KR970016592A - Passive Device Isolation Measurement Circuit in PC - Google Patents

Passive Device Isolation Measurement Circuit in PC Download PDF

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Publication number
KR970016592A
KR970016592A KR1019950032106A KR19950032106A KR970016592A KR 970016592 A KR970016592 A KR 970016592A KR 1019950032106 A KR1019950032106 A KR 1019950032106A KR 19950032106 A KR19950032106 A KR 19950032106A KR 970016592 A KR970016592 A KR 970016592A
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KR
South Korea
Prior art keywords
signal
unit
max
output
sine wave
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Application number
KR1019950032106A
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Korean (ko)
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KR0157943B1 (en
Inventor
선종국
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이종수
Lg 산전주식회사
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Application filed by 이종수, Lg 산전주식회사 filed Critical 이종수
Priority to KR1019950032106A priority Critical patent/KR0157943B1/en
Priority to JP8273938A priority patent/JP2962244B2/en
Priority to CN96122717A priority patent/CN1105920C/en
Publication of KR970016592A publication Critical patent/KR970016592A/en
Application granted granted Critical
Publication of KR0157943B1 publication Critical patent/KR0157943B1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

Abstract

본 발명은 인쇄회로기판에 실장된 수동소자의 임피던스를 분류 측정하는 기술에 관한 것으로, 종래의 수동소자 분리 측정회로에 있어서는 곱셈기에서 발생되는 오차와 저역필터를 통해 발생되는 지연시간으로 인하여 교류성분을 완전하게 제거하는 것이 불가능하게 되므로 오차폭이 커지게 되고, 또한, R, L, C의 조합에 따른 근사치의 근사식이 만들어 지므로 경계 부분에서 정확하게 측정값이 검출되지 않게 되는 결함이 있었는 바, 본 발명은 이를 해결하기 위하여, 피측정 피씨비(106)에 직접 공급되는 신호와 응답된 신호를 대상으로 하여 피크치전압(Vin_max), (Vout_max)과 임의의 시점에서의 입, 출력전압{Vin(T)}, {Vout(T)}을 계산하고 이를 피씨측으로 공급하여 위상차를 계산하도록 하였다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique for classifying and measuring impedance of passive elements mounted on a printed circuit board. In the conventional passive element separation measurement circuit, an AC component is generated due to an error generated in a multiplier and a delay time generated through a low pass filter. Since it is impossible to remove completely, the error width is increased, and since an approximation equation of the combination of R, L, and C is made, there is a defect that the measured value is not detected accurately at the boundary part. In order to solve this problem, the peak value voltages (V in_max ), (V out_max ) and the input and output voltages (V in ( T)} and {V out (T)} were calculated and fed to the PC side to calculate the phase difference.

Description

피씨비내의 수동소자 분리 측정회로Passive element isolation measuring circuit in PC

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 일반적인 위상차 검출회로에 대한 블럭도,1 is a block diagram of a general phase difference detection circuit,

제2도는 본 발명 피씨비내의 수동소자 분리 측정회로에 대한 블록도,2 is a block diagram of a passive element isolation measuring circuit in the present invention.

제3도는 본 발명에 의해 검출되는 입력출력신호의 최대치 및 임의의 시점에서의 입출력전압을 보인 파형도.3 is a waveform diagram showing a maximum value of an input output signal detected by the present invention and an input / output voltage at an arbitrary time point.

Claims (4)

사용자의 요구에 따라 피측정 피씨비(106)의 수동소자를 측정하는데 적당한 주파수 및 크기의 사인파를 발생하고, 그 사인파를 이용하여 임의의 시점에서 샘플/홀드 클럭신호를 공급하는 신호 입력부(100A)와, 상기 신호 입력부(100A)에서 피측정 피씨비(106)에 직접 공급되는 신호와 응답된 신호를 대상으로 하여 피크치전압(Vin_max), (Vout_max)과 임의의 시점에서의 입, 출력전압{Vin(T)}, {Vout(T)}을 계산하는 응답신호 처리부(100B)와, 피씨에서 피측정 피씨비(106)에 배치된 수동소자들의 실제값을 분리 검출할 수 있도록 상기 응답신호 처리부(100B)에서 출력되는전압(Vin_max), (Vout_max),{Vin(T)}, {Vout(T)}을 디지탈 값으로 변환하고, 선택적으로 공급하는 콘트롤 로직부(100C)로 구성한 것을 특징으로 하는 피씨비내의 수동소자 분리 측정회로.A signal input unit 100A for generating a sine wave of a frequency and magnitude suitable for measuring a passive element of the PPC 106 to be measured according to a user's request, and supplying a sample / hold clock signal at an arbitrary time using the sine wave; The peak value voltages (V in_max ), (V out_max ), and input / output voltages at arbitrary time points are applied to the signals directly supplied from the signal input unit 100A to the target PB 106 and the response signals. in (T)}, {V out (T)} and the response signal processing unit 100B, and the response signal processing unit so as to separately detect the actual value of the passive elements arranged in the PCB 106 to be measured To the control logic section 100C which converts the voltages (V in_max ), (V out_max ), {V in (T)}, and {V out (T)} output from the 100B to digital values and selectively supply them. Passive element isolation measuring circuit in the PC. 제1항에 있어서, 신호 입력부(100A)는 사용자에 의해 주파수 선택부(101)상에서 선택되는 주파수의 사인파를 생성하는 사인파 발생기(102)와, 임의의 시점에서 상기 입력사인파에 동기된 구형파신호가 출력하는 클럭동기부(103)와, 상기 클럭동기부(103)에서 출력되는 구형파의 폭을 조정하여 샘플/홀드부(111)의 클럭신호(CLKS/H)로 공급하는 샘플/홀드 클럭제어부(104)와 상기 사인파 발생기(102)에서 출력되는 사인파를 적당한 레벨로 증폭하여 피측정용 피씨비(106)에 공급하는 증폭부(105)로 구성한 것을 특징으로 하는 피씨비내의 수동소자 분리 측정회로.The signal input unit 100A of claim 1, wherein the signal input unit 100A includes a sine wave generator 102 for generating a sine wave of a frequency selected by the user on the frequency selector 101, and a square wave signal synchronized with the input sine wave at an arbitrary time. A sample / hold clock control unit for adjusting the width of the clock synchronizing unit 103 to be output and the square wave output from the clock synchronizing unit 103 to supply the clock signal CLK S / H of the sample / hold unit 111. And amplifying section (105) for amplifying the sine wave output from the sine wave generator (102) to an appropriate level and supplying the sine wave (102) to the measurement target PB (106). 제1항에 있어서, 응답신호 처리부(100B)는 상기 증폭부(105)의 출력신호를 대상을 최대값과 임의의 시점에서 값을 검출하기 위하여 m배로 증폭하는 입력신호 증폭부(107)와, 피측정 피씨비(106)에서 응답된 전류신호를 전압신호로 변환하는 전류/전압 변환기(108)와, 응답된 신호의 피크값과 샘플/홀드값을 구하기 위해 상기 전류/전압 젼환기(108)의 출력신호를 적절한 크기의 신호로 증폭하는 응답신호 증폭부(109)와, 상기 증폭부(107),(109)의 출력신호를 공급받아 피크치전압(Vin_max), (Vout_max)을 검출하는 피크치 검출기(110) 및 임의의 시점에서의 입, 출력전압{Vin(T)}, {Vout(T)}을 샘플/홀드하는 샘플/홀드부(111)로 구성한 것을 특징으로 하는 피씨비내의 수동소자 분리 측정회로.2. The apparatus of claim 1, wherein the response signal processing unit (100B) comprises: an input signal amplifying unit (107) for amplifying the output signal of the amplifying unit (105) by m times to detect a maximum value and a value at an arbitrary time point; A current / voltage converter 108 for converting the current signal responded by the measured PC ratio 106 into a voltage signal, and the current / voltage converter 108 of the current / voltage converter 108 to obtain a peak value and a sample / hold value of the response signal. Response signal amplifying unit 109 for amplifying the output signal into a signal of an appropriate magnitude, and peak values for detecting peak value voltages (V in_max ) and (V out_max ) by receiving the output signals of the amplifying units 107 and 109. Passive within the PC, characterized by comprising a detector 110 and a sample / hold section 111 for sampling / holding the input and output voltages {V in (T)} and {V out (T)} at an arbitrary time point. Device isolation measuring circuit. 제1항에 있어서, 콘트롤 로직부(100C)는 명령 제어기(114)의 제어를 받아 상기 피크치전압(Vin_max), (Vout_max)과 임의의 시점에서의 입, 출력전압{Vin(T)}, {Vout(T)}을 디지탈 신호로 변환하는 A/D변환기(112)와, 데이타 제어기(115)의 제어를 받아 상기 A/D변환기(112)의 출력 데이타를 선택적으로 받아들여 피씨측으로 전달하는 피씨 인터페이스부(113)로 구성한 것을 특징으로 하는 피씨비내의 수동소자 분리 측정회로.The method of claim 1, wherein the control logic unit (100C) is the peak voltage under the control of command controller (114) (V in_max), (V out_max) and a mouth at a point, the output voltage {V in (T) }, The A / D converter 112 converts {V out (T)} into a digital signal, and selectively receives the output data of the A / D converter 112 under the control of the data controller 115. Passive element separation measurement circuit in the PC, characterized in that consisting of a PC interface unit 113 to be transmitted to the side. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950032106A 1995-09-27 1995-09-27 Passive parts measurement circuit in pcb KR0157943B1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1019950032106A KR0157943B1 (en) 1995-09-27 1995-09-27 Passive parts measurement circuit in pcb
JP8273938A JP2962244B2 (en) 1995-09-27 1996-09-26 PCB passive element isolation measurement circuit
CN96122717A CN1105920C (en) 1995-09-27 1996-09-27 Passive-element testing circuit for printed circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950032106A KR0157943B1 (en) 1995-09-27 1995-09-27 Passive parts measurement circuit in pcb

Publications (2)

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KR970016592A true KR970016592A (en) 1997-04-28
KR0157943B1 KR0157943B1 (en) 1999-03-20

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KR1019950032106A KR0157943B1 (en) 1995-09-27 1995-09-27 Passive parts measurement circuit in pcb

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JP (1) JP2962244B2 (en)
KR (1) KR0157943B1 (en)
CN (1) CN1105920C (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100476740B1 (en) * 2001-06-09 2005-03-16 고윤석 Method for testing rlc parallel circuit on the printed circuit board
KR101112621B1 (en) * 2010-03-05 2012-02-16 삼성전기주식회사 Abnormality judgment method for printed circuit board having passive component therein

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050060109A1 (en) * 2003-09-17 2005-03-17 Analog Devices, Inc. Measuring circuit and a method for determining a characteristic of the impedance of a complex impedance element for facilitating characterization of the impedance thereof
CN101226222B (en) * 2008-02-02 2013-03-20 上海盈龙电子科技有限公司 PCB multifunctional test system and implementing method
JP5485618B2 (en) 2009-08-26 2014-05-07 パナソニック株式会社 Sensor device
JP5431105B2 (en) * 2009-10-15 2014-03-05 日置電機株式会社 Four-terminal resistance measuring device
CN103190907B (en) * 2013-04-17 2015-02-18 深圳大学 Impedance-analysis-based vocal cord detecting device and impedance-analysis-based signal detecting method
CN108362993B (en) * 2018-01-20 2020-08-18 江苏本川智能电路科技股份有限公司 Measuring device and measuring method for multilayer coil plate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100476740B1 (en) * 2001-06-09 2005-03-16 고윤석 Method for testing rlc parallel circuit on the printed circuit board
KR101112621B1 (en) * 2010-03-05 2012-02-16 삼성전기주식회사 Abnormality judgment method for printed circuit board having passive component therein

Also Published As

Publication number Publication date
CN1105920C (en) 2003-04-16
JPH09166631A (en) 1997-06-24
JP2962244B2 (en) 1999-10-12
KR0157943B1 (en) 1999-03-20
CN1155082A (en) 1997-07-23

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