KR970046797U - Probe card of semiconductor inspection device - Google Patents

Probe card of semiconductor inspection device

Info

Publication number
KR970046797U
KR970046797U KR2019950041384U KR19950041384U KR970046797U KR 970046797 U KR970046797 U KR 970046797U KR 2019950041384 U KR2019950041384 U KR 2019950041384U KR 19950041384 U KR19950041384 U KR 19950041384U KR 970046797 U KR970046797 U KR 970046797U
Authority
KR
South Korea
Prior art keywords
inspection device
probe card
semiconductor inspection
semiconductor
probe
Prior art date
Application number
KR2019950041384U
Other languages
Korean (ko)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019950041384U priority Critical patent/KR970046797U/en
Publication of KR970046797U publication Critical patent/KR970046797U/en

Links

KR2019950041384U 1995-12-14 1995-12-14 Probe card of semiconductor inspection device KR970046797U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950041384U KR970046797U (en) 1995-12-14 1995-12-14 Probe card of semiconductor inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950041384U KR970046797U (en) 1995-12-14 1995-12-14 Probe card of semiconductor inspection device

Publications (1)

Publication Number Publication Date
KR970046797U true KR970046797U (en) 1997-07-31

Family

ID=60877936

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950041384U KR970046797U (en) 1995-12-14 1995-12-14 Probe card of semiconductor inspection device

Country Status (1)

Country Link
KR (1) KR970046797U (en)

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