KR970028586A - Circuit emulation test apparatus - Google Patents

Circuit emulation test apparatus Download PDF

Info

Publication number
KR970028586A
KR970028586A KR1019950042653A KR19950042653A KR970028586A KR 970028586 A KR970028586 A KR 970028586A KR 1019950042653 A KR1019950042653 A KR 1019950042653A KR 19950042653 A KR19950042653 A KR 19950042653A KR 970028586 A KR970028586 A KR 970028586A
Authority
KR
South Korea
Prior art keywords
flip
flop
output
signal
reset signal
Prior art date
Application number
KR1019950042653A
Other languages
Korean (ko)
Inventor
김정현
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019950042653A priority Critical patent/KR970028586A/en
Publication of KR970028586A publication Critical patent/KR970028586A/en

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

본 발명은 회로 에뮬레이션 장치를 공개한다. 그 장치는 제1신호와 제2신호를 논리곱하는 제1논리곱과, 제1논리곱의 출력을 클럭입력되는 제2신호의 하강 엣지에서 출력하는 제1플리플롭과, 제1플립플롭의 출력을 외부로부터 클럭입력되는 외부 리셋신호의 상승 엣지에서 출력하는 제2플립플롯과, 외부리셋신호와 제2신호를 논리곱하여 제2플립플롭의 리셋신호로서 출력되는 제2논리곱과, 제2논리곱의 출력과 제2플립플롭의 반전된 출력을 논리곱하여 제1플립플롭의 리셋신호로서 인가하는 제3논리곱과, 및 제2플립플롭의 출력과 소정 시간 지연된 외부리셋신호를 논리합하여 회로의 내부리셋신호로서 출력하는 논리합으로 구성되는 것이 바람직하고, 칩에 입출력 핀의 상태를 에뮬레이션 상태로 세트시키고, 이 상태에서 칩을 시스템으로부터 제거하지 않고 에뮬레이션하여 시스템을 디버깅(dubbing)하거나 테스트할 수 있는 효과가 있다.The present invention discloses a circuit emulation apparatus. The apparatus includes a first logical product for logically multiplying a first signal and a second signal, a first flip-flop for outputting the output of the first logical product at the falling edge of the second signal to be clocked in, and an output of the first flip-flop A second flip plot for outputting the signal at the rising edge of the external reset signal inputted from the outside, a second logical product output as a reset signal of the second flip flop by performing an AND operation on the external reset signal and the second signal, and a second logic A third logical product of the product of the product and the inverted output of the second flip-flop and applied as a reset signal of the first flip-flop, and the output of the second flip-flop and the external reset signal delayed by a predetermined time, It is preferably composed of a logic sum outputted as an internal reset signal, and the state of the input / output pins is set to the emulation state on the chip, and in this state, the chip is emulated without removing the chip from the system, thereby debugging the system. Can be tested or tested.

Description

회로 에뮬레이션 시험 장치Circuit emulation test apparatus

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 본 발명에 의한 회로 에뮬레이션 장치의 회로도이다.1 is a circuit diagram of a circuit emulation apparatus according to the present invention.

제2a~2d도는 제1도에 도시된 입력단자로 인가되는 신호 및 출력단자로 출력되는 신호들의 타이밍도이다.2A to 2D are timing diagrams of signals applied to the input terminal and signals output to the output terminal shown in FIG.

Claims (1)

임의의 회로를 시험하는 회로 에뮬레이션 장치에 있어서, 제1신호와 제2신호를 논리곱하는 제1논리곱; 상기 제1논리곱의 출력을 클럭입력되는 상기 제2신호의 하강엣지에서 출력하는 제1플립플롭; 상기 제1플립플롭의 출력을 외부로부터 클럽입력되는 외부리셋신호의 상승 엣지에서 출력하는 제2플립플롭; 상기 외부리셋신호와 상기 제2신호를 논리곱하여 상기 제2플립플롭의 리셋신호로서 출력하는 제2논리곱; 상기 제2논리곱의 출력과 상기 제2플립프롭의 반전된 출력을 논리곱하여 상기 제1플립플롭의 리셋신호로서 인가되는 제3논리곱; 및 상기 제2플립플롭의 출력과 소정 시간 지연된 상기 외부리셋신호를 논리합하여 상기 회로의 내부리셋신호로서 출력하는 논리합을 구비하는 것을 특징으로 하는 회로 에뮬레이션 장치A circuit emulation apparatus for testing an arbitrary circuit, comprising: a first logical product to logically multiply a first signal and a second signal; A first flip-flop for outputting the output of the first logical product at the falling edge of the second signal that is clocked in; A second flip-flop for outputting the output of the first flip-flop at the rising edge of the external reset signal input from the outside of the club; A second logical product for performing an AND operation on the external reset signal and the second signal to output the reset signal of the second flip-flop; A third logical product that is logically multiplied by the output of the second logical product and the inverted output of the second flip flop and applied as a reset signal of the first flip flop; And a logical sum of the output of the second flip-flop and the external reset signal delayed by a predetermined time and output as an internal reset signal of the circuit. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950042653A 1995-11-21 1995-11-21 Circuit emulation test apparatus KR970028586A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950042653A KR970028586A (en) 1995-11-21 1995-11-21 Circuit emulation test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950042653A KR970028586A (en) 1995-11-21 1995-11-21 Circuit emulation test apparatus

Publications (1)

Publication Number Publication Date
KR970028586A true KR970028586A (en) 1997-06-24

Family

ID=66588183

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950042653A KR970028586A (en) 1995-11-21 1995-11-21 Circuit emulation test apparatus

Country Status (1)

Country Link
KR (1) KR970028586A (en)

Similar Documents

Publication Publication Date Title
AU2757800A (en) A reconfigurable integrated circuit with integrated debugging facilities for usein an emulation system
KR900005472A (en) Check buffer / register
KR970012193A (en) Methods and Circuits for Initializing a Data Processing System
KR880014475A (en) Semiconductor integrated circuit device
DE69804767D1 (en) SDRAM TAKTPRUEFMODUS
KR860006837A (en) Semiconductor integrated circuit with inspection circuit for internal circuit inspection
KR910018812A (en) Scan Inspection Circuits for Multi-Frequency Circuits
US5630100A (en) Simulating multi-phase clock designs using a single clock edge based system
KR890010922A (en) Semiconductor Integrated Circuits with DC Test
KR970028586A (en) Circuit emulation test apparatus
KR960015215A (en) Simulation method and apparatus for emulating level sensitive latches with edge trigger latch
DE69430344D1 (en) Synchronizing device of asynchronous circuits for verification operations
KR910001782A (en) Equalization Circuit for Testing Logic Circuits
KR960024426A (en) Microcontroller Test Circuit
US6400188B1 (en) Test mode clock multiplication
JPH06160482A (en) Hardware-emulator
JP3025551B2 (en) DC characteristics test circuit
KR890012450A (en) Logic circuit
KR960018892A (en) Diagnostic ROM Test Mode Enable Circuit for Microcontroller
KR970024564A (en) Flip-flop setup time verification circuit
KR960015570A (en) Internal bus monitor device of integrated circuit
KR970051452A (en) Test method of semiconductor memory device
EP1864379A1 (en) Method for race prevention and a device having race prevention capabilities
KR960014956A (en) Test data input device with boundary scan structure
JPS55157039A (en) Test system for logic unit

Legal Events

Date Code Title Description
WITN Withdrawal due to no request for examination