KR960025381U - Property inspection device of semiconductor chip - Google Patents
Property inspection device of semiconductor chipInfo
- Publication number
- KR960025381U KR960025381U KR2019940034028U KR19940034028U KR960025381U KR 960025381 U KR960025381 U KR 960025381U KR 2019940034028 U KR2019940034028 U KR 2019940034028U KR 19940034028 U KR19940034028 U KR 19940034028U KR 960025381 U KR960025381 U KR 960025381U
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor chip
- inspection device
- property inspection
- property
- chip
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940034028U KR960025381U (en) | 1994-12-14 | 1994-12-14 | Property inspection device of semiconductor chip |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940034028U KR960025381U (en) | 1994-12-14 | 1994-12-14 | Property inspection device of semiconductor chip |
Publications (1)
Publication Number | Publication Date |
---|---|
KR960025381U true KR960025381U (en) | 1996-07-22 |
Family
ID=60849903
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019940034028U KR960025381U (en) | 1994-12-14 | 1994-12-14 | Property inspection device of semiconductor chip |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR960025381U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100358919B1 (en) * | 2000-11-18 | 2002-10-31 | 주식회사 메모리앤테스팅 | Semiconductor testing using Master-slave technique |
-
1994
- 1994-12-14 KR KR2019940034028U patent/KR960025381U/en not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100358919B1 (en) * | 2000-11-18 | 2002-10-31 | 주식회사 메모리앤테스팅 | Semiconductor testing using Master-slave technique |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Withdrawal due to no request for examination |