KR970044984U - 테이퍼 각도 측정장치 - Google Patents

테이퍼 각도 측정장치

Info

Publication number
KR970044984U
KR970044984U KR2019950046024U KR19950046024U KR970044984U KR 970044984 U KR970044984 U KR 970044984U KR 2019950046024 U KR2019950046024 U KR 2019950046024U KR 19950046024 U KR19950046024 U KR 19950046024U KR 970044984 U KR970044984 U KR 970044984U
Authority
KR
South Korea
Prior art keywords
measuring device
taper angle
angle measuring
taper
measuring
Prior art date
Application number
KR2019950046024U
Other languages
English (en)
Other versions
KR200160106Y1 (ko
Inventor
박완희
Original Assignee
포항종합제철주식회사
재단법인포항산업과학기술연구원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 포항종합제철주식회사, 재단법인포항산업과학기술연구원 filed Critical 포항종합제철주식회사
Priority to KR2019950046024U priority Critical patent/KR200160106Y1/ko
Publication of KR970044984U publication Critical patent/KR970044984U/ko
Application granted granted Critical
Publication of KR200160106Y1 publication Critical patent/KR200160106Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/24—Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0009—Guiding surfaces; Arrangements compensating for non-linearity there-of

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
KR2019950046024U 1995-12-22 1995-12-22 테이퍼 각도 측정장치 KR200160106Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950046024U KR200160106Y1 (ko) 1995-12-22 1995-12-22 테이퍼 각도 측정장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950046024U KR200160106Y1 (ko) 1995-12-22 1995-12-22 테이퍼 각도 측정장치

Publications (2)

Publication Number Publication Date
KR970044984U true KR970044984U (ko) 1997-07-31
KR200160106Y1 KR200160106Y1 (ko) 1999-11-01

Family

ID=19437339

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950046024U KR200160106Y1 (ko) 1995-12-22 1995-12-22 테이퍼 각도 측정장치

Country Status (1)

Country Link
KR (1) KR200160106Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100362633B1 (ko) * 2000-06-08 2002-11-29 성 훈 김 높이와 각도 측정이 가능한 측정기

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100362633B1 (ko) * 2000-06-08 2002-11-29 성 훈 김 높이와 각도 측정이 가능한 측정기

Also Published As

Publication number Publication date
KR200160106Y1 (ko) 1999-11-01

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