KR970016603A

KR970016603A - Pattern short inspection method of electronic system equipped with microcomputer

Info

Publication number: KR970016603A
Application number: KR1019950032815A
Authority: KR
Inventors: 김군진
Original assignee: 배순훈; 대우전자 주식회사
Priority date: 1995-09-29
Filing date: 1995-09-29
Publication date: 1997-04-28

Abstract

본 발명은 마이컴이 구비된 전자시스템의 패텬쇼트 검사방법에 관한 것으로서, 시스템의 점검설정신호가 입력되었을 경우 마이컴의 입·출력포트의 해당포트(N)를 순차적으로 점검하는 이 입·출력포트 순차리딩단계(S3)후에 현재 체킹되고 있는 N번째 포트의 검출값과 이 N번째 포트에서 검출되어야할 정상값을 비교판단하는 기준값 비교판단단계(S4)와, 이 기준값 비교판단단계(S4)중에 판단한결과 검출값이 정상상태의 값으로 판단될 경우는 현재 검출포트(N)에 1를 증가시키는 순차증가 다단계(S5)와, 상기 단계(S4)중에 판단한 결과, 검출값이 요구된 정상상태의 값이 아닐 경우는 그 이상이 발생된 해당포트를 외부로 표시하도록 하는 이상상태 표시하도록 하는 이상상태 표시단계(S6)로 이루어져, 상기 단계들에 의해, 마이컴의 입·출력포트를 이용하여 시스템의 동작상태를 검출하고 그 검출된 결과를 비교판단하여 시스템의 패턴쇼트 여부를 판별하도록 하므로써, 시스템을 완전분해하지 않은 상태에서 용이하게 패턴쇼트여부를 체킹하게 되므로 이에 따라 검사의 간편성이 향상되게 됨은 물론 시스템의 패턴쇼트체킹시간도 상당히 줄어들게 되므로 이에 따라 검사의 능률성도 사당히 증가시킬 수 있다.The present invention relates to a pattern short inspection method of an electronic system equipped with a microcomputer, and the input / output port sequentially checks a corresponding port (N) of the input / output port of the microcomputer when a check setting signal of the system is input. The reference value comparison determination step (S4) for comparing and determining the detected value of the Nth port currently checked after the reading step (S3) and the normal value to be detected at this Nth port, and the judgment made during this reference value comparison determination step (S4). If the result detection value is determined to be a steady state value, the sequential increase in multiple steps S5 of increasing 1 to the current detection port N and the value of the steady state for which the detection value is requested as a result of the determination in the step S4. If not, an abnormal state display step (S6) for displaying an abnormal state for displaying the corresponding port to which the abnormality has occurred outside, by the above steps, by using the input and output port of the microcomputer By detecting the operation status of the system and comparing the detected result to determine whether the system is pattern short, it is easy to check whether the pattern is short without completely disassembling the system, thereby improving the convenience of inspection. In addition, the pattern short checking time of the system can be considerably shortened, thus increasing the efficiency of inspection.

선택도:제2도Selectivity: Second degree

Description

Pattern short inspection method for electronic system equipped with microcomputer

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명의 방법이 적용되는 전가기기 시스템을 설명하는 설명도이고1 is an explanatory diagram for explaining the electronic device system to which the method of the present invention is applied.

제2도는 본 발명의 방법이 적용되는 플로우챠트이다.2 is a flowchart in which the method of the present invention is applied.

Claims

Input / output port sequential reading step (S3), which sequentially checks the corresponding port (N) of the input / output port of the microcomputer when a check setting signal of the system is input, and this input / output port sequential reading step (S3) Later, a comparison between the detection value of the Nth port currently being checked and the normal value to be detected at this Nth port is made and the reference value comparison determination step (S4) and the result of the determination in this reference value comparison determination step (S4) are normal. If it is determined that the value of the state is determined in the current inspection port (S4), and as a result, if the detected value is not the value of the required normal state, the abnormal state is displayed to display the corresponding port where the abnormality occurred outside. Pattern short test method of the electronic system equipped with a microcomputer, characterized in that the status display step (S6).

※ Note: The disclosure is based on the initial application.