KR960012565A - 반도체장치 - Google Patents

반도체장치 Download PDF

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Publication number
KR960012565A
KR960012565A KR1019950029799A KR19950029799A KR960012565A KR 960012565 A KR960012565 A KR 960012565A KR 1019950029799 A KR1019950029799 A KR 1019950029799A KR 19950029799 A KR19950029799 A KR 19950029799A KR 960012565 A KR960012565 A KR 960012565A
Authority
KR
South Korea
Prior art keywords
semiconductor device
semiconductor
Prior art date
Application number
KR1019950029799A
Other languages
English (en)
Other versions
KR100286490B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP30390094A external-priority patent/JPH08213595A/ja
Priority claimed from JP21682795A external-priority patent/JPH08139324A/ja
Application filed filed Critical
Publication of KR960012565A publication Critical patent/KR960012565A/ko
Application granted granted Critical
Publication of KR100286490B1 publication Critical patent/KR100286490B1/ko

Links

KR1019950029799A 1994-09-13 1995-09-13 반도체장치 KR100286490B1 (ko)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
JP21893994 1994-09-13
JP94-218939 1994-09-13
JP30234294 1994-12-06
JP94-302342 1994-12-06
JP94-303900 1994-12-07
JP30390094A JPH08213595A (ja) 1994-09-13 1994-12-07 半導体装置
JP95-216827 1995-07-12
JP21682795A JPH08139324A (ja) 1994-09-13 1995-07-12 半導体装置

Publications (2)

Publication Number Publication Date
KR960012565A true KR960012565A (ko) 1996-04-20
KR100286490B1 KR100286490B1 (ko) 2001-04-16

Family

ID=60846312

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1019950029799A KR100286490B1 (ko) 1994-09-13 1995-09-13 반도체장치
KR1019950029817A KR960012413A (ko) 1994-09-13 1995-09-13 경사 입사 다중스펙트럼 간섭계 장치와 그를 이용한 기판 표면내의 전체 표면 높이 에러 측정 및 기판의 총 두께 측정 방법

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1019950029817A KR960012413A (ko) 1994-09-13 1995-09-13 경사 입사 다중스펙트럼 간섭계 장치와 그를 이용한 기판 표면내의 전체 표면 높이 에러 측정 및 기판의 총 두께 측정 방법

Country Status (1)

Country Link
KR (2) KR100286490B1 (ko)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0671084B2 (ja) * 1987-04-30 1994-09-07 日本電気株式会社 Ｍｏｓ電界効果トランジスタ

Also Published As

Publication number Publication date
KR100286490B1 (ko) 2001-04-16
KR960012413A (ko) 1996-04-20

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