KR970048481A - Abnormal temperature alarm circuit of semiconductor device tester - Google Patents

Abnormal temperature alarm circuit of semiconductor device tester Download PDF

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Publication number
KR970048481A
KR970048481A KR1019950066843A KR19950066843A KR970048481A KR 970048481 A KR970048481 A KR 970048481A KR 1019950066843 A KR1019950066843 A KR 1019950066843A KR 19950066843 A KR19950066843 A KR 19950066843A KR 970048481 A KR970048481 A KR 970048481A
Authority
KR
South Korea
Prior art keywords
comparison means
semiconductor device
alarm circuit
device tester
abnormal temperature
Prior art date
Application number
KR1019950066843A
Other languages
Korean (ko)
Other versions
KR0168210B1 (en
Inventor
문경모
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019950066843A priority Critical patent/KR0168210B1/en
Publication of KR970048481A publication Critical patent/KR970048481A/en
Application granted granted Critical
Publication of KR0168210B1 publication Critical patent/KR0168210B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

본 발명은 주위 온도에 이상이 생길 경우 이를 사용자에게 알려주는 반도체 소자 테스터의 이상 온도 경보 회로에 관한 것으로, 본 발명 반도체 소자 테스터의 이상 온도 경보 회로는 제1입력단과 제2입력단을 구비한 비교수단과, 일단에 전원이 인가되고 다른 단은 상기 비교수단의 제1입력단에 접속되는 제1저항과, 일단이 상기 비교수단의 제1입력단에 접속되고 다른 단은 접지되는 부온도 특성 서미스터와, 일단에 전원이 인가되고 다른 단은 상기 비교수단의 제2입력단에 접속되는 제2저항과, 일단이 상기 비교수단의 제2입력단에 접속되고 다른 단은 접지되는 제3저항 및 일단에 상기 비교수단의 출력이 인가되는 경보수단을 구비하여 적정 가동 온도를 설정하여 주위 온도에 이상이 생길 경우 자동으로 사용자가 알 수 있도록 경고함으로써 반도체 소자 테스터를 보호할 수 있는 이점이 있다.The present invention relates to an abnormal temperature alarm circuit of a semiconductor device tester for informing a user when an abnormality occurs in the ambient temperature. The abnormal temperature alarm circuit of the semiconductor device tester according to the present invention includes a comparison means having a first input terminal and a second input terminal. A negative temperature characteristic thermistor having one end connected to a first input end of the comparison means, one end connected to a first input end of the comparison means, and the other end being grounded; A second resistor connected to the second input end of the comparison means, one end connected to the second input end of the comparison means, and the other end connected to the ground; It is equipped with alarm means that output is applied to set the proper operating temperature, so that the user can be notified automatically when an abnormality occurs in the ambient temperature. There is an advantage that can protect the party testers.

Description

반도체 소자 테스터의 이상 온도 경보 회로Abnormal temperature alarm circuit of semiconductor device tester

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 본 발명의 실시예에 의한 반도체 소자 테스터의 이상 온도 경보 회로를 도시한 도면이다.1 is a diagram illustrating an abnormal temperature alarm circuit of a semiconductor device tester according to an embodiment of the present invention.

Claims (3)

제1입력단과 제2입력단을 구비한 비교수단; 일단에 전원이 인가되고 다른 단은 상기 비교수단의 제1입력단에 접속되는 제1저항; 일단이 상기 비교수단의 제1입력단에 접속되고 다른 단은 접지되는 부온도 특성 서미스터; 일단에 전원이 인가되고 다른 단은 상기 비교수단의 제2입력단에 접속되는 제2저항; 일단이 상기 비교수단의 제2입력단에 접속되고 다른 단은 접지되는 제3저항; 및 일단에 상기 비교수단의 출력이 인가되는 경보수단을 구비하는 것을 특징으로 하는 반도체 소자 테스터의 이상 온도 경보 회로.Comparison means having a first input terminal and a second input terminal; A first resistor connected to a first input end of the comparison means, the power being applied at one end to the other end; A negative temperature characteristic thermistor whose one end is connected to the first input end of the comparing means and the other end is grounded; A second resistor connected to a second input end of the comparing means, the power being applied to one end of the comparison means; A third resistor whose one end is connected to the second input end of the comparing means and the other end is grounded; And an alarm means at one end of which an output of the comparison means is applied. 제1항에 있어서, 상기 경보수단은 광을 발생하는 광 발생수단인 것을 특징으로 하는 반도체 소자 테스터의 이상 온도 경보 회로.The abnormal temperature alarm circuit of the semiconductor device tester according to claim 1, wherein the alarm means is a light generating means for generating light. 제1항에 있어서, 상기 경보수단은 광을 발생하는 광 발생수단인 것을 특징으로 하는 반도체 소자 테스터의 이상 온도 경보 회로.The abnormal temperature alarm circuit of the semiconductor device tester according to claim 1, wherein the alarm means is a light generating means for generating light. ※ 참고사항: 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the original application.
KR1019950066843A 1995-12-29 1995-12-29 Abnormal temperature alarm circuit for the semiconductor element tester KR0168210B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950066843A KR0168210B1 (en) 1995-12-29 1995-12-29 Abnormal temperature alarm circuit for the semiconductor element tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950066843A KR0168210B1 (en) 1995-12-29 1995-12-29 Abnormal temperature alarm circuit for the semiconductor element tester

Publications (2)

Publication Number Publication Date
KR970048481A true KR970048481A (en) 1997-07-29
KR0168210B1 KR0168210B1 (en) 1999-03-20

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950066843A KR0168210B1 (en) 1995-12-29 1995-12-29 Abnormal temperature alarm circuit for the semiconductor element tester

Country Status (1)

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KR (1) KR0168210B1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104930863A (en) * 2015-05-25 2015-09-23 成都中冶节能环保工程有限公司 Alarm current-limiting type waste-heat power generation system based on submerged-arc furnace
CN104930861A (en) * 2015-05-25 2015-09-23 成都中冶节能环保工程有限公司 Alarm type afterheat power generation system based on submerged arc furnace

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Publication number Publication date
KR0168210B1 (en) 1999-03-20

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