KR960006348U - Semiconductor chip inspection device - Google Patents

Semiconductor chip inspection device

Info

Publication number
KR960006348U
KR960006348U KR2019940018985U KR19940018985U KR960006348U KR 960006348 U KR960006348 U KR 960006348U KR 2019940018985 U KR2019940018985 U KR 2019940018985U KR 19940018985 U KR19940018985 U KR 19940018985U KR 960006348 U KR960006348 U KR 960006348U
Authority
KR
South Korea
Prior art keywords
semiconductor chip
inspection device
chip inspection
semiconductor
inspection
Prior art date
Application number
KR2019940018985U
Other languages
Korean (ko)
Other versions
KR200145194Y1 (en
Inventor
이상의
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR2019940018985U priority Critical patent/KR200145194Y1/en
Publication of KR960006348U publication Critical patent/KR960006348U/en
Application granted granted Critical
Publication of KR200145194Y1 publication Critical patent/KR200145194Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
KR2019940018985U 1994-07-28 1994-07-28 Test apparatus for semiconductor chip KR200145194Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940018985U KR200145194Y1 (en) 1994-07-28 1994-07-28 Test apparatus for semiconductor chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940018985U KR200145194Y1 (en) 1994-07-28 1994-07-28 Test apparatus for semiconductor chip

Publications (2)

Publication Number Publication Date
KR960006348U true KR960006348U (en) 1996-02-17
KR200145194Y1 KR200145194Y1 (en) 1999-06-15

Family

ID=19389607

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940018985U KR200145194Y1 (en) 1994-07-28 1994-07-28 Test apparatus for semiconductor chip

Country Status (1)

Country Link
KR (1) KR200145194Y1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100481843B1 (en) * 1998-05-11 2005-06-08 삼성전자주식회사 Protection socket for a semiconductor package
KR100499701B1 (en) * 2002-10-16 2005-07-07 주식회사 고영테크놀러지 Test apparatus of protection circuit module

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100481843B1 (en) * 1998-05-11 2005-06-08 삼성전자주식회사 Protection socket for a semiconductor package
KR100499701B1 (en) * 2002-10-16 2005-07-07 주식회사 고영테크놀러지 Test apparatus of protection circuit module

Also Published As

Publication number Publication date
KR200145194Y1 (en) 1999-06-15

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