LU56099A1 - - Google Patents

Info

Publication number
LU56099A1
LU56099A1 LU56099DA LU56099A1 LU 56099 A1 LU56099 A1 LU 56099A1 LU 56099D A LU56099D A LU 56099DA LU 56099 A1 LU56099 A1 LU 56099A1
Authority
LU
Luxembourg
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of LU56099A1 publication Critical patent/LU56099A1/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
LU56099D 1967-05-18 1968-05-16 LU56099A1 (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR106895A FR1534762A (fr) 1967-05-18 1967-05-18 Procédé et dispositif de palpage optique

Publications (1)

Publication Number Publication Date
LU56099A1 true LU56099A1 (enrdf_load_stackoverflow) 1970-01-14

Family

ID=8631083

Family Applications (1)

Application Number Title Priority Date Filing Date
LU56099D LU56099A1 (enrdf_load_stackoverflow) 1967-05-18 1968-05-16

Country Status (6)

Country Link
BE (1) BE715248A (enrdf_load_stackoverflow)
DE (1) DE1761416A1 (enrdf_load_stackoverflow)
FR (1) FR1534762A (enrdf_load_stackoverflow)
GB (1) GB1206668A (enrdf_load_stackoverflow)
LU (1) LU56099A1 (enrdf_load_stackoverflow)
NL (1) NL6806977A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0086540A1 (fr) * 1982-02-17 1983-08-24 CENTRE DE RECHERCHES METALLURGIQUES CENTRUM VOOR RESEARCH IN DE METALLURGIE Association sans but lucratif Procédé de réglage d'un traitement superficiel par faisceau laser
WO1987003957A1 (en) * 1985-12-17 1987-07-02 Sin/Schweiz. Institut Für Nuklearforschung Opto-electronic process for inspecting surfaces

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2096880A1 (en) * 1970-06-11 1972-03-03 Mitsubishi Electric Corp Laser beam machining appts - automatically adjusted using control beam passing through semi-transparent mirrors
FR2325018A1 (fr) * 1975-06-23 1977-04-15 Ibm Dispositif de mesure d'intervalle pour definir la distance entre deux faces ou plus
DE2908757C2 (de) * 1979-03-06 1986-10-16 Baumgartner, Viktor, 8028 Taufkirchen Abstandsänderungs-Meßanordnung
FR2503860A1 (fr) * 1981-04-10 1982-10-15 Clemessy Capteur optique pour la reconnaissance de lignes, de discontinuites, notamment de fentes, utilisable plus particulierement pour la commande d'un organe d'execution
FR2548796B1 (fr) * 1983-07-08 1985-11-22 Comp Generale Electricite Dispositif optique pour determiner la position et la forme de la surface d'un objet
IT1198660B (it) * 1983-08-02 1988-12-21 Ottica Ist Naz Profilometro ottico multifocale per dispersione
US4748335A (en) * 1985-04-19 1988-05-31 Siscan Systems, Inc. Method and aparatus for determining surface profiles
US4707610A (en) * 1985-07-03 1987-11-17 Siscan Systems, Inc. Method and apparatus for measuring surface profiles
US5206699A (en) * 1988-05-06 1993-04-27 Gersan Establishment Sensing a narrow frequency band of radiation and gemstones
GB8826224D0 (en) * 1988-11-09 1988-12-14 Gersan Anstalt Sensing shape of object
US20030227614A1 (en) * 2002-06-05 2003-12-11 Taminiau August A. Laser machining apparatus with automatic focusing
GB2405466B (en) 2003-08-27 2006-01-25 Teraview Ltd Method and apparatus for investigating a non-planner sample
CN101573204B (zh) * 2006-12-27 2014-01-15 罗伯特.博世有限公司 激光束加工装置以及聚焦位置的调节方法
DE102007035715A1 (de) 2006-12-27 2008-07-03 Robert Bosch Gmbh Laserstrahlbearbeitungsvorrichtung sowie Verfahren zum Justieren der Fokuslage
JP7432707B2 (ja) 2019-08-30 2024-02-16 エーエスエムエル ネザーランズ ビー.ブイ. 荷電粒子ビームシステムにおいてレベル変動を測定するための自己示差共焦点傾斜センサ
CN111854604B (zh) * 2020-07-28 2022-03-22 西安中科微精光子制造科技有限公司 一种通过聚焦激光束测量气膜孔的形位参数的方法及系统

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0086540A1 (fr) * 1982-02-17 1983-08-24 CENTRE DE RECHERCHES METALLURGIQUES CENTRUM VOOR RESEARCH IN DE METALLURGIE Association sans but lucratif Procédé de réglage d'un traitement superficiel par faisceau laser
WO1987003957A1 (en) * 1985-12-17 1987-07-02 Sin/Schweiz. Institut Für Nuklearforschung Opto-electronic process for inspecting surfaces

Also Published As

Publication number Publication date
BE715248A (enrdf_load_stackoverflow) 1968-11-18
NL6806977A (enrdf_load_stackoverflow) 1968-11-19
FR1534762A (fr) 1968-08-02
GB1206668A (en) 1970-09-30
DE1761416A1 (de) 1971-07-01

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