MD430Z - Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect - Google Patents
Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect Download PDFInfo
- Publication number
- MD430Z MD430Z MDS20110037A MDS20110037A MD430Z MD 430 Z MD430 Z MD 430Z MD S20110037 A MDS20110037 A MD S20110037A MD S20110037 A MDS20110037 A MD S20110037A MD 430 Z MD430 Z MD 430Z
- Authority
- MD
- Moldova
- Prior art keywords
- stainless steel
- tubes
- thermoelectric materials
- electrodes
- fixed
- Prior art date
Links
- 239000000463 material Substances 0.000 title abstract 3
- 230000005679 Peltier effect Effects 0.000 title abstract 2
- 229910001220 stainless steel Inorganic materials 0.000 abstract 5
- 239000010935 stainless steel Substances 0.000 abstract 5
- 238000005259 measurement Methods 0.000 abstract 2
- 239000010453 quartz Substances 0.000 abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 abstract 1
- 239000000919 ceramic Substances 0.000 abstract 1
- 238000012423 maintenance Methods 0.000 abstract 1
- 238000000691 measurement method Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000000523 sample Substances 0.000 abstract 1
- 229910052709 silver Inorganic materials 0.000 abstract 1
- 239000004332 silver Substances 0.000 abstract 1
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The invention relates to measurement technique, namely to experimental studies of heat transport in thermoelectric materials intended for operation at elevated temperatures.The device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect includes a vacuum chamber (10), located inside a resistive heater (11) with the possibility of its movement along the vacuum chamber (10), in which is placed a stainless steel frame (9), in which are fixed two stainless steel tubes (7), in which are located quartz tubes (6), to which are attached two quartz wires (5), on which are installed stainless steel electrodes (2) in the form of sleeve. Inside the electrodes (2) are fixed probes, current-carrying wires, thermocouples, covered with silver (4), between the electrodes (2) being fixed a measurement specimen (1) with tinned edges. Between the stainless steel frame (9) and stainless steel tubes (7) are placed ceramic tubes (8) for the current-carrying wires.The result is achieved due to the fact that are reduced the unauthorized leakages of thermal energy, which is strictly necessary for maintenance of adiabatic conditions in the process of carrying out measurements at high temperatures.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| MDS20110037A MD430Z (en) | 2011-02-24 | 2011-02-24 | Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| MDS20110037A MD430Z (en) | 2011-02-24 | 2011-02-24 | Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| MD430Y MD430Y (en) | 2011-10-31 |
| MD430Z true MD430Z (en) | 2012-05-31 |
Family
ID=45815302
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MDS20110037A MD430Z (en) | 2011-02-24 | 2011-02-24 | Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect |
Country Status (1)
| Country | Link |
|---|---|
| MD (1) | MD430Z (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2807370C1 (en) * | 2023-07-07 | 2023-11-14 | Фдеральное государственное бюджетное образовательное учреждение высшего образования "Санкт-Петербургский горный университет" | Device for studying temperature dependencies of different environments |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| MD4052C1 (en) * | 2008-10-16 | 2011-01-31 | Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы | Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K |
-
2011
- 2011-02-24 MD MDS20110037A patent/MD430Z/en not_active IP Right Cessation
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| MD4052C1 (en) * | 2008-10-16 | 2011-01-31 | Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы | Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300…1200K |
Non-Patent Citations (2)
| Title |
|---|
| Harman T.C., Cahn J.H. and Logan M.J. Measurement of thermal conductivity by utilization of the Peltier effect. Journal of applied phisics, vol. 30, nr. 9, 1959, p. 1351-1359 * |
| Shinohara Y., Imai Y., Isoda Y., Nishida I.A. Reliability of thermal conductivity measured by Harman method. Materials research society symposium proceedings, vol. 545, 1998, p. 501-506 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2807370C1 (en) * | 2023-07-07 | 2023-11-14 | Фдеральное государственное бюджетное образовательное учреждение высшего образования "Санкт-Петербургский горный университет" | Device for studying temperature dependencies of different environments |
Also Published As
| Publication number | Publication date |
|---|---|
| MD430Y (en) | 2011-10-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| KA4Y | Short-term patent lapsed due to non-payment of fees (with right of restoration) |