MD4052C1 - Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K - Google Patents
Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200KInfo
- Publication number
- MD4052C1 MD4052C1 MDA20080262A MD20080262A MD4052C1 MD 4052 C1 MD4052 C1 MD 4052C1 MD A20080262 A MDA20080262 A MD A20080262A MD 20080262 A MD20080262 A MD 20080262A MD 4052 C1 MD4052 C1 MD 4052C1
- Authority
- MD
- Moldova
- Prior art keywords
- tube
- metal
- quartz tube
- fixed
- bush
- Prior art date
Links
- 239000000463 material Substances 0.000 title abstract 3
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 239000002184 metal Substances 0.000 abstract 9
- 239000010453 quartz Substances 0.000 abstract 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 9
- 239000004020 conductor Substances 0.000 abstract 1
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The invention relates to systems for electrical loads phenomena analysis in semiconductors and semimetals, namely for testing the electrical conduction and thermoelectromotive force of thermoelectric materials to determine their effectiveness in the temperature range 300…1200K.The device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K comprises a metal tube (6), in which are placed two thermocouples (11, 12) that come in contact with the sample (13), electric conductors (14, 15). The device also contains a spring (10), a vacuum chamber and an external heat source, located above the vacuum chamber from the end of establishment of the sample (13). The device additionally includes a metal block (2), fixed in a metal sleeve (1), mounted in a quartz tube (3), fixed in the upper part of the metal tube (6) through a fixation element (4) and a bush (5). The device also includes a movable metal block (7) with an axial hole for the thermocouple (12), installed in the upper part of a quartz tube (8), the lower part of which is rigidly fixed to a quartz tube (19), placed inside a quartz tube (9) with the possibility to move along it. A quartz tube (20) is fixed inside the quartz tube (9). The upper part of the quartz tube (9) is fixed in the lower part of the metal tube (6) by means of the fixation element (18) and the bush (16), at the same time the spring (10) is placed on the tube (19) between the quartz tubes (8) and (20). The lower part of the quartz tube (9) is fixed in the upper part of a metal tube (22) by means of the fixation element (21) and the bush (23). In the metal block (2) and metal bush (1) is made an axial hole for the thermocouple (11).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
MDA20080262A MD4052C1 (en) | 2008-10-16 | 2008-10-16 | Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
MDA20080262A MD4052C1 (en) | 2008-10-16 | 2008-10-16 | Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K |
Publications (2)
Publication Number | Publication Date |
---|---|
MD4052B1 MD4052B1 (en) | 2010-06-30 |
MD4052C1 true MD4052C1 (en) | 2011-01-31 |
Family
ID=43568991
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MDA20080262A MD4052C1 (en) | 2008-10-16 | 2008-10-16 | Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K |
Country Status (1)
Country | Link |
---|---|
MD (1) | MD4052C1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
MD430Z (en) * | 2011-02-24 | 2012-05-31 | ИНСТИТУТ ЭЛЕКТРОННОЙ ИНЖЕНЕРИИ И НАНОТЕХНОЛОГИЙ "D. Ghitu" АНМ | Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect |
Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU463008A1 (en) * | 1972-05-10 | 1975-03-05 | Кишиневский Научно-Исследовательский Институт Электроприборостроения | Thermoelectric converter |
SU1253358A1 (en) * | 1984-09-18 | 1996-01-10 | Ереванский политехнический институт им.К.Маркса | Material for making positive temperature- coefficient resistors |
RU93055713A (en) * | 1993-12-14 | 1996-06-10 | И.Н. Говор | THERMOELECTRIC ELEMENT |
MD855B1 (en) * | 1996-10-25 | 1997-09-30 | Inst Cercetari Stiintifice | Cast microwire process |
MD1564F1 (en) * | 1999-12-07 | 2000-11-30 | S.A. | Process for filling the stator of the electric machine |
EA002073B1 (en) * | 1998-10-06 | 2001-12-24 | Исаак Аронович Орентлихерман | Piezoelectric converter |
EA004668B1 (en) * | 2000-06-07 | 2004-06-24 | Эндресс+Хаузер Гмбх+Ко.Кг | Electromechanical transducer |
RU2231688C2 (en) * | 2000-03-31 | 2004-06-27 | Авдеев Леонид Алексеевич | Thermocouple |
MD2510F1 (en) * | 2003-02-18 | 2004-07-31 | Anatolii Matusovici Ioiser | Nanostructure and process for manufacture thereof |
MD20050370A (en) * | 2005-12-12 | 2007-08-31 | Технический университет Молдовы | Plant for casting conducting threads from metals in liquid phase |
MD3579B1 (en) * | 2006-05-02 | 2008-04-30 | Institutul De Inginerie Electronica Si Tehnologiiindustriale Al Academiei De Stiinte A Moldovei | Process for obtaining bismuth semimetallic microwire in molybdenum glass insulation |
MD3691B1 (en) * | 2007-05-10 | 2008-08-31 | Societatea Pe Actiuni Institutul De Cercetari Stiintifice "Eliri" | Process for manufacturing a filiform nanostructure |
-
2008
- 2008-10-16 MD MDA20080262A patent/MD4052C1/en not_active IP Right Cessation
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU463008A1 (en) * | 1972-05-10 | 1975-03-05 | Кишиневский Научно-Исследовательский Институт Электроприборостроения | Thermoelectric converter |
SU1253358A1 (en) * | 1984-09-18 | 1996-01-10 | Ереванский политехнический институт им.К.Маркса | Material for making positive temperature- coefficient resistors |
RU93055713A (en) * | 1993-12-14 | 1996-06-10 | И.Н. Говор | THERMOELECTRIC ELEMENT |
MD855B1 (en) * | 1996-10-25 | 1997-09-30 | Inst Cercetari Stiintifice | Cast microwire process |
EA002073B1 (en) * | 1998-10-06 | 2001-12-24 | Исаак Аронович Орентлихерман | Piezoelectric converter |
MD1564F1 (en) * | 1999-12-07 | 2000-11-30 | S.A. | Process for filling the stator of the electric machine |
RU2231688C2 (en) * | 2000-03-31 | 2004-06-27 | Авдеев Леонид Алексеевич | Thermocouple |
EA004668B1 (en) * | 2000-06-07 | 2004-06-24 | Эндресс+Хаузер Гмбх+Ко.Кг | Electromechanical transducer |
MD2510F1 (en) * | 2003-02-18 | 2004-07-31 | Anatolii Matusovici Ioiser | Nanostructure and process for manufacture thereof |
MD20050370A (en) * | 2005-12-12 | 2007-08-31 | Технический университет Молдовы | Plant for casting conducting threads from metals in liquid phase |
MD3579B1 (en) * | 2006-05-02 | 2008-04-30 | Institutul De Inginerie Electronica Si Tehnologiiindustriale Al Academiei De Stiinte A Moldovei | Process for obtaining bismuth semimetallic microwire in molybdenum glass insulation |
MD3691B1 (en) * | 2007-05-10 | 2008-08-31 | Societatea Pe Actiuni Institutul De Cercetari Stiintifice "Eliri" | Process for manufacturing a filiform nanostructure |
Non-Patent Citations (3)
Title |
---|
Burkov A.T., Heinrich A., Konstantinov P.P., Nakama T., Yagasaki K. Measurement Science and Technology, 2001, vol. 12, p. 264-272 * |
Jahed M.M., Riffel M., Poche C., Scherrer S. Proceedings Energy Conversion Engineering Conference and Exhibit, 2000, vol. 1, p. 135-138 * |
Littleton R.T., Jeffries J., Kaeser M. A., Long M., Tritt T.M. Material Research Society Symposium Proceedings, 1999, vol. 545, p. 137-138 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
MD430Z (en) * | 2011-02-24 | 2012-05-31 | ИНСТИТУТ ЭЛЕКТРОННОЙ ИНЖЕНЕРИИ И НАНОТЕХНОЛОГИЙ "D. Ghitu" АНМ | Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect |
Also Published As
Publication number | Publication date |
---|---|
MD4052B1 (en) | 2010-06-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG4A | Patent for invention issued | ||
KA4A | Patent for invention lapsed due to non-payment of fees (with right of restoration) | ||
MM4A | Patent for invention definitely lapsed due to non-payment of fees |