KR970048520A - Dual Mode Circuit Function Inspection System - Google Patents

Dual Mode Circuit Function Inspection System Download PDF

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Publication number
KR970048520A
KR970048520A KR1019950055956A KR19950055956A KR970048520A KR 970048520 A KR970048520 A KR 970048520A KR 1019950055956 A KR1019950055956 A KR 1019950055956A KR 19950055956 A KR19950055956 A KR 19950055956A KR 970048520 A KR970048520 A KR 970048520A
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KR
South Korea
Prior art keywords
board
unit
vme
frame
bus
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KR1019950055956A
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Korean (ko)
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KR0158382B1 (en
Inventor
이철호
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배순훈
대우전자 주식회사
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Priority to KR1019950055956A priority Critical patent/KR0158382B1/en
Publication of KR970048520A publication Critical patent/KR970048520A/en
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Publication of KR0158382B1 publication Critical patent/KR0158382B1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

본 발명은 VME베이스 또는 PC베이스로 동작하여 인쇄회로기판(PCB)상에 실장되어진 부품의 불량여부등의 검사와, PCB패턴의 숏/오픈(SHORT/OPEN)등의 검사를 행하는 듀얼모드의 회로기능검사시스템에 관한 것으로, 전체시스템의 동작을 제어하는 주제어부, 하드디스크, VGA카드, 데이타입출력부를 구비한 컴퓨터부와, 상기 컴퓨터의 기능을 더 확장시키고자 상기 컴퓨터의 주제어부에 연결되는 확장프레임 및 VME프레임과, PC버스를 통해 상기 확장프레임과 연결되는 다수의 기능보드를 구비한 제1보드부와, VME버스를 통해 상기 VME프레임과 연결되는 다수의 기능보드를 구비한 제2보드부와, 상기 제1보드부 또는 제2보드부와 접속하는 두 콘넥터(16a), (16b)를 구비한 콘넥터장치 및 픽쳐(fixture)와, 측정대상 인쇄회로기판에 패턴신호를 출력하고, 그에 대한 응답파형을 다수의 테스트포인트로부터 입력받아 분석하는 계측부와, 상기 컴퓨터부의 데이타입출력보드로부터 입력되는 제어신호에 의하여 상기 계측부의 동작을 제어하는 프로그래머블 로직 콘트롤러와, 상기 제1보드부에 구비된 보드중 모터구동보드와 연결되는 검사조정비트를 구비한다.The present invention is a dual-mode circuit that operates as a VME base or a PC base and inspects whether or not a component mounted on a printed circuit board (PCB) is defective, or inspects a short / open of a PCB pattern. A functional inspection system, comprising: a computer unit having a main control unit for controlling the operation of the entire system, a hard disk, a VGA card, a data input / output unit, and an extension connected to the main control unit of the computer to further expand the function of the computer A second board portion having a frame and a VME frame, a first board portion having a plurality of functional boards connected to the expansion frame via a PC bus, and a second board portion having a plurality of functional boards connected to the VME frame via a VME bus And a connector device and a fixture having two connectors 16a and 16b for connecting to the first board portion or the second board portion, and outputting a pattern signal to the measurement target printed circuit board. Response waveform A measuring unit for receiving and analyzing a plurality of test points from a plurality of test points, a programmable logic controller for controlling the operation of the measuring unit by a control signal input from a data input / output board of the computer unit, and a motor drive among boards provided in the first board unit It has a test adjustment bit connected to the board.

Description

듀얼모드의 회로기능검사시스템Dual Mode Circuit Function Inspection System

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 본 발명에 의한 회로기능검사시스템의 구성을 보여주는 블럭도이다.1 is a block diagram showing the configuration of a circuit function inspection system according to the present invention.

Claims (2)

듀얼모드 회로기능검사시스템에 있어서, 전체시스템의 동작을 제어하는 주제어부와, PC버스를 통하여 상기 주제어부의 제어에 의하여 동작하는 기억장치인 하드디스크와, PC버스를 통한 상기 주제어부의 제어신호에 의하여 모니터로 데이타를 출력하는 VGA카드와, 상기 주제어부의 제어에 의하여 데이타를 입출력하는 데이타입출력부를 구비한 컴퓨터부와, 상기 컴퓨터부의 기능을 더 확장시키고자 상기 컴퓨터의 주제어부에 연결되는 확장프레임 및 VME프레임과, 상기 확장프레임과 기능이 다른 다수의 보드와의 데이타통신을 위한 PC버스와, 상기 VME프레임과 기능이 다른 다수의 보드와의 데이타통신을 위한 VME버스와, 상기 PC버스를 통하여 상기 확장프레임에 연결되고 다수의 기능보드를 구비한 제1보드부와, 상기 VME버스를 통하여 상기 VME프레임에 연결되고 다수의 기능보드를 구비한 제2보드부와, 상기 제1보드부 및 제2보드부와 접속하는 두 콘넥터(16a), (16b)를 구비한 콘넥터장치와, 측정대상 인쇄회로기판의 측정포인트를 전기적으로 접촉하는 픽쳐(fixture)와, 측정대상 인쇄회로기판에 패턴신호를 출력하고, 그에 대한 응답파형을 다수의 테스트포인트로부터 입력받아 분석하는 계측부와, 상기 컴퓨터부의 데이타입출력보드로부터 입력되는 제어신호에 의하여 상기 계측부의 동작을 제어하는 프로그래머블 로직 콘트롤러와, 상기 제1보드부에 구비된 보드중 모터구동보드와 연결되는 검사조정비트를 구비함을 특징으로 하는 듀얼모드 회로기능검사시스템.A dual mode circuit function inspection system comprising: a main control unit controlling the operation of the entire system, a hard disk serving as a storage device operated by the control of the main control unit via a PC bus, and a control signal of the main control unit via a PC bus. A computer unit having a VGA card for outputting data to the monitor, a data unit for inputting and outputting data under control of the main control unit, and an expansion frame and a VME connected to the main control unit of the computer to further expand the functions of the computer unit. A PC bus for data communication with a frame, a plurality of boards different in function from the expansion frame, a VME bus for data communication with a plurality of boards different in function from the VME frame, and the expansion through the PC bus. A first board portion connected to the frame and having a plurality of functional boards and connected to the VME frame via the VME bus; A second board portion having a plurality of functional boards, a connector device having two connectors 16a and 16b for connecting the first board portion and the second board portion, and a printed circuit board to be measured. A measurement unit for electrically contacting the measurement point, a measurement unit for outputting a pattern signal to a measurement target printed circuit board, and receiving and analyzing response waveforms from a plurality of test points; and inputting from a data input / output board of the computer unit. And a test logic control bit connected to a motor driving board among the boards provided in the first board, and a programmable logic controller for controlling the operation of the measurement unit by a control signal. 제1항에 있어서, 상기 제1보드부가 입력되는 주파수신호 및 펄스신호를 카운트하는 카운터보드와, 트리거신호를 발생시켜, 출력하는 트리거보드와, 상기 트리거보드로부터 입력되는 트리거신호에 의하여 아날로그신호를 디지탈신호로 샘플링하는 A/D변환보드와, 모터를 일정각도로 회전시키는 모터구동보드와, 카메라(도시생략)로부터 출력된 영상신호를 디지탈신호로 변환하고, 그 처리에 대한 동기를 프레임그레버 및 디지탈볼트미터를 구비하고 상기 제2보드부가 VME버스 및 상기 VME버스에 접속된 다수의 보드간의 데이타교환을 제어하는 제어부; 모니터상에 문자 및 화상이 나타나도록 데이타를 출력하는 VGA보드와, 아날로그신호를 디지탈신호로 변환하는 A/D변환보드와, 동기신호에 일치하는 트리거신호를 발생시키고, 출력하는 트리거보드와, 카메라(도시생략)로부터 출력되는 영상신호를 디지탈신호로 변환하고, 그 처리에 대한 동기신호를 맞추는 프레임 그레버와, 모터를 일정각도로 회전시키는 모터구동보드와, 주파수신호및 펄스신호를 카운트하는 카운터보드와, 데이타입출력인터페이스인 데이타입출력보드 및 디지탈 볼트미터를 구비함을 특징으로 하는 듀얼모드의 회로기능검사시스템.2. The method of claim 1, wherein the first board unit comprises: a counter board for counting frequency signals and pulse signals input; a trigger board for generating and outputting a trigger signal; and a trigger signal input from the trigger board. A / D conversion board for sampling digital signals, motor driving board for rotating the motor at an angle, and video signals output from the camera (not shown) are converted into digital signals, and the frame grabber is synchronized with the processing. And a control unit having a digital voltmeter and the second board unit controlling data exchange between a plurality of boards connected to the VME bus and the VME bus. VGA board that outputs data so that text and images appear on the monitor, A / D conversion board that converts analog signals into digital signals, trigger boards that generate and output trigger signals that match the synchronization signals, and cameras A frame grabber that converts the video signal output from (not shown) into a digital signal and matches a synchronization signal for the processing, a motor driving board that rotates the motor at a predetermined angle, and a counter that counts frequency signals and pulse signals. A dual mode circuit functional inspection system comprising a board, a data input / output board as a data input / output interface, and a digital voltmeter. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950055956A 1995-12-26 1995-12-26 Circuit function inspection system of dual mode KR0158382B1 (en)

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Application Number Priority Date Filing Date Title
KR1019950055956A KR0158382B1 (en) 1995-12-26 1995-12-26 Circuit function inspection system of dual mode

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Application Number Priority Date Filing Date Title
KR1019950055956A KR0158382B1 (en) 1995-12-26 1995-12-26 Circuit function inspection system of dual mode

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KR970048520A true KR970048520A (en) 1997-07-29
KR0158382B1 KR0158382B1 (en) 1999-03-20

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100413814B1 (en) * 2001-11-02 2004-01-03 (주)우주일렉트로닉스 A method for designing RF connector in mobile phone

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100413814B1 (en) * 2001-11-02 2004-01-03 (주)우주일렉트로닉스 A method for designing RF connector in mobile phone

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Publication number Publication date
KR0158382B1 (en) 1999-03-20

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