MD3984G2 - Memorie operativă cu autotestare compactă - Google Patents

Memorie operativă cu autotestare compactă Download PDF

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Publication number
MD3984G2
MD3984G2 MDA20080195A MD20080195A MD3984G2 MD 3984 G2 MD3984 G2 MD 3984G2 MD A20080195 A MDA20080195 A MD A20080195A MD 20080195 A MD20080195 A MD 20080195A MD 3984 G2 MD3984 G2 MD 3984G2
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MD
Moldova
Prior art keywords
line memory
group
testing
compact self
input
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Application number
MDA20080195A
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English (en)
Russian (ru)
Other versions
MD3984F1 (ro
Inventor
Генадие БОДЯН
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Генадие БОДЯН
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Application filed by Генадие БОДЯН filed Critical Генадие БОДЯН
Priority to MDA20080195A priority Critical patent/MD3984G2/ro
Publication of MD3984F1 publication Critical patent/MD3984F1/ro
Publication of MD3984G2 publication Critical patent/MD3984G2/ro

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Abstract

Invenţia se referă la tehnica de calcul şi microelectronică şi poate fi aplicată la producerea şi exploatarea microcircuitelor cu mijloace compacte încorporate de testare şi diagnosticare.Dispozitivul conţine un registru de sincronizare (1), un contor (2), memorie operativă (3), un grup de bistabili (4.1 şi 4.2), un sumator XOR (5), o intrare de resetare (6), o intrare de sincronizare (7), o ieşire de indicare (8), un grup de multiplexoare (9.1 şi 9.2), o poartă logică OR (10), un grup de porţi logice XOR (11.1 şi 11.2), un multiplexor suplimentar (12), o intrare de selectare (13) şi o pereche de intrări de negaţie (14).
MDA20080195A 2008-07-14 2008-07-14 Memorie operativă cu autotestare compactă MD3984G2 (ro)

Priority Applications (1)

Application Number Priority Date Filing Date Title
MDA20080195A MD3984G2 (ro) 2008-07-14 2008-07-14 Memorie operativă cu autotestare compactă

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MDA20080195A MD3984G2 (ro) 2008-07-14 2008-07-14 Memorie operativă cu autotestare compactă

Publications (2)

Publication Number Publication Date
MD3984F1 MD3984F1 (ro) 2009-11-30
MD3984G2 true MD3984G2 (ro) 2010-06-30

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Application Number Title Priority Date Filing Date
MDA20080195A MD3984G2 (ro) 2008-07-14 2008-07-14 Memorie operativă cu autotestare compactă

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MD (1) MD3984G2 (ro)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RO102023A2 (ro) * 1988-05-30 1991-11-25 Institutul De Cercetare Stiintifica Si Inginerie Tehnologica Pentru Electrotehnica, Bucuresti, Ro Metoda si circuit electronic pentru controlul memoriilor semiconductoare, dinamice
SU1695394A1 (ru) * 1988-12-27 1991-11-30 Предприятие П/Я Р-6082 Запоминающее устройство с тестовым самоконтролем
MD1240G2 (ro) * 1998-07-22 1999-10-31 Генадие БОДЯН Metodă de testare a dispozitivului de memorie operativă
MD2088G2 (ro) * 2001-04-20 2003-08-31 Генадие БОДЯН Dispozitiv de diagnosticare pseudoinelară a memoriei operative
MD2292G2 (ro) * 2002-12-31 2004-05-31 Генадие БОДЯН Memorie operativă biport cu autotestare
MD3870F1 (ro) * 2007-03-06 2009-03-31 Ghenadie Bodean Memorie operativa cu autotestare si analiza de semnaturi

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RO102023A2 (ro) * 1988-05-30 1991-11-25 Institutul De Cercetare Stiintifica Si Inginerie Tehnologica Pentru Electrotehnica, Bucuresti, Ro Metoda si circuit electronic pentru controlul memoriilor semiconductoare, dinamice
SU1695394A1 (ru) * 1988-12-27 1991-11-30 Предприятие П/Я Р-6082 Запоминающее устройство с тестовым самоконтролем
MD1240G2 (ro) * 1998-07-22 1999-10-31 Генадие БОДЯН Metodă de testare a dispozitivului de memorie operativă
MD2088G2 (ro) * 2001-04-20 2003-08-31 Генадие БОДЯН Dispozitiv de diagnosticare pseudoinelară a memoriei operative
MD2292G2 (ro) * 2002-12-31 2004-05-31 Генадие БОДЯН Memorie operativă biport cu autotestare
MD3870F1 (ro) * 2007-03-06 2009-03-31 Ghenadie Bodean Memorie operativa cu autotestare si analiza de semnaturi

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
I. Klistorin, Gh. Bodean, O. Didenco. Defectările multiple RAM şi implementarea metodei de testare pseudoinelară. Chişinău, Acta Academia, 1997, p. 264 *
Klistorin I., Bodean Gh., Didenco O. Defectările multiple RAM şi implementarea metodei de testare pseudoinelară. Chişinău, Acta Academia, 1997, p. 264 *

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Publication number Publication date
MD3984F1 (ro) 2009-11-30

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