LU56099A1 - - Google Patents
Info
- Publication number
- LU56099A1 LU56099A1 LU56099DA LU56099A1 LU 56099 A1 LU56099 A1 LU 56099A1 LU 56099D A LU56099D A LU 56099DA LU 56099 A1 LU56099 A1 LU 56099A1
- Authority
- LU
- Luxembourg
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR106895A FR1534762A (fr) | 1967-05-18 | 1967-05-18 | Procédé et dispositif de palpage optique |
Publications (1)
Publication Number | Publication Date |
---|---|
LU56099A1 true LU56099A1 (xx) | 1970-01-14 |
Family
ID=8631083
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
LU56099D LU56099A1 (xx) | 1967-05-18 | 1968-05-16 |
Country Status (6)
Country | Link |
---|---|
BE (1) | BE715248A (xx) |
DE (1) | DE1761416A1 (xx) |
FR (1) | FR1534762A (xx) |
GB (1) | GB1206668A (xx) |
LU (1) | LU56099A1 (xx) |
NL (1) | NL6806977A (xx) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0086540A1 (fr) * | 1982-02-17 | 1983-08-24 | CENTRE DE RECHERCHES METALLURGIQUES CENTRUM VOOR RESEARCH IN DE METALLURGIE Association sans but lucratif | Procédé de réglage d'un traitement superficiel par faisceau laser |
WO1987003957A1 (en) * | 1985-12-17 | 1987-07-02 | Sin/Schweiz. Institut Für Nuklearforschung | Opto-electronic process for inspecting surfaces |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2096880A1 (en) * | 1970-06-11 | 1972-03-03 | Mitsubishi Electric Corp | Laser beam machining appts - automatically adjusted using control beam passing through semi-transparent mirrors |
FR2325018A1 (fr) * | 1975-06-23 | 1977-04-15 | Ibm | Dispositif de mesure d'intervalle pour definir la distance entre deux faces ou plus |
DE2908757C2 (de) * | 1979-03-06 | 1986-10-16 | Baumgartner, Viktor, 8028 Taufkirchen | Abstandsänderungs-Meßanordnung |
FR2503860A1 (fr) * | 1981-04-10 | 1982-10-15 | Clemessy | Capteur optique pour la reconnaissance de lignes, de discontinuites, notamment de fentes, utilisable plus particulierement pour la commande d'un organe d'execution |
FR2548796B1 (fr) * | 1983-07-08 | 1985-11-22 | Comp Generale Electricite | Dispositif optique pour determiner la position et la forme de la surface d'un objet |
IT1198660B (it) * | 1983-08-02 | 1988-12-21 | Ottica Ist Naz | Profilometro ottico multifocale per dispersione |
US4748335A (en) * | 1985-04-19 | 1988-05-31 | Siscan Systems, Inc. | Method and aparatus for determining surface profiles |
US4707610A (en) | 1985-07-03 | 1987-11-17 | Siscan Systems, Inc. | Method and apparatus for measuring surface profiles |
US5206699A (en) * | 1988-05-06 | 1993-04-27 | Gersan Establishment | Sensing a narrow frequency band of radiation and gemstones |
GB8826224D0 (en) * | 1988-11-09 | 1988-12-14 | Gersan Anstalt | Sensing shape of object |
US20030227614A1 (en) * | 2002-06-05 | 2003-12-11 | Taminiau August A. | Laser machining apparatus with automatic focusing |
GB2405466B (en) * | 2003-08-27 | 2006-01-25 | Teraview Ltd | Method and apparatus for investigating a non-planner sample |
CN101573205A (zh) * | 2006-12-27 | 2009-11-04 | 罗伯特·博世有限公司 | 激光束焊接装置以及激光束焊接方法 |
DE102007035715A1 (de) | 2006-12-27 | 2008-07-03 | Robert Bosch Gmbh | Laserstrahlbearbeitungsvorrichtung sowie Verfahren zum Justieren der Fokuslage |
TW202234021A (zh) * | 2019-08-30 | 2022-09-01 | 荷蘭商Asml荷蘭公司 | 檢測裝置及感測光束之方法 |
CN111854604B (zh) * | 2020-07-28 | 2022-03-22 | 西安中科微精光子制造科技有限公司 | 一种通过聚焦激光束测量气膜孔的形位参数的方法及系统 |
-
1967
- 1967-05-18 FR FR106895A patent/FR1534762A/fr not_active Expired
-
1968
- 1968-05-16 LU LU56099D patent/LU56099A1/xx unknown
- 1968-05-16 GB GB2345068A patent/GB1206668A/en not_active Expired
- 1968-05-16 BE BE715248D patent/BE715248A/xx unknown
- 1968-05-17 DE DE19681761416 patent/DE1761416A1/de active Pending
- 1968-05-17 NL NL6806977A patent/NL6806977A/xx unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0086540A1 (fr) * | 1982-02-17 | 1983-08-24 | CENTRE DE RECHERCHES METALLURGIQUES CENTRUM VOOR RESEARCH IN DE METALLURGIE Association sans but lucratif | Procédé de réglage d'un traitement superficiel par faisceau laser |
WO1987003957A1 (en) * | 1985-12-17 | 1987-07-02 | Sin/Schweiz. Institut Für Nuklearforschung | Opto-electronic process for inspecting surfaces |
Also Published As
Publication number | Publication date |
---|---|
NL6806977A (xx) | 1968-11-19 |
DE1761416A1 (de) | 1971-07-01 |
GB1206668A (en) | 1970-09-30 |
FR1534762A (fr) | 1968-08-02 |
BE715248A (xx) | 1968-11-18 |