KR960025381U - Property inspection device of semiconductor chip - Google Patents

Property inspection device of semiconductor chip

Info

Publication number
KR960025381U
KR960025381U KR2019940034028U KR19940034028U KR960025381U KR 960025381 U KR960025381 U KR 960025381U KR 2019940034028 U KR2019940034028 U KR 2019940034028U KR 19940034028 U KR19940034028 U KR 19940034028U KR 960025381 U KR960025381 U KR 960025381U
Authority
KR
South Korea
Prior art keywords
semiconductor chip
inspection device
property inspection
property
chip
Prior art date
Application number
KR2019940034028U
Other languages
Korean (ko)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019940034028U priority Critical patent/KR960025381U/en
Publication of KR960025381U publication Critical patent/KR960025381U/en

Links

KR2019940034028U 1994-12-14 1994-12-14 Property inspection device of semiconductor chip KR960025381U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940034028U KR960025381U (en) 1994-12-14 1994-12-14 Property inspection device of semiconductor chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940034028U KR960025381U (en) 1994-12-14 1994-12-14 Property inspection device of semiconductor chip

Publications (1)

Publication Number Publication Date
KR960025381U true KR960025381U (en) 1996-07-22

Family

ID=60849903

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940034028U KR960025381U (en) 1994-12-14 1994-12-14 Property inspection device of semiconductor chip

Country Status (1)

Country Link
KR (1) KR960025381U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100358919B1 (en) * 2000-11-18 2002-10-31 주식회사 메모리앤테스팅 Semiconductor testing using Master-slave technique

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100358919B1 (en) * 2000-11-18 2002-10-31 주식회사 메모리앤테스팅 Semiconductor testing using Master-slave technique

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Legal Events

Date Code Title Description
WITN Withdrawal due to no request for examination