MD4052C1 - Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K - Google Patents

Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K Download PDF

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Publication number
MD4052C1
MD4052C1 MDA20080262A MD20080262A MD4052C1 MD 4052 C1 MD4052 C1 MD 4052C1 MD A20080262 A MDA20080262 A MD A20080262A MD 20080262 A MD20080262 A MD 20080262A MD 4052 C1 MD4052 C1 MD 4052C1
Authority
MD
Moldova
Prior art keywords
tube
metal
quartz tube
fixed
bush
Prior art date
Application number
MDA20080262A
Other languages
Romanian (ro)
Russian (ru)
Other versions
MD4052B1 (en
Inventor
Николае ПОПОВИЧ
Original Assignee
Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы filed Critical Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы
Priority to MDA20080262A priority Critical patent/MD4052C1/en
Publication of MD4052B1 publication Critical patent/MD4052B1/en
Publication of MD4052C1 publication Critical patent/MD4052C1/en

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

The invention relates to systems for electrical loads phenomena analysis in semiconductors and semimetals, namely for testing the electrical conduction and thermoelectromotive force of thermoelectric materials to determine their effectiveness in the temperature range 300…1200K.The device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K comprises a metal tube (6), in which are placed two thermocouples (11, 12) that come in contact with the sample (13), electric conductors (14, 15). The device also contains a spring (10), a vacuum chamber and an external heat source, located above the vacuum chamber from the end of establishment of the sample (13). The device additionally includes a metal block (2), fixed in a metal sleeve (1), mounted in a quartz tube (3), fixed in the upper part of the metal tube (6) through a fixation element (4) and a bush (5). The device also includes a movable metal block (7) with an axial hole for the thermocouple (12), installed in the upper part of a quartz tube (8), the lower part of which is rigidly fixed to a quartz tube (19), placed inside a quartz tube (9) with the possibility to move along it. A quartz tube (20) is fixed inside the quartz tube (9). The upper part of the quartz tube (9) is fixed in the lower part of the metal tube (6) by means of the fixation element (18) and the bush (16), at the same time the spring (10) is placed on the tube (19) between the quartz tubes (8) and (20). The lower part of the quartz tube (9) is fixed in the upper part of a metal tube (22) by means of the fixation element (21) and the bush (23). In the metal block (2) and metal bush (1) is made an axial hole for the thermocouple (11).
MDA20080262A 2008-10-16 2008-10-16 Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K MD4052C1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
MDA20080262A MD4052C1 (en) 2008-10-16 2008-10-16 Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MDA20080262A MD4052C1 (en) 2008-10-16 2008-10-16 Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K

Publications (2)

Publication Number Publication Date
MD4052B1 MD4052B1 (en) 2010-06-30
MD4052C1 true MD4052C1 (en) 2011-01-31

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MDA20080262A MD4052C1 (en) 2008-10-16 2008-10-16 Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K

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MD (1) MD4052C1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD430Z (en) * 2011-02-24 2012-05-31 ИНСТИТУТ ЭЛЕКТРОННОЙ ИНЖЕНЕРИИ И НАНОТЕХНОЛОГИЙ "D. Ghitu" АНМ Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU463008A1 (en) * 1972-05-10 1975-03-05 Кишиневский Научно-Исследовательский Институт Электроприборостроения Thermoelectric converter
SU1253358A1 (en) * 1984-09-18 1996-01-10 Ереванский политехнический институт им.К.Маркса Material for making positive temperature- coefficient resistors
RU93055713A (en) * 1993-12-14 1996-06-10 И.Н. Говор THERMOELECTRIC ELEMENT
MD855B1 (en) * 1996-10-25 1997-09-30 Inst Cercetari Stiintifice Cast microwire process
MD1564F1 (en) * 1999-12-07 2000-11-30 S.A. Process for filling the stator of the electric machine
EA002073B1 (en) * 1998-10-06 2001-12-24 Исаак Аронович Орентлихерман Piezoelectric converter
EA004668B1 (en) * 2000-06-07 2004-06-24 Эндресс+Хаузер Гмбх+Ко.Кг Electromechanical transducer
RU2231688C2 (en) * 2000-03-31 2004-06-27 Авдеев Леонид Алексеевич Thermocouple
MD2510F1 (en) * 2003-02-18 2004-07-31 Anatolii Matusovici Ioiser Nanostructure and process for manufacture thereof
MD20050370A (en) * 2005-12-12 2007-08-31 Технический университет Молдовы Plant for casting conducting threads from metals in liquid phase
MD3579B1 (en) * 2006-05-02 2008-04-30 Institutul De Inginerie Electronica Si Tehnologiiindustriale Al Academiei De Stiinte A Moldovei Process for obtaining bismuth semimetallic microwire in molybdenum glass insulation
MD3691B1 (en) * 2007-05-10 2008-08-31 Societatea Pe Actiuni Institutul De Cercetari Stiintifice "Eliri" Process for manufacturing a filiform nanostructure

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU463008A1 (en) * 1972-05-10 1975-03-05 Кишиневский Научно-Исследовательский Институт Электроприборостроения Thermoelectric converter
SU1253358A1 (en) * 1984-09-18 1996-01-10 Ереванский политехнический институт им.К.Маркса Material for making positive temperature- coefficient resistors
RU93055713A (en) * 1993-12-14 1996-06-10 И.Н. Говор THERMOELECTRIC ELEMENT
MD855B1 (en) * 1996-10-25 1997-09-30 Inst Cercetari Stiintifice Cast microwire process
EA002073B1 (en) * 1998-10-06 2001-12-24 Исаак Аронович Орентлихерман Piezoelectric converter
MD1564F1 (en) * 1999-12-07 2000-11-30 S.A. Process for filling the stator of the electric machine
RU2231688C2 (en) * 2000-03-31 2004-06-27 Авдеев Леонид Алексеевич Thermocouple
EA004668B1 (en) * 2000-06-07 2004-06-24 Эндресс+Хаузер Гмбх+Ко.Кг Electromechanical transducer
MD2510F1 (en) * 2003-02-18 2004-07-31 Anatolii Matusovici Ioiser Nanostructure and process for manufacture thereof
MD20050370A (en) * 2005-12-12 2007-08-31 Технический университет Молдовы Plant for casting conducting threads from metals in liquid phase
MD3579B1 (en) * 2006-05-02 2008-04-30 Institutul De Inginerie Electronica Si Tehnologiiindustriale Al Academiei De Stiinte A Moldovei Process for obtaining bismuth semimetallic microwire in molybdenum glass insulation
MD3691B1 (en) * 2007-05-10 2008-08-31 Societatea Pe Actiuni Institutul De Cercetari Stiintifice "Eliri" Process for manufacturing a filiform nanostructure

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Burkov A.T., Heinrich A., Konstantinov P.P., Nakama T., Yagasaki K. Measurement Science and Technology, 2001, vol. 12, p. 264-272 *
Jahed M.M., Riffel M., Poche C., Scherrer S. Proceedings Energy Conversion Engineering Conference and Exhibit, 2000, vol. 1, p. 135-138 *
Littleton R.T., Jeffries J., Kaeser M. A., Long M., Tritt T.M. Material Research Society Symposium Proceedings, 1999, vol. 545, p. 137-138 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD430Z (en) * 2011-02-24 2012-05-31 ИНСТИТУТ ЭЛЕКТРОННОЙ ИНЖЕНЕРИИ И НАНОТЕХНОЛОГИЙ "D. Ghitu" АНМ Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect

Also Published As

Publication number Publication date
MD4052B1 (en) 2010-06-30

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