758A FR2999334B1 (fr) 2012-12-07 2012-12-07 Procede et dispositif embarque d’analyse de fluide dans un moteur thermique
PCT/FR2013/052940 WO2014087102A1 (fr) 2012-12-07 2013-12-04 Procede et dispositif embarque d'analyse de fluide dans un moteur thermique

Publications (2)

Publication Number Publication Date
MX2015007174A true MX2015007174A (es) 2015-10-20
MX342198B MX342198B (es) 2016-09-20

Family

ID=49886962

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2015007174A MX342198B (es) 2012-12-07 2013-12-04 Dispositivo integrado y metodo para analizar fluido en una maquina termica.

Country Status (10)

Country Link
US (2) US9562851B2 (es)
EP (2) EP2929322B1 (es)
JP (1) JP2016501372A (es)
KR (1) KR20150114465A (es)
CN (2) CN104969058B (es)
BR (2) BR112015013313A2 (es)
CA (1) CA2892849A1 (es)
MX (1) MX342198B (es)
RU (2) RU2015127030A (es)
WO (2) WO2014087103A1 (es)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014111093A1 (de) * 2014-08-05 2016-02-11 Valeo Schalter Und Sensoren Gmbh Sensorvorrichtung zum Bestimmen einer Konzentration eines Fluids, Fahrerassistenzsystem, Kraftfahrzeug sowie Verfahren

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JP3235249B2 (ja) * 1992-12-18 2001-12-04 株式会社デンソー 光学的情報読取り装置
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JP2001268324A (ja) * 2000-01-12 2001-09-28 Fuji Photo Film Co Ltd 光源装置、原稿読取装置及び方法
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JP3620798B2 (ja) * 2003-06-27 2005-02-16 株式会社アステム 非破壊分光測定器
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FR2866956B1 (fr) * 2004-02-26 2006-05-19 Cit Alcatel Detection d'especes gazeuses minoritaires par spectroscopie d'emission optique
DE102004025448B4 (de) * 2004-05-19 2007-03-29 Bruker Optik Gmbh Verfahren zum Messen eines Spektrums einer Messprobe mittels eines Infrarot-Spektrometers und derartiges Infrarot-Spektrometer
US20060072319A1 (en) * 2004-10-05 2006-04-06 Dziekan Michael E Method of using light emitting diodes for illumination sensing and using ultra-violet light sources for white light illumination
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Also Published As

Publication number Publication date
RU2015127029A (ru) 2017-01-12
US9562850B2 (en) 2017-02-07
EP2929321B1 (fr) 2019-06-05
BR112015013313A2 (pt) 2017-07-11
RU2637388C2 (ru) 2017-12-04
EP2929322A1 (fr) 2015-10-14
US20150300951A1 (en) 2015-10-22
CN104969059A (zh) 2015-10-07
BR112015013222A2 (pt) 2017-07-11
WO2014087103A1 (fr) 2014-06-12
KR20150114465A (ko) 2015-10-12
EP2929322B1 (fr) 2016-10-12
WO2014087102A1 (fr) 2014-06-12
EP2929321A1 (fr) 2015-10-14
JP2016501372A (ja) 2016-01-18
MX342198B (es) 2016-09-20
US20150346085A1 (en) 2015-12-03
CN104969058B (zh) 2017-08-08
US9562851B2 (en) 2017-02-07
CN104969058A (zh) 2015-10-07
CA2892849A1 (fr) 2014-06-12
RU2015127030A (ru) 2017-01-13

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