KR950031485U - Device classification device of semiconductor device tester - Google Patents

Device classification device of semiconductor device tester

Info

Publication number
KR950031485U
KR950031485U KR2019940007474U KR19940007474U KR950031485U KR 950031485 U KR950031485 U KR 950031485U KR 2019940007474 U KR2019940007474 U KR 2019940007474U KR 19940007474 U KR19940007474 U KR 19940007474U KR 950031485 U KR950031485 U KR 950031485U
Authority
KR
South Korea
Prior art keywords
tester
classification
semiconductor
semiconductor device
classification device
Prior art date
Application number
KR2019940007474U
Other languages
Korean (ko)
Other versions
KR0110462Y1 (en
Inventor
김상길
Original Assignee
엘지반도체 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체 주식회사 filed Critical 엘지반도체 주식회사
Priority to KR2019940007474U priority Critical patent/KR0110462Y1/en
Publication of KR950031485U publication Critical patent/KR950031485U/en
Application granted granted Critical
Publication of KR0110462Y1 publication Critical patent/KR0110462Y1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67271Sorting devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/286External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867Handlers or transport devices, e.g. loaders, carriers, trays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019940007474U 1994-04-11 1994-04-11 Inspection device KR0110462Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940007474U KR0110462Y1 (en) 1994-04-11 1994-04-11 Inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940007474U KR0110462Y1 (en) 1994-04-11 1994-04-11 Inspection device

Publications (2)

Publication Number Publication Date
KR950031485U true KR950031485U (en) 1995-11-22
KR0110462Y1 KR0110462Y1 (en) 1998-04-06

Family

ID=19380735

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940007474U KR0110462Y1 (en) 1994-04-11 1994-04-11 Inspection device

Country Status (1)

Country Link
KR (1) KR0110462Y1 (en)

Also Published As

Publication number Publication date
KR0110462Y1 (en) 1998-04-06

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Legal Events

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E701 Decision to grant or registration of patent right
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Payment date: 20080820

Year of fee payment: 12

EXPY Expiration of term