KR970011410U - 번인 테스트용 유입전류 방지회로 - Google Patents

번인 테스트용 유입전류 방지회로

Info

Publication number
KR970011410U
KR970011410U KR2019950021649U KR19950021649U KR970011410U KR 970011410 U KR970011410 U KR 970011410U KR 2019950021649 U KR2019950021649 U KR 2019950021649U KR 19950021649 U KR19950021649 U KR 19950021649U KR 970011410 U KR970011410 U KR 970011410U
Authority
KR
South Korea
Prior art keywords
burn
test
inrush current
prevention circuit
current prevention
Prior art date
Application number
KR2019950021649U
Other languages
English (en)
Other versions
KR200213194Y1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019950021649U priority Critical patent/KR200213194Y1/ko
Publication of KR970011410U publication Critical patent/KR970011410U/ko
Application granted granted Critical
Publication of KR200213194Y1 publication Critical patent/KR200213194Y1/ko

Links

KR2019950021649U 1995-08-22 1995-08-22 번인 테스트용 유입전류 방지회로 KR200213194Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950021649U KR200213194Y1 (ko) 1995-08-22 1995-08-22 번인 테스트용 유입전류 방지회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950021649U KR200213194Y1 (ko) 1995-08-22 1995-08-22 번인 테스트용 유입전류 방지회로

Publications (2)

Publication Number Publication Date
KR970011410U true KR970011410U (ko) 1997-03-29
KR200213194Y1 KR200213194Y1 (ko) 2001-02-15

Family

ID=60895494

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950021649U KR200213194Y1 (ko) 1995-08-22 1995-08-22 번인 테스트용 유입전류 방지회로

Country Status (1)

Country Link
KR (1) KR200213194Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200136697A (ko) 2019-05-28 2020-12-08 삼성전자주식회사 반도체 장치에 대한 테스트 보드 및 테스트 시스템

Also Published As

Publication number Publication date
KR200213194Y1 (ko) 2001-02-15

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